Hostname: page-component-cd9895bd7-dk4vv Total loading time: 0 Render date: 2025-01-05T01:42:31.570Z Has data issue: false hasContentIssue false
  • English
  • Français

Electron diffraction from cylindrical nanotubes

Published online by Cambridge University Press:  03 March 2011

L.C. Qin
L.C. Qin
Affiliation:
Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139
Get access

Abstract

Electron diffraction intensities from cylindrical objects can be conveniently analyzed using Bessel functions. Analytic formulas and geometry of the diffraction patterns from cylindrical carbon nanotubes are presented in general forms in terms of structural parameters, such as the pitch angle and the radius of a tubule. As an example the Fraunhofer diffraction pattern from a graphitic tubule of structure [18,2] has been simulated to illustrate the characteristics of such diffraction patterns. The validity of the projection approximation is also discussed.

Type
Articles
Information
Journal of Materials Research , Volume 9 , Issue 9 , September 1994 , pp. 2450 - 2456
Copyright
Copyright © Materials Research Society 1994

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1Iijima, S., Nature 354, 56 (1991).CrossRefGoogle Scholar
2Dresselhaus, M. S., Dresselhaus, G., and Eklund, P. C., J. Mater. Res. 8, 2054 (1993).CrossRefGoogle Scholar
3Robertson, D. H., Brenner, D. W., and Mintmire, J. W., Phys. Rev. B 45, 12592 (1992).CrossRefGoogle Scholar
4Saito, R., Fujita, M., Dresselhaus, G., and Dresselhaus, M. S., Phys. Rev. B 46, 1804 (1992).CrossRefGoogle Scholar
5Dresselhaus, M. S., Dresselhaus, G., and Saito, R., Phys. Rev. B 45, 6234 (1992).Google Scholar
6Qin, L. C., unpublished.Google Scholar
7Iijima, S. and Ichihashi, T., Nature 363, 603 (1993).CrossRefGoogle Scholar
8Zhang, X. F., Zhang, X. B., van Tendeloo, G., Amelinckx, S., Opde Beeck, M., and Van Landuyt, J., J. Cryst. Growth 130, 368 (1993).CrossRefGoogle Scholar
9Klug, A., Crick, F. H. C., and Wyckoff, H. W., Acta Crystallogr. 11, 199 (1958).CrossRefGoogle Scholar
10Hamada, N., Sawada, S., and Oshiyama, A., Phys. Rev. Lett. 68, 1579 (1992).CrossRefGoogle Scholar