Hostname: page-component-cd9895bd7-p9bg8 Total loading time: 0 Render date: 2024-12-30T23:23:16.118Z Has data issue: false hasContentIssue false
  • English
  • Français

Analysis of phase distributions in the Li2O–Nb2O5–TiO2 system by piezoresponse imaging

Published online by Cambridge University Press:  31 January 2011

Albina Y. Borisevich ,
Sergei V. Kalinin ,
Dawn A. Bonnell  and
Peter K. Davies
Albina Y. Borisevich
Affiliation:
Department of Materials Science & Engineering, University of Pennsylvania, 3231 Walnut Street, Philadelphia, Pennsylvania 19104
Sergei V. Kalinin
Affiliation:
Department of Materials Science & Engineering, University of Pennsylvania, 3231 Walnut Street, Philadelphia, Pennsylvania 19104
Dawn A. Bonnell
Affiliation:
Department of Materials Science & Engineering, University of Pennsylvania, 3231 Walnut Street, Philadelphia, Pennsylvania 19104
Peter K. Davies
Affiliation:
Department of Materials Science & Engineering, University of Pennsylvania, 3231 Walnut Street, Philadelphia, Pennsylvania 19104
Get access

Abstract

The M-phase solid solutions Li1+x−yNb1−x−3yTix+4yO3) (0.1 ≤ x ≤ 0.3, 0 ≤ y ≤ 0.175) in the Li2O–Nb2O5–TiO2 system have promising microwave dielectric properties. However, these compounds can contain small quantities of ferroelectric impurities that affect the polarization response of the material. Due to their low concentration and their chemical similarity to the host material, the impurities cannot be detected by x-ray diffraction or local elemental analysis. Scanning surface potential microscopy and piezoresponse imaging were used to analyze phase compositions in this system. Piezoresponse imaging demonstrated the presence of thin (<200–300 nm) ferroelectric layers on the grain boundaries oriented along the c-axis of the M-phase. Differences between the surface potential and the piezoresponse of ferroelectric multicomponent systems are discussed.

Type
Rapid Communications
Information
Journal of Materials Research , Volume 16 , Issue 2 , February 2001 , pp. 329 - 332
Copyright
Copyright © Materials Research Society 2001

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1.Villafuerte-Castrejon, M.E., Aragon-Pina, A., Valenzuela, R., and West, A.R., J. Solid State Chem. 71, 103 (1987).CrossRefGoogle Scholar
2.Borisevich, A. and Davies, P.K., J. Eur. Ceram. Soc. (2001, in press).Google Scholar
3.Smith, R.I. and West, A.R., Mater. Res. Bull. 27, 277 (1992).CrossRefGoogle Scholar
4.Hayasi, H., Nakano, H., Suzumura, K., Urabe, K., and West, A.R. in Fourth Euro Ceramics Vol. 2: Basic Science—Developments in processing of advanced ceramics—Part II, edited by Galassi, C. (Gruppo Editoriale Faenza Editrice S.p.A., Faenza, Italy, 1995), p. 391.Google Scholar
5.Roth, R.S. and Davis, K.L., in ACerS Ann. Meet, 89th (The American Ceramic Society, Westerville, OH, 1987), p. 88; also inGoogle Scholar
Phase Equilibria Diagrams: Volume XI, edited by Roth, R.S. (The American Ceramic Society, Westerville, OH, 1995), p. 231.Google Scholar
6.Bordet, P., Bougerol-Chaillout, C., Grey, I., Hodeau, J.L., and Isnard, O., J. Solid State Chem. 152, 546 (2000).CrossRefGoogle Scholar
7.Landolt-Bornstein New Series, edited by Hellwege, K-H. and Hellwege, A.M. (Springer-Verlag, Berlin, Germany, 1981), Vol. 16a, p. 90.Google Scholar
8.Efimov, A. and Cohen, S.R., J. Vac. Sci. Tech. A 18, 1051 (2000).CrossRefGoogle Scholar
9.Franke, K., Huelz, H., and Weihnacht, M., Surf. Sci. 415, 178 (1998).CrossRefGoogle Scholar
10.Zavala, G., Fendler, J.H., and Trolier-McKinstry, S., J. Appl. Phys. 81, 7480 (1997).CrossRefGoogle Scholar
11.Gruverman, A., Auciello, O., and Tokumoto, H., Annu. Rev. Mater. Sci. 28, 101 (1998).CrossRefGoogle Scholar
12.Durkan, C., Welland, M.E., Chu, D.P., and Migliorato, P., Phys. Rev. B 60, 16198 (1999).CrossRefGoogle Scholar
13.Eng, L.M., Fousek, J., and Gunter, P., Ferroelectrics 191, 211 (1997).CrossRefGoogle Scholar
14.Command reference manual (Digital Instruments, Santa Barbara, CA, 1997).Google Scholar