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Conditions inducing reliable transient gratings of a LaCoO3 thin film using transient grating technique

Published online by Cambridge University Press:  01 November 2004

Yoshiaki Takata
Yoshiaki Takata
Affiliation:
National Institute for Materials Science, Tsukuba-shi 305-0044, Japan
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Abstract

First, a grating decay rate and a thermal diffusion rate of the transient gratings are determined out of the energy-time trace observed by using a transient grating technique with 266-nm laser pulse inducing transient gratings in a LaCoO3 thin film. Second, the grating models aimed at studying two different thermal diffusion phenomena in contrast with the previous paper are described. The difference between both phenomena is attributable to the volume of photon scattering to characterize induced transient gratings. It is concluded that a reliable energy-time trace is observed when the transient gratings with a thickness smaller than a film are induced on the very surface of a thin film sample.

Keywords

DiffusionSemiconductorThin film
Type
Rapid Communications
Information
Journal of Materials Research , Volume 19 , Issue 11 , November 2004 , pp. 3149 - 3151
Copyright
Copyright © Materials Research Society 2004

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References

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