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Published online by Cambridge University Press: 31 January 2011
The nature of the disordered state of hydrogenated amorphous silicon is examined for the first time by measurement of anelastic relaxation behavior. It is demonstrated that local structural units and their modifications control the relaxations in these films under different conditions of deposition, aging, and light exposure. Specifically, the light-induced state in this material is shown to be characterized by four distinct relaxations.