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Determination of Absolute X-Ray Wavelength with the Double Reflection Method

Published online by Cambridge University Press:  12 April 2016

Benjamin S. Fraenkel
Benjamin S. Fraenkel*
Affiliation:
Laboratory of X-ray and Far Ultra-Violet Spectroscopy Plasma Research Center, Racah Institute of Physics, The Hebrew University, Jerusalem, Israel

Extract

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It has been shown that is is possible to determine absolute wavelength values of X-ray radiation emitted as a result of electron transitions in ions or atoms, without precise Spectrometers and without reference “lines”. Knowledge of the lattice constants of the diffracting crystal is sufficient for the determination of the wavelengths. Here the first experiment describing the feasibility of the method is shown.

Usually spectra are obtained in form of “lines”. In the X-ray case, however, it is possible to obtain spectra in form of points, ordered along lines. The lines represent the white radiation [Fig. 1].

Type
Session 5. Experimental Atomic Physics
Information
International Astronomical Union Colloquium , Volume 86: Eighth International Colloquium on Ultraviolet and X-ray Spectroscopy of Astrophysical and Laboratory Plasmas , 1984 , pp. 120 - 123
Copyright
Copyright © Naval Research Laboratory 1984. Publication courtesy of the Naval Research Laboratory, Washington, DC.

References

1. Fraenkel, B.S., Appl. Phys. Lett., 41, 234 (1982).CrossRefGoogle Scholar
2. Fraenkel, B.S., VUV VII Proceedings, Ann. Israel Phys. Soc. 6 1 63, (1983).Google Scholar
3. Renninger, M., Z. Phys. 106, 141 (1937).CrossRefGoogle Scholar
4. International Tables for X-ray Crystallography, III, 64 (1968).Google Scholar