Hostname: page-component-cd9895bd7-8ctnn Total loading time: 0 Render date: 2024-12-30T23:15:21.906Z Has data issue: false hasContentIssue false
  • English
  • Français

Atomic structure of a Σ = 21 grain boundary

Published online by Cambridge University Press:  31 January 2011

William Krakow
William Krakow
Affiliation:
IBM Research Division, T.J. Watson Research Center, P.O. Box 218, Yorktown Heights, New York 10598
Get access

Abstract

An electron microscope structure image of a σ = 21/[111] tilt grain boundary in Au was obtained and atomic column positions identified to yield a structural unit model of the interface consisting of repeating polyhedron shapes. This result represents the smallest projected spacings at a grain boundary containing defect structures imaged by an electron microscope and interpreted atomistically.

Type
Articles
Information
Journal of Materials Research , Volume 5 , Issue 11 , November 1990 , pp. 2658 - 2662
Copyright
Copyright © Materials Research Society 1990

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1Bourret, A. and Desseaux, J., Philos. Mag. 30, 419 (1979).CrossRefGoogle Scholar
2Bourret, A., Desseaux, J., and Renalt, A., Philos. Mag. 45, 1 (1982).CrossRefGoogle Scholar
3Vaudin, M. D., Cunningham, B., and Ast, D. G., Scripta Metall. 17, 191 (1983).CrossRefGoogle Scholar
4Ichinose, H. and Ishida, Y., Philos. Mag. 43, 1253 (1981).CrossRefGoogle Scholar
5Ishida, Y., Ichinose, H., Mori, M., and Hashimoto, M., Trans. Jpn. Inst. Met. 24, 349 (1983).CrossRefGoogle Scholar
6Krakow, W., Wetzel, J.T., and Smith, D. A., Philos. Mag. 53, 739 (1986).CrossRefGoogle Scholar
7Krakow, W. and Smith, D. A., J. Mater. Res. 1, 47 (1986).CrossRefGoogle Scholar
8Krakow, W. and Smith, D. A., Ultramicrosc. 22, 47 (1987).CrossRefGoogle Scholar
9Cosandey, F., Chan, S-W., and Stadelmann, P., Scripta Metall. 22, 1093 (1988).CrossRefGoogle Scholar
10Krakow, W., Acta Metall. 38, 1036 (1990).CrossRefGoogle Scholar
11Krakow, W., Philos. Mag. (1990), in press.Google Scholar
12Bourret, A. and Rouviere, J. L., in Polycrystalline Semiconductors Grain Boundaries and Interfaces, edited by Moller, , Strunk, H. P., and Werner, J.H. (Springer-Verlag, Berlin, 1988), p. 8.Google Scholar
13Rouviere, J. L. and Bourret, A., in Polycrystalline Semiconductors Grain Boundaries and Interfaces, edited by Moller, , Strunk, H. P., and Werner, J.H. (Springer-Verlag, Berlin, 1988), p. 19.Google Scholar
14Bourret, A. and Penisson, J. M., JEOL News 26E (1), 2 (1987).Google Scholar
15Krakow, W. and Smith, D. A., in Characterization of Defects in Materials, edited by Siegel, R.W., Weertman, J. R., and Sinclair, R. (Mater. Res. Soc. Symp. Proc. 82, Pittsburgh, PA, 1987), p. 409.Google Scholar
16Krakow, W., in High Resolution Microscopy of Materials, edited by Krakow, W., Ponce, F. A., and Smith, D. J. (Mater. Res. Soc. Symp. Proc. 139, Pittsburgh, PA, 1989), p. 103.Google Scholar
17Krakow, W., Thin Solid Films 93, 235 (1982).CrossRefGoogle Scholar
18Sutton, A. P. and Vitek, V., Philos. Trans. R. Soc. London A 309, 1 (1983).Google Scholar
19Wang, G. J., Sutton, A. P., and Vitek, V., Acta Metall. 32, 1093 (1984).CrossRefGoogle Scholar