Hostname: page-component-78c5997874-t5tsf Total loading time: 0 Render date: 2024-11-10T15:51:25.819Z Has data issue: false hasContentIssue false
  • English
  • Français

Atomic Resolution Transmission Electron Microscopy of Surfaces

Published online by Cambridge University Press:  01 July 2005

Ann N. Chiaramonti  and
Laurence D. Marks
Ann N. Chiaramonti
Affiliation:
Institute for Environmental Catalysis, Department of Materials Science and Engineering, Northwestern University, Evanston, Illinois 60208-3108
Laurence D. Marks*
Affiliation:
Institute for Environmental Catalysis, Department of Materials Science and Engineering, Northwestern University, Evanston, Illinois 60208-3108
*
a) Address all correspondence to this author.e-mail: 1-marks@northwestern.edu
Get access

Abstract

A brief overview of transmission electron microscopy as it applies specifically to obtaining surface crystallographic information is presented. This review will encompass many of the practical aspects of obtaining surface crystal information from a transmission electron microscope, including equipment requirements, experimental techniques, sample preparation methods, data extraction and image processing, and complimentary techniques.

Keywords

Crystallographic structureTransmission electron microscopy (TEM)
Type
Reviews
Information
Journal of Materials Research , Volume 20 , Issue 7 , July 2005 , pp. 1619 - 1627
Copyright
Copyright © Materials Research Society 2005

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1Chung, Y.W.: Practical Guide to Surface Science and Spectroscopy (Academic Press, San Diego, CA, 2001).Google Scholar
2Venables, J., Smith, D.J. and Cowley, J.M.: HREM, STEM, REM, SEM and STM. Surf. Sci. 181, 235 (1987).CrossRefGoogle Scholar
3Cowley, J.M.: Electron microscopy of surface structure. Prog. Surf. Sci. 21, 209 (1986).CrossRefGoogle Scholar
4Jayaram, G., Plass, R. and Marks, L.D.: UHV-HREM and diffraction of surfaces. Interface Sci. 2, 379 (1995).CrossRefGoogle Scholar
5Subramanian, A. and Marks, L.D.: Surface crystallography via electron microscopy. Ultramicroscopy 98, 151 (2004).CrossRefGoogle ScholarPubMed
6Subramanian, A. and Marks, L.D.: Direct observation of charge transfer at a MgO(111) surface. Phys. Rev. Lett. 92, 26101 (2004).CrossRefGoogle Scholar
7Boyes, E.D. and Gai, P.L.: Environmental high resolution electron microscopy and applications to chemical science. Ultramicroscopy 67, 219 (1997).CrossRefGoogle Scholar
8Sharma, R.: Design and applications of environmental cell transmission electron microscope for In Situ observations of gas-solid reactions. Microsc. Microanal. 7, 494 (2001).CrossRefGoogle Scholar
9Haider, M., Uhlemann, S., Schwan, E., Rose, H., Kabius, B. and Urban, K.: Electron microscopy image enhanced. Nature 392, 768 (1998).CrossRefGoogle Scholar
10Poppa, H.: High resolution, high speed ultrahigh vacuum microscopy. J. Vac. Sci. Technol. A 22, 1931 (2004).CrossRefGoogle Scholar
11Olynick, D., Gibson, J.M. and Averback, R.: In situ ultra-high vacuum transmission electron microscopy studies of nanocrystalline copper. Mater. Sci. Eng. A 204, 54 (1995).CrossRefGoogle Scholar
12Tromp, R.M. and Ross, F.M.: Advances in in situ ultra-high vacuum electron microscopy: Growth of SiGe on Si. Ann. Rev. Mater. Sci. 30, 431 (2000).CrossRefGoogle Scholar
13Collazo-Davila, C., Landree, E., Grozea, D., Jayaram, G., Plass, R., Stair, P.C. and Marks, L.D.: Design and initial performance of an ultrahigh vacuum sample preparation evaluation analysis and reaction (SPEAR) system. JMSA 1, 267 (1995).Google Scholar
14Xu, P., Jayaram, G. and Marks, L.D.: Cross-correlation method for intensity measurement of transmission electron-diffraction patterns. Ultramicroscopy 53, 15 (1994).CrossRefGoogle Scholar
15Landree, E., Collazo-Davila, C. and Marks, L.D.: Multi-solution genetic algorithm approach to surface structure determination using direct methods. Acta Crystallogr. B53, 916 (1997).CrossRefGoogle Scholar
16Marks, L.D., Bengu, E., Collazo-Davila, C., Grozea, D., Landree, E., Leslie, C. and Sinkler, W.: Direct methods for surfaces. Surf. Rev. Lett. 5, 1087 (1998).CrossRefGoogle Scholar
17Yagi, K., Takayanagi, K., Kobayashi, K., Osakabe, N., Tanishiro, Y. and Honjo, G.: Surface study by an UHV electron microscope. Surf. Sci. 86, 174 (1979).CrossRefGoogle Scholar
18Takayanagi, K., Tanishiro, Y., Takahashi, M. and Takahashi, S.: Structural analysis of silicon(111)–7 × 7 by UHV-transmission electron diffraction and microscopy. J. Vac. Sci. Technol. A 3, 1502 (1985).CrossRefGoogle Scholar
19Takayanagi, K., Tanishiro, Y., Takahshi, S. and Takahashi, M.: Structure analysis of silicon(111)–7 × 7 reconstructed surface by transmission electron diffraction. Surf. Sci. 164, 367 (1985).CrossRefGoogle Scholar
20Collazo-Davila, C., Marks, L.D., Nishi, K. and Tanishiro, Y.: Atomic structure of the In on Si(111)(4 × 1) surface. Surf. Rev. Lett. 4, 65 (1997).CrossRefGoogle Scholar
21Marks, L.D. and Plass, R.: Atomic structure of Si(111)–(5 × 2)–Au from high resolution electron microscopy and heavy-atom holography. Phys. Rev. Lett. 75, 2172 (1995).CrossRefGoogle Scholar
22Grozea, D., Landree, E., Marks, L.D., Feidenhansl, R., Nielsen, M. and Johnson, R.L.: Direct methods determination of the Si(111)– (6 × 6)Au surface structure. Surf. Sci. 418, 32 (1998).CrossRefGoogle Scholar
23Erdman, N., Poeppelmeier, K.R., Asta, M., Warschkow, O., Ellis, D.E. and Marks, L.D.: The structure and chemisty of the TiO2-rich surface of SrTiO3(001). Nature 419, 55 (2002).CrossRefGoogle Scholar
24Cherns, D.: Direct resolution of the surface atomic steps by transmission electron microscopy. Philos. Mag. 30, 549 (1974).CrossRefGoogle Scholar
25Edington, J.W.: Electron Diffraction in the Electron Microscope (The Macmillan Press, London, U.K., 1974).Google Scholar
26Lehmpfuhl, G. and Warble, C.E.: Direct electron microscopic imaging of surface topography by diffraction and phase contrast. Ultramicroscopy 19, 135 (1986).CrossRefGoogle Scholar
27Zhang, J.P. (unpublished, 1989).Google Scholar
28Marks, L.D., Xu, P., Dunn, D.N. and Zhang, J.P.: Atomic imaging of surfaces in plan view. EMSA 22, 65 (1992).Google Scholar
29Xu, P., Dunn, D., Zhang, J.P. and Marks, L.D.: Atomic imaging of surfaces in plan view. Surf. Sci. Lett. 285 L479 (1993).Google Scholar
30Xu, P. and Marks, L.D.: Intensities of surface diffraction spots in plan view. Ultramicroscopy 45, 155 (1992).CrossRefGoogle Scholar
31Giacovazzo, C.: Direct Phasing in Crystallography: Fundamentals and Applications (Oxford Unversity Press, New York, 1998).CrossRefGoogle Scholar
32Bengu, E., Plass, R., Marks, L.D., Ichihashi, T., Ajayan, P.M. and Iijima, S.: Imaging the dimers on Si(111)–7 × 7. Phys. Rev. Lett. 77, 4226 (1996).CrossRefGoogle Scholar
33Marks, L.D.: Direct imaging of carbon-covered and clean gold (110) surfaces. Phys. Rev. Lett. 51, 1000 (1983).CrossRefGoogle Scholar
34Marks, L.D. and Smith, D.J.: Direct surface imaging in small metal particles. Nature 303, 316 (1983).CrossRefGoogle Scholar
35Lu, P. and Smith, D.J.: Direct imaging of CdTe(001) surface reconstructions by high resolution electron microscopy. Surf. Sci. 254, 119 (1991).CrossRefGoogle Scholar
36Mishima, T. and Osaka, T.: Profile imaging of the InSb{111}A,B–(2 × 2) surfaces. Surf. Sci. 395 L256 (1998).CrossRefGoogle Scholar
37Zhou, W., Xin, Y. and Jefferson, D.A.: HRTEM surface profile imaging of superconducting YBa2Cu4O8. J. Solid State Chem. 149, 327 (2000).CrossRefGoogle Scholar
38Marks, L.D.: Direct imaging of solid surfaces. I. Image simulation and interpretation. Surf. Sci. 139, 281 (1984).CrossRefGoogle Scholar
39Dunn, D.N., Ai, R., Savage, T.S., Zhang, J.P. and Marks, L.D.: Preparation and detection of reconstructed plan-view surfaces. Ultramicroscopy 38, 333 (1991).CrossRefGoogle Scholar
40Marks, L.D.: Rigor, and plan-view simulation of surfaces. Ultramicroscopy 38, 325 (1991).CrossRefGoogle Scholar
41Marks, L.D.: Wiener-filter enhancement of noisy HREM images. Ultramicroscopy 62, 43 (1996).CrossRefGoogle ScholarPubMed
42Bengu, E. Experimental & computational study of surfaces, interfaces, and thin films, in Materials Science and Engineering (Northwestern University, Evanston, IL, 2000), p. 233.Google Scholar
43Marks, L.D., Erdman, N. and Subramanian, A.: Crystallographic direct methods for surfaces. J. Phys.: Condens. Matter 13, 10677 (2001).Google Scholar
44Grozea, D., Landree, E., Collazo-Davila, C., Bengu, E., Plass, R. and Marks, L.D.: Structural investigations of metal-semiconductor surfaces. Micron 30, 41 (1999).CrossRefGoogle Scholar
45Erdman, N., Warschkow, O., Asta, M., Poeppelmeier, K.R., Ellis, D.E. and Marks, L.D.: Surface structures of SrTiO3(001): A TiO2-rich reconstruction with a c(4 × 2) unit cell. J. Am. Chem. Soc. 125, 10050 (2003).CrossRefGoogle Scholar