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Composition/structure/property relations of multi-ion-beam reactive sputtered lead lanthanum titanate thin films: Part I. Composition and structure analysis

Published online by Cambridge University Press:  31 January 2011

G.R. Fox
Affiliation:
The Pennsylvania State University, Materials Research Laboratory, University Park, Pennsylvania 16803
S.B. Krupanidhi
Affiliation:
The Pennsylvania State University, Materials Research Laboratory, University Park, Pennsylvania 16803
K.L. More
Affiliation:
Oak Ridge National Laboratory, High Temperature Materials Laboratory, Oak Ridge, Tennessee 37831-6064
L.F. Allard
Affiliation:
Oak Ridge National Laboratory, High Temperature Materials Laboratory, Oak Ridge, Tennessee 37831-6064
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Abstract

Material properties are greatly dependent upon the structure of the material. This paper, the first of three parts, discusses how composition influences the crystallographic structure and microstructure of lead lanthanum titanate (PLT) thin films grown by the multi-ion-beam reactive sputtering (MIBERS) technique. A transmission electron microscopy (TEM) study detailing the relationship between crystallographic texturing and microstructure development will be presented in a second paper. The dependence of the ferroelectric properties on observed crystallographic structure and microstructure is presented in the third paper of this series. As-deposited PLT microstructures coincide with the structure zone model (SZM) which has been developed to describe the microstructure of thin films deposited by physical vapor deposition. The as-deposited PLT structures are altered during post-deposition annealing as a result of crystallization and PbO evaporation. Amorphous films with more than 10 mole % excess PbO become polycrystalline with porous microstructures after annealing. When there is less PbO in the as-deposited film, 〈100〉 texture and dense structures are observed. Porosity results from PbO evaporation, and 〈100〉 texture is inhibited by excess PbO.

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Articles
Copyright
Copyright © Materials Research Society 1992

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References

1Araujo, C.A. Paz de and Taylor, G.W., Ferroelectrics 116, 215 (1991).CrossRefGoogle Scholar
2Takayama, R., Tomita, Y., Iijima, K., and Ueda, I., J. Appl. Phys. 61 (1), 411 (1987).CrossRefGoogle Scholar
3Adachi, H., Mitsuyu, T., Yamazaki, O., and Wasa, K., Jpn. J. Appl. Phys., Supplement 24–2 24, 287 (1985).CrossRefGoogle Scholar
4Land, C.E., J. Am. Ceram. Soc. 72 (11), 2059 (1989).CrossRefGoogle Scholar
5Roy, R., J. Am. Ceram. Soc. 60, 350 (1977).CrossRefGoogle Scholar
6Newnham, R. E., Structure-Property Relations (Springer-Verlag, Berlin, Germany, 1975).CrossRefGoogle Scholar
7Goldschmidt, V.M., Skr. Nor. Vidensk-Akad. Oslo, I 1926 (8), 156 (1927).Google Scholar
8Pauling, L., The Nature of the Chemical Bond and Structure of Molecules and Crystals, 3rd ed. (Cornell University Press, Ithaca, NY, 1960), p. 505.Google Scholar
9Kingery, W. D., Bowen, H. K., and Uhlman, D. R., Introduction to Ceramics, 2nd ed. (John Wiley and Sons, New York, 1960).Google Scholar
10Haertling, G. H., in Ceramic Materials for Electronics, edited by Buchanan, R. C. (Marcel Dekker, Inc., New York, 1986), p. 139.Google Scholar
11Northrop, D.A., J. Am. Ceram. Soc. 50 (9), 441 (1967).Google Scholar
12Holman, R.L. and Fulrath, R.M., J. Appl. Phys. 44 (12), 5227 (1973).CrossRefGoogle Scholar
13Hennings, D., Mater. Res. Bull. VI, 329 (1971).CrossRefGoogle Scholar
14Landolt-Bornstein Numerical Data and Functional Relationships in Science and Technology, Group III: Crystal and Solid State Physics, Ferroelectrics and Related Substances, edited by Hellwege, K. H. (Springer-Verlag, New York, 1981), Vol. 16, subvolume a: Oxides.Google Scholar
15Hennings, D. and Hardtl, K.H., Phys. Status Solidi (a) 3, 465 (1970).Google Scholar
16Hennings, D. and Rosenstein, G., Mater. Res. Bull. VII, 1505 (1972).Google Scholar
17Fox, G. R., Breval, E., and Newnham, R. E., J. Mater. Sci. 26, 2566 (1991).CrossRefGoogle Scholar
18Kitabatake, M., Mitsuyu, T., and Wasa, K., in Ferroelectric Thin Films, edited by Myers, E. R. and Kingon, A. L. (Mater. Res. Soc. Symp. Proc. 200, Pittsburgh, PA, 1990), p. 103.Google Scholar
19Nakamura, T., Takashige, M., and Mitsui, T., Ferroelectrics 37, 583 (1981).Google Scholar
20Gurkovich, S.R. and Blum, J.B., Ferroelectrics 62, 189 (1985).CrossRefGoogle Scholar
21Vest, R. W. and Xu, J., IEEE Trans. Ultrasonics Ferroelectrics Freq. Control 35 (6), 711 (1988).CrossRefGoogle Scholar
22Movchan, B. A. and Demchishin, A. V., Phys. Met. Metallogr. 28 (4), 83 (1969).Google Scholar
23Thornton, J.A., J. Vac. Sci. Technol. 11 (4), 666 (1975).Google Scholar
24Thornton, J. A., J. Vac. Sci. Technol. 12 (4), 830 (1975).CrossRefGoogle Scholar
25Thornton, J. A., Annu. Rev. Mater. Sci. 7, 239 (1977).Google Scholar
26Messier, R., Giri, A. P., and Roy, R. A., J. Vac. Sci. Technol. A 2 (2), 500 (1984).Google Scholar
27Messier, R., J. Vac. Sci. Technol. A 4 (3), 490 (1986).CrossRefGoogle Scholar
283-cm Ion Source, Commonwealth Scientific Corp., Alexandria, VA.Google Scholar
29Lead 99.999% pure, CERAC, Milwaukee, WI.Google Scholar
30Lanthanum 99.9% pure, Advent Associates, Ltd., Trafford, PA.Google Scholar
31Titanium 99.9% pure, CERAC, Milwaukee, WI.Google Scholar
3280386 PC, Master Computer, State College, PA.Google Scholar
33STM-100 Thickness/Rate Monitor, Sycon Instruments, East Syracuse, NY.Google Scholar
34Fox, G. R. and Krupanidhi, S. B., to be submitted to J. Vac. Sci. Technol.Google Scholar
35Ziti Inc., Dallas, TX.Google Scholar
362-propanol, A.C.S. reagent grade, J. T. Baker, Phillipsburg, NJ.Google Scholar
37Spectraspan model IHb, Spectrometrics Inc., Andover, MA.Google Scholar
38Cameca Camebax SX-50, Cameca Instr., Courbeoie, France.Google Scholar
39HC1 37% A.C.S. reagent grade, J.T. Baker, Phillipsburg, NJ.Google Scholar
40Hydrogen peroxide 30 wt. % solution, Aldrich Chemical Company, Inc., Milwaukee, WI.Google Scholar
41J.T. Baker, Phillipsburg, NJ.Google Scholar
42PAD V diffractometer, Scintag, Santa Clara, CA.Google Scholar
43JFM 890 Field Emission Gun Scanning Electron Microscope, JEOL Ltd., Japan.Google Scholar
44Heinrich, K. F. J., Electron Beam X-ray Microanalysis (Van Nostrand Reinhold Company, New York, 1981).Google Scholar
45Samara, G. A., Ferroelectrics 2, 277 (1971).CrossRefGoogle Scholar
46Roy, R. A. and Yee, D. S., in Handbook of Ion Beam Processing Technology, edited by Cuomo, J.J., Rossnagel, S. M., and Kaufman, H. R. (Noyes Publications, Park Ridge, NJ, 1989), p. 194.Google Scholar
47Yamaguchi, O., Narai, A., and Komatsu, T., J. Am. Ceram. Soc. 69 (10), C256 (1986).Google Scholar
48Ishikawa, K., Yoshikawa, K., and Okada, N., Phys. Rev. B 37 (10), 5852 (1988).CrossRefGoogle Scholar
49Jona, F. and Shirane, G., Ferroelectric Crystals (Pergamon Press Inc., New York, 1962), p. 241.Google Scholar
50Fox, G. R. and Krupanidhi, S. B., unpublished work.Google Scholar