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Reduction of Phase Noise in Interferometry with State-space Analysis

Published online by Cambridge University Press:  12 April 2016

Ali Okatan  and
J. P. Basart
Ali Okatan
Affiliation:
Electrical Engineering Department and Engineering Research Institute Iowa State University Ames, Iowa 50011U.S.A.
J. P. Basart
Affiliation:
Electrical Engineering Department and Engineering Research Institute Iowa State University Ames, Iowa 50011U.S.A.

Extract

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In radio mapping, one of the problems encountered is the random bias in the visibility estimate. The bias can be divided into two parts: (a) the positive bias due to the common sky background seen by all elements of the interferometer, and (b) the negative bias due to phase noise present in the system. The first kind of bias can be easily removed by subtracting the correlation between the signals at two interferometer sites when the source is not in the antenna beams from that measured with the source in the antenna beams. This bias will therefore not be considered here. In contrast, the second kind of bias is more difficult to remove. When the signal-to-noise ratio of the interferometer system is high, incoherent averaging techniques can be utilized in the fringe frequency or in the time domain (Clark et al., 1969; Moran, 1973).

Type
Part II: Aperture Synthesis with Limited or no Phase Information
Information
International Astronomical Union Colloquium , Volume 49: Image Formation from Coherence Functions in Astronomy , 1979 , pp. 103 - 110
Copyright
Copyright © Reidel 1979

References

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Fitzgerald, R. J.: 1966, “AIAA Guidance and Control Conference Proceedings,” pp. 500–509.Google Scholar
Moran, J.M.: 1973, “Proceedings of IEEE,” 61, pp. 1236–1242.Google Scholar
Mutel, R. L., Broderic, J. J., Carr, T. D., Lynch, M., Warnock, W. W., and Klemperer, D.: 1974, “Astrophysical Journal,” 193, pp. 279–282.Google Scholar
Okatan, A.: 1977, Unpublished Ph.D. dissertation, Electrical Engineering Department, Iowa State University, Ames, Iowa.Google Scholar
Moran, J.M.: 1976, “Methods of Experimental Physics”, 12, part C, pp. 174–197, Meek, M.L., ed., Academic Press, New York.Google Scholar