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Comparison of the critical current anisotropy in epitaxial YBa2Cu3O7−x films on (100) LaAlO3 and (100) yttria stabilized zirconia

Published online by Cambridge University Press:  03 March 2011

K.S. Harshavardhan ,
M. Rajeswari ,
D.M. Hwang ,
C.Y. Chen ,
T. Sands  and
T. Venkatesan
K.S. Harshavardhan
Affiliation:
Bellcore, Red Bank, New Jersey 07701
M. Rajeswari
Affiliation:
Bellcore, Red Bank, New Jersey 07701
D.M. Hwang
Affiliation:
Bellcore, Red Bank, New Jersey 07701
C.Y. Chen
Affiliation:
Bellcore, Red Bank, New Jersey 07701
T. Sands
Affiliation:
Bellcore, Red Bank, New Jersey 07701
T. Venkatesan
Affiliation:
Department of Physics, Center for Superconductivity Research, University of Maryland, College Park, Maryland 20742
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Abstract

The angular magnetic field dependence of the critical current density JC(θ) of epitaxial YBa2Cu3O7 thin films is presented in the temperature regime close to Tc. The high temperature behavior of Jc(θ) shows features that are significantly different from the earlier observations at lower temperatures. A comparison between the films on (100) LaAlO3 and (100) yttria stabilized zirconia (YSZ) indicates significant differences that may be attributed to the differences in the microstructure of the films on the two substrates. In particular, the observation of enhanced pinning in the films on YSZ may be due to the pinning effects of the low angle grain boundaries present in these films.

Type
Articles
Information
Journal of Materials Research , Volume 9 , Issue 2 , February 1994 , pp. 270 - 274
Copyright
Copyright © Materials Research Society 1994

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References

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