Hostname: page-component-cd9895bd7-hc48f Total loading time: 0 Render date: 2024-12-30T23:31:46.750Z Has data issue: false hasContentIssue false
  • English
  • Français

Characterization of (Bi, Pb)-Sr-Ca-Cu-O system by analytical electron microscopy

Published online by Cambridge University Press:  31 January 2011

Yasuhide Inoue ,
Masahiro Hasegawa ,
Yushi Shichi ,
Fumio Munakata ,
Mitsugu Yamanaka ,
Susumu Hiyama  and
Osamu Nittono
Yasuhide Inoue
Affiliation:
Central Engineering Laboratories, Nissan Motor Co., Ltd., 1, Natsushima-cho, Yokosuka, Kanagawa 237, Japan
Masahiro Hasegawa
Affiliation:
Central Engineering Laboratories, Nissan Motor Co., Ltd., 1, Natsushima-cho, Yokosuka, Kanagawa 237, Japan
Yushi Shichi
Affiliation:
Central Engineering Laboratories, Nissan Motor Co., Ltd., 1, Natsushima-cho, Yokosuka, Kanagawa 237, Japan
Fumio Munakata
Affiliation:
Central Engineering Laboratories, Nissan Motor Co., Ltd., 1, Natsushima-cho, Yokosuka, Kanagawa 237, Japan
Mitsugu Yamanaka
Affiliation:
Central Engineering Laboratories, Nissan Motor Co., Ltd., 1, Natsushima-cho, Yokosuka, Kanagawa 237, Japan
Susumu Hiyama
Affiliation:
Seimi Chemical Co., Ltd., 3-2-10, Chigasaki, Chigasaki, Kanagawa 253, Japan
Osamu Nittono
Affiliation:
Department of Metallurgical Engineering, Tokyo Institute of Technology, Oh-okayama, Meguro-ku, Tokyo 152, Japan
Get access

Abstract

Chemical compositions of superconductors of Bi1−xPbxSrCaCu1.8Oy (x = 0.1, 0.3, and 0.5) were investigated by analytical electron microscopy (AEM) supplemented by electron microprobe analysis. Samples were prepared by a solid state reaction method under oxygen partial pressures of 0.20 and 0.077 atm. The high-Tc phase appeared only in the samples of Bi1−xPbxSrCaCu1.8Oy (x = 0.1 and 0.3) prepared under an oxygen partial pressure of 0.077 atm. In the samples containing the high-Tc phase, stacking structures of 2, 3, and 4 perovskite layers were observed by transmission electron microscopy (TEM). From AEM analysis, it was shown that in order to make the high-Tc phase, the substitution ratio of Pb for Bi was about 0.2.

Type
Articles
Information
Journal of Materials Research , Volume 5 , Issue 4 , April 1990 , pp. 737 - 741
Copyright
Copyright © Materials Research Society 1990

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1Maeda, H., Tanaka, Y., Fukutomi, M., and Asano, T., Jpn. J. Appl.Phys. 27, L209 (1988).CrossRefGoogle Scholar
2Takayama-Muromachi, E., Uchida, Y., Ono, A., Izumi, F., Onoda, M., Matsui, Y., Kosuda, K., Takekawa, S., and Kato, K., Jpn. J.Appl. Phys. 27, L365 (1988).CrossRefGoogle Scholar
3Syono, Y., Hiraga, K., Kobayashi, N., Kikuchi, M., Kusaba, K., Kajitani, T., Shindo, D., Hosoya, S., Tokiwa, A., Terada, S., and Muto, Y., Jpn. J. Appl. Phys. 27, L569 (1988).CrossRefGoogle Scholar
4Hiraga, K., Hirabayashi, M., Kikuchi, M., and Syono, Y, Jpn. J.Appl. Phys. 27, L573 (1988).CrossRefGoogle Scholar
5Bando, Y., Kijima, T, Kitami, Y., Tanaka, J., Izumi, F., and Yokoyama, M., Jpn. J. Appl. Phys. 27, L358 (1988).CrossRefGoogle Scholar
6Matsui, Y., Maeda, H., Tanaka, Y., and Horiuchi, S., Jpn. J. Appl.Phys. 27, L372 (1988).CrossRefGoogle Scholar
7Shindo, D., Hiraga, K., Hirabayashi, M., Kikuchi, M., and Syono, Y., Jpn. J. Appl. Phys. 27, L1018 (1988).Google Scholar
8Hirotsu, Y., Tomioka, O., Ohkubo, T, Yamamoto, N., Nakamura, Y., Nagakura, S., Komatsu, T., and Matsushita, K, Jpn. J. Appl. Phys. 27, L1869 (1988).Google Scholar
9Shindo, D., Hiraga, K., Hirabayashi, M., Kobayashi, N., Kikuchi, M., Kusaba, K., Syono, Y., and Muto, Y., Jpn. J. Appl. Phys. 27, L2048 (1988).CrossRefGoogle Scholar
10Kajitani, T., Kusaba, K., Kikuchi, M., Kobayashi, N., Syono, Y., Williams, T. B., and Hirabayashi, M., Jpn. J. Appl. Phys. 27, L587 (1988).CrossRefGoogle Scholar
11Takano, M., Takada, J, Oda, K., Kitaguchi, H., Miura, Y., Ikeda, Y, Tomii, Y., and Mazaki, H., Jpn. J. Appl. Phys. 27, L1041 (1988).CrossRefGoogle Scholar
12Endo, U., Koyama, S., and Kawai, T., Jpn. J. Appl. Phys. 27, L1476 (1988).CrossRefGoogle Scholar
13Kijima, N., Endo, H., Tsuchiya, J., Sumiyama, A, Mizuno, M, and Oguri, Y., Jpn. J. Appl. Phys. 27, L1852 (1988).Google Scholar
14Koyama, S., Endo, U., and Kawai, T., Jpn. J. Appl. Phys. 27, L1861 (1988).CrossRefGoogle Scholar
15Murayama, N., Awano, M., Suda, E., and Torii, Y., Jpn. J. Appl. Phys. 27, L2280 (1988).CrossRefGoogle Scholar
16Horita, Z., Sano, T., and Nemoto, M., Microscopy, J., Jpn. J. Appl. Phys. 143, 215 (1986).Google Scholar
17Ikeda, S., Ichinose, H., Kimura, T., Matsumoto, T., Maeda, H., Ishida, Y., and Ogawa, K., Jpn. J. Appl. Phys. 27, L999 (1988).CrossRefGoogle Scholar