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Analysis of grain orientation and intergrain properties by micro-Raman spectroscopy in YBa2Cu3O7−x thin films

Published online by Cambridge University Press:  31 January 2011

O. Martínez ,
J. Jiménez ,
D. Chambonnet  and
C. Belouet
O. Martínez
Affiliation:
Física de la Materia Condensada, ETSII, 47011 Valladolid, Spain
J. Jiménez
Affiliation:
Física de la Materia Condensada, ETSII, 47011 Valladolid, Spain
D. Chambonnet
Affiliation:
Alcatel Alsthom Recherche, Route de Nozay, 91460 Marcoussis, France
C. Belouet
Affiliation:
Alcatel Alsthom Recherche, Route de Nozay, 91460 Marcoussis, France
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Abstract

Superconducting YBa2Cu3O7−x (YBCO) thin films grown by pulser-laser-assisted deposition were studied by micro-Raman spectroscopy. This technique was used to estimate the epitaxial quality of the films in terms of the presence of c-axis- and a-axis-oriented areas. The advantage of micro-Raman spectroscopy is its high lateral resolution, and this was used to study the homogeneity of the films at submicrometric level. Local structural changes from a large number of intergrain regions were revealed by changes of the Raman parameters. For example, the aggregation of a-axis-oriented grains formed needle-shaped macrograins. Micro-Raman measurements suggest that these grains were seeded at large-angle grain boundaries in c-axis-oriented areas.

Type
Articles
Information
Journal of Materials Research , Volume 15 , Issue 5 , May 2000 , pp. 1069 - 1075
Copyright
Copyright © Materials Research Society 2000

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