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Yttria-stabilized zirconia crystallization in Al2O3/YSZ multilayers

Published online by Cambridge University Press:  25 January 2012

Nihan Kemik ,
Sergey V. Ushakov ,
Meng Gu ,
Nicole Schichtel ,
Carsten Korte ,
Nigel D. Browning ,
Yayoi Takamura  and
Alexandra Navrotsky
Nihan Kemik
Affiliation:
Peter A. Rock Thermochemistry Laboratory and Nanomaterials in the Environment, Agriculture and Technology Organized Research Unit (NEAT ORU), University of California, Davis, Davis, California; and Department of Chemical Engineering and Materials Science, University of California–Davis, Davis, California 95616
Sergey V. Ushakov
Affiliation:
Peter A. Rock Thermochemistry Laboratory and Nanomaterials in the Environment, Agriculture and Technology Organized Research Unit (NEAT ORU), University of California–Davis, Davis, California 95616
Meng Gu
Affiliation:
Department of Chemical Engineering and Materials Science, University of California–Davis, Davis, California 95616
Nicole Schichtel
Affiliation:
Physikalisch-Chemisches Institut, Justus-Liebig Universität Gießen, Gießen, Germany. D-35392
Carsten Korte
Affiliation:
Physikalisch-Chemisches Institut, Justus-Liebig Universität Gießen, Gießen, Germany. D-35392
Nigel D. Browning
Affiliation:
Department of Chemical Engineering and Materials Science, University of California–Davis, Davis, California 95616; Pacific Northwest National Laboratory, MSIN K8-87, Richland, WA 99352
Yayoi Takamura
Affiliation:
Department of Chemical Engineering and Materials Science, University of California–Davis, Davis, California 95616
Alexandra Navrotsky*
Affiliation:
Peter A. Rock Thermochemistry Laboratory and Nanomaterials in the Environment, Agriculture and Technology Organized Research Unit (NEAT ORU), University of California–Davis, Davis, California; and Department of Chemical Engineering and Materials Science, University of California–Davis, Davis, California 95616
*
a)Address all correspondence to this author. e-mail: anavrotsky@ucdavis.edu
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Abstract

Yttria-stabilized zirconia (YSZ)/Al2O3 multilayers deposited on Pt foil were studied by differential scanning calorimetry. Observed thermal effects were interpreted using additional evidence from x-ray diffraction and transmission electron microscopy. The crystallization temperature of YSZ increases from 344 to 404 °C as the layer thickness decreases from 15 to 4 nm. The enthalpy of crystallization becomes more exothermic with decreasing thickness, and it was measured to be −26 kJ/mol YSZ for 4-nm-thick layers and −12 kJ/mol for 15-nm-thick layers. The latter value is consistent with the reported crystallization enthalpy for YSZ powder of the same composition prepared by precipitation from aqueous solution. The more exothermic crystallization enthalpies for thinner films are indicative of a decrease in their degree of crystallinity. The 2–6-nm-thick Al2O3 layers remain amorphous when heated to 1000 °C. The described methodology enables thermal analysis of oxide thin films using commercial instruments.

Keywords

CalorimetryFilmPhase transformation
Type
Articles
Information
Journal of Materials Research , Volume 27 , Issue 6 , 28 March 2012 , pp. 939 - 943
Copyright
Copyright © Materials Research Society 2012

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