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On-wafer noise parameters measurement using an extended six-port network and conventional noise figure analyzer

Published online by Cambridge University Press:  09 September 2016

Abdul-Rahman Ahmed ,
Dong-Hyun Lee  and
Kyung-Whan Yeom
Abdul-Rahman Ahmed*
Affiliation:
Department of Electrical/Electronic Engineering, Kwame Nkrumah University of Science and Technology, PMB UPO Kumasi, Ghana. Phone: +233 508 351 438
Dong-Hyun Lee
Affiliation:
Department of Radio Science and Engineering, Chungnam National University, Gung-dong, Yuseong-gu, Daejeon 305-764, Republic of Korea
Kyung-Whan Yeom
Affiliation:
Department of Radio Science and Engineering, Chungnam National University, Gung-dong, Yuseong-gu, Daejeon 305-764, Republic of Korea
*
Corresponding author: A.- R. Ahmed Email: aarahman.soe@knust.edu.gh
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Abstract

In this paper, we demonstrate the successful implementation of an onwafer noise parameters test set that employs an extended six-port network and a conventional noise figure analyzer. The necessary formulation that enables the calibration of the noise parameter test set as well as extraction of the noise wave correlation matrix of a two-port device under test (DUT) was tested for coaxial connector-type DUT measurement in an earlier work but not for onwafer-type DUT. Furthermore, we demonstrate the performance of this technique against data obtained from the well-known tuner method. Measurement carried out for very low-noise figure (2 dB) onwafer-type amplifier demonstrates the capability of our technique. The measured noise parameters show fluctuations in minimum noise figure, NFmin of ±0.1 dB, and in noise resistance Rn of about 2%. This test set is simple and fast leading to tremendous time- and cost-savings as well as a simplified procedure in onwafer noise parameters measurements.

Keywords

Microwave measurementsModelingSimulation and characterizations of devices and circuits
Type
Research Papers
Information
International Journal of Microwave and Wireless Technologies , Volume 9 , Issue 4 , May 2017 , pp. 821 - 829
Copyright
Copyright © Cambridge University Press and the European Microwave Association 2016 

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