Hostname: page-component-cd9895bd7-q99xh Total loading time: 0 Render date: 2024-12-28T01:16:42.644Z Has data issue: false hasContentIssue false
  • English
  • Français

Electron microscopy studies of high Tc phase development in melt-quenched Bi-Ca-Sr-Cu oxides

Published online by Cambridge University Press:  31 January 2011

Z. Xu ,
P. D. Han ,
L. Chang ,
A. Asthana  and
D. A. Payne
Z. Xu
Affiliation:
Department of Materials Science and Engineering, Materials Research Laboratory, and Science and Technology Center for Superconductivity, University of Illinois at Urbana–Champaign, Illinois 61801
P. D. Han
Affiliation:
Department of Materials Science and Engineering, Materials Research Laboratory, and Science and Technology Center for Superconductivity, University of Illinois at Urbana–Champaign, Illinois 61801
L. Chang
Affiliation:
Department of Materials Science and Engineering, Materials Research Laboratory, and Science and Technology Center for Superconductivity, University of Illinois at Urbana–Champaign, Illinois 61801
A. Asthana
Affiliation:
Department of Materials Science and Engineering, Materials Research Laboratory, and Science and Technology Center for Superconductivity, University of Illinois at Urbana–Champaign, Illinois 61801
D. A. Payne
Affiliation:
Department of Materials Science and Engineering, Materials Research Laboratory, and Science and Technology Center for Superconductivity, University of Illinois at Urbana–Champaign, Illinois 61801
Get access

Abstract

A Bi-Ca-Sr-Cu oxide composition (2:4:2:5) was rapidly solidified from the melt, and the crystallization behavior examined on heat-treatment. Annealing conditions were 865°C for up to 11 days. The high Tc 2223 phase (105 K) evolved from the 2122 phase (80 K), which in turn developed from the 2021 phase (12 K). The high Tc phase developed only in the presence of a liquid phase at 865 °C. Lattice imaging was used to follow the conversion of 2122 phase to 2223. Data are reported for syntactic intergrowths, which became less frequent with time at temperature. EDS results are consistent with the conversion of 2122 to 2223. Crystals of 2223 could not be grown from the melt, nor crystallized from the solid at temperatures below 820 °C. The presence of a Cu- and Ca-rich liquid was essential for the development of 2223 at 865 °C. A tentative model for the formation of 2223 via a liquid mediated reaction is proposed. EDS confirmed the liquid was rich in Ca and Cu near the solid-liquid interface, and precipitates of secondary phases were identified by SEM, TEM, and XRD methods. The presence of CuO and (Ca,Sr)2CuO3 verified the enrichment of Cu and Ca at the solid-liquid interface. The results are consistent with the evolution of structure of a 2223 from a 2425 starting composition.

Type
Articles
Information
Journal of Materials Research , Volume 5 , Issue 1 , January 1990 , pp. 39 - 45
Copyright
Copyright © Materials Research Society 1990

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1 Michel, C., Hervieu, M., Borel, M. M., Grandin, A., Deslandes, F., Provost, J., and Raveau, B., Z. Phys. B. 68, 421 (1987).CrossRefGoogle Scholar
2 Hazen, R. M., Prewitt, C.T., Angel, R. J., Ross, N. L., Finger, L.W., Hadidacos, C.G., Veblen, D. R., Heaney, P.J., Hor, P.H., Meng, R.L., Sun, Y.Y., Wang, Y.Q., Xue, Y.Y., Huang, Z.J., Gao, L., Bechtold, J., and Chu, C.W., Phys. Rev. Lett. 60, 1174 (1988).CrossRefGoogle Scholar
3 Subramanian, M. A., Torardi, C. C., Calabrese, J. C., Gopal-krishnan, J., Morrissey, K. J., Askew, T. R., Flippen, R. B., Chowdhry, U., and Sleight, A.W., Science 239, 1015 (1988).CrossRefGoogle Scholar
4 Maeda, H., Tanaka, Y., Fukotami, M., and Asano, T., Jpn. J. Appl. Phys. 27, L209 (1988).Google Scholar
5 Tarascon, J. M., Le Page, Y., Greene, L. H., Bagley, B. G., Bar-Boux, P., Hwang, D. M., Hull, G.W., McKinnon, W. R., and Giroud, M., Phys. Rev. B 38, 2504 (1988).CrossRefGoogle Scholar
6 Tarascon, J. M., McKinnon, W. R., Barboux, P., Hwang, D. M., Bagley, B.G., Greene, L.H., Hull, G., LePage, Y., Stoffel, N., and Giroud, M., Phys. Rev. B 38, 8885 (1988).CrossRefGoogle Scholar
7 Cava, R. J., presented at the Spring Meeting of the American Physical Society, New Orleans, LA, March 1988.Google Scholar
8 Kijima, N., Endo, H., Tsuchiya, J., Kijima, N., Mizuno, M., and Oguri, Y., Jpn. J. Appl. Phys. 27, L821 (1988).CrossRefGoogle Scholar
9 Nobumasa, H., Shimizu, K., Kitano, Y., and Kawai, T., Jpn. J. Appl. Phys. 27, L846 (1988).Google Scholar
10 Kim, N.K., Drozdyk, L., Payne, D.A., Friedman, T.A., Wright, W. H., and Ginsberg, D. M., Mater. Lett. 5, 387 (1987).Google Scholar
11 Komatsu, T., Sato, R., Hirose, C., Matusita, K., and Yamashita, T., Jpn. J. Appl. Phys. 27, L2293 (1988).Google Scholar
12 Hinks, D.G., Soderholm, L., Capone, D.W., II, Dabrowski, B., Mitchell, A.W., and Shi, D., Appl. Phys. Lett. 53, 423 (1988).CrossRefGoogle Scholar
13 Baker, R. C., Hurng, W. M., and Steinfink, H., Appl. Phys. Lett. 54, 379 (1989).Google Scholar
14 Asthana, A., Han, P. D., Chang, L., and Payne, D. A., Mater. Lett. 8, 286 (1989).Google Scholar
15 Matsui, Y., Maeda, H., Tanaka, Y., and Horiuchi, S., Jpn. J. Appl. Phys. 27, L361 (1988).Google Scholar
16 Shaw, T. M., Shivashankar, S. A., La Placa, S. J., Cuomo, J. J., McGuire, T. R., Roy, R. A., Kelleher, K. H., and Yee, D. S., Phys. Rev. B 37, 9856 (1988).Google Scholar
17 Matsui, Y., Maeda, H., Tanaka, Y., and Horiuchi, S., Jpn. J. Appl. Phys. 27, L372 (1988).Google Scholar
18 Matsui, Y., Maeda, H., Tanaka, Y., Takayama-Muromachi, E., Takekawa, S., and Horiuchi, S., Jpn. J. Appl. Phys. 27, L827 (1988).Google Scholar
19 Matsui, Y., Takekawa, S., Nozaki, H., Umezono, A., Takayama-Muromachi, E., and Horiuchi, S., Jpn. J. Appl. Phys. 27, L1241 (1988).CrossRefGoogle Scholar
20 Honda, T., Wada, T., Sakai, M., Miyajima, M., Nishikawa, N., Uchida, S., Uchinokura, K., and Tanaka, S., Jpn. J. Appl. Phys. 27, L545 (1988).Google Scholar
21 Wada, T., Suzuki, N., Maeda, A., Uchida, S., Uchinokura, K., and Tanaka, S., Jpn. J. Appl. Phys. 27, L1031 (1988).Google Scholar
22 Kijima, N., Endo, H., Tsuchiya, J., Sumiyama, A., Mizuno, M., and Oguri, Y., Jpn. J. Appl. Phys. 27, L1852 (1988).CrossRefGoogle Scholar