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Near-field microwave microscopy for the characterization of dielectric materials

Published online by Cambridge University Press:  02 September 2014

Jamal Rammal ,
Olivier Tantot ,
Nicolas Delhote  and
Serge Verdeyme
Jamal Rammal*
Affiliation:
XLIM UMR 6172 CNRS, 123 Avenue Albert Thomas, 87060 LimogesFrance. Phone: + 33 6 51595508
Olivier Tantot
Affiliation:
XLIM UMR 6172 CNRS, 123 Avenue Albert Thomas, 87060 LimogesFrance. Phone: + 33 6 51595508
Nicolas Delhote
Affiliation:
XLIM UMR 6172 CNRS, 123 Avenue Albert Thomas, 87060 LimogesFrance. Phone: + 33 6 51595508
Serge Verdeyme
Affiliation:
XLIM UMR 6172 CNRS, 123 Avenue Albert Thomas, 87060 LimogesFrance. Phone: + 33 6 51595508
*
Corresponding author: J. Rammal Email: jamal.rammal@xlim.fr
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Abstract

In this paper, we present a near-field microwave microscopy method for the characterization of dielectric materials samples in the Industrial, Scientific and Medical (ISM) band. The system proposed is composed of a probe coupled to a dielectric resonator (DR) operating in the TE011 mode. Latter this is used to fix the resonance frequency of the resonator at 2.45 GHz. This system is used for the characterization of dielectric samples with accuracy and high spatial resolution, knowing that they do not have predetermined forms, but a small plane surface.The same device is used for a multi-frequency characterization (4–20 GHz) using resonance frequencies of the cavity instead of one resonance frequency of the DR.

Keywords

CharacterizationNear-fieldDielectric resonatorDielectric materialsMulti-frequency
Type
Research Papers
Information
International Journal of Microwave and Wireless Technologies , Volume 6 , Special Issue 6: Mediterranean Microwave Symposium 2013 , December 2014 , pp. 549 - 554
Copyright
Copyright © Cambridge University Press and the European Microwave Association 2014 

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