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In situ microscopic surface characterization studies of polymeric thin films during tensile deformation using atomic force microscopy

Published online by Cambridge University Press:  26 November 2012

M. S. Bobji  and
Bharat Bhushan
M. S. Bobji
Affiliation:
Computer Microtribology and Contamination Laboratory, Department of Mechanical Engineering, The Ohio State University, 206 west 18th Avenue, Columbus, Ohio 43210–1107
Bharat Bhushan
Affiliation:
Computer Microtribology and Contamination Laboratory, Department of Mechanical Engineering, The Ohio State University, 206 west 18th Avenue, Columbus, Ohio 43210–1107
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Abstract

Atomic force microscopy (AFM) has been used to study the cracks developed on thin-film coatings on a polymer substrate subjected to external tension. To conduct in situ tensile tests in AFM, a special stage has been built. A new technique to image the same control area at different strains was developed and used to study the propagation of a crack with increasing strain in magnetic tapes. Metal particulate tapes developed numerous cracks of shorter length, perpendicular to the loading direction. In contrast, metal-evaporated tapes developed cracks that extend edge to edge. The variation of the crack width and the spacing with strain were measured and explained with the help of models based on elasticity.

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Type
Articles
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Journal of Materials Research , Volume 16 , Issue 3 , March 2001 , pp. 844 - 855
Copyright
Copyright © Materials Research Society 2001

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