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Epitaxy of barium titanate thin films grown on MgO by pulsed-laser ablation

Published online by Cambridge University Press:  31 January 2011

M. Grant Norton
Affiliation:
Department of Materials Science and Engineering, Cornell University, Ithaca, New York 14853
Christopher Scarfone
Affiliation:
Department of Materials Science and Engineering, Cornell University, Ithaca, New York 14853
Jian Li
Affiliation:
Department of Materials Science and Engineering, Cornell University, Ithaca, New York 14853
C. Barry Carter
Affiliation:
Department of Materials Science and Engineering, Cornell University, Ithaca, New York 14853
James W. Mayer
Affiliation:
Department of Materials Science and Engineering, Cornell University, Ithaca, New York 14853
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Abstract

Thin films of barium titanate (BaTiO3) have been deposited by pulsed-laser ablation onto (001)-oriented MgO substrates. The films were epitactic with the c-axis perpendicular to the film-substrate interface, as evidenced by both transmission electron microscopy (TEM) and ion-channeling techniques. The elastic resonance of 3.045 MeV α-particles, generating the 16O(α, α)16O reaction was used to determine the oxygen stoichiometry of the film and the minimum yield based on the oxygen peaks, thereby enabling conclusions to be drawn about the crystalline perfection of the oxygen sublattice.

Type
Materials Communications
Copyright
Copyright © Materials Research Society 1991

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