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Femtosecond optical nonlinearities of Au/TiO2 thin films prepared by a sputtering method

Published online by Cambridge University Press:  18 February 2011

Ichiro Tanahashi  and
Akihiro Mito
Ichiro Tanahashi*
Affiliation:
Nanomaterials Microdevices Research Center, Osaka Institute of Technology, Asahi-ku, Osaka 535-8585, Japan
Akihiro Mito
Affiliation:
National Institute of Advanced Industrial Science and Technology (AIST), NMIJ, Tsukuba, Ibaraki 305-8563, Japan
*
a)Address all correspondence to this author. e-mail: tanahashi@chem.oit.ac.jp
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Abstract

A multitarget sputtering method was applied to embed Au nanoparticles in TiO2 thin films (Au/TiO2 films) with a high concentration of Au particles (19–41 at%). The absolute values of imaginary part of the third-order nonlinear susceptibility, |Im [χ(3)]|, of the Au/TiO2 films, exhibited a peak around the localized surface plasmon resonance absorption peak (around 660 nm), and the maximum value was estimated to be 3.6 × 10−7 esu measured by the femtosecond Z-scan technique. The figure of merit, |Im [χ(3)]|/α, (α is the absorption coefficient of the film at the corresponding wavelength of the measurement) of the film was calculated to be 1.4 × 10−12 esu·cm, which was larger than that of the Au/SiO2 film. This is mainly due to the local field enhancement.

Keywords

AuOptical propertiesSputtering
Type
Articles
Information
Journal of Materials Research , Volume 26 , Issue 6 , 28 March 2011 , pp. 763 - 769
Copyright
Copyright © Materials Research Society 2011

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