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Probing local electrochemical activity within yttria-stabilized-zirconia via in situ high-temperature atomic force microscopy

Published online by Cambridge University Press:  20 October 2014

Jiaxin Zhu ,
Carlos R. Pérez ,
Tae-Sik Oh ,
Rainer Küngas ,
John M. Vohs ,
Dawn A. Bonnell  and
Stephen S. Nonnenmann
Jiaxin Zhu
Affiliation:
Department of Mechanical and Industrial Engineering, University of Massachusetts, Amherst, Engineering Lab I, Amherst, Massachusetts 01003, United States
Carlos R. Pérez
Affiliation:
Department of Materials Science and Engineering, University of Pennsylvania, Philadelphia, Pennsylvania 19104, United States
Tae-Sik Oh
Affiliation:
Department of Chemical and Biomolecular Engineering, University of Pennsylvania, Philadelphia, Pennsylvania 19104, United States
Rainer Küngas
Affiliation:
Department of Chemical and Biomolecular Engineering, University of Pennsylvania, Philadelphia, Pennsylvania 19104, United States
John M. Vohs
Affiliation:
Department of Chemical and Biomolecular Engineering, University of Pennsylvania, Philadelphia, Pennsylvania 19104, United States
Dawn A. Bonnell
Affiliation:
Department of Materials Science and Engineering, University of Pennsylvania, Philadelphia, Pennsylvania 19104, United States
Stephen S. Nonnenmann*
Affiliation:
Department of Mechanical and Industrial Engineering, University of Massachusetts, Amherst, Engineering Lab I, Amherst, Massachusetts 01003, United States
*
a)Address all correspondence to this author. e-mail: ssn@engin.umass.edu
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Abstract

Considerable interest in understanding interfacial phenomena occurring across nanostructured solid oxide fuel cell (SOFC) membrane electrode assemblies has increased demand for in situ characterization techniques with higher resolution. We briefly outline recent advancements in atomic force microscopy (AFM) instrumentation and subsystems in realizing real time imaging at high temperatures and ambient pressures, and the use of these in situ, multi-stimuli probes in collecting local information related to physical and fundamental processes. Here we demonstrate direct probing of local surface potential gradients related to the ionic conductivity of yttria-stabilized zirconia (YSZ) within symmetric SOFCs under intermediate operating temperatures (500–600 °C) via variable temperature scanning surface potential microscopy (VT-SSPM). The conductivity values obtained at different temperatures are then used to estimate the activation energy. These locally collected conductivity and activation energy values are subsequently compared to macroscopic electrochemical impedance results and bulk literature values, thus supporting the validity of the approach.

Keywords

scanning probe microscopy (SPM)ionic conductorenergetic material
Type
Invited Paper
Information
Journal of Materials Research , Volume 30 , Issue 3: Focus Issue: In-situ and Operando Characterization of Materials , 14 February 2015 , pp. 357 - 363
Copyright
Copyright © Materials Research Society 2014 

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