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Determination of the anisotropic optical properties for perfluorinated vanadyl phthalocyanine thin films

Published online by Cambridge University Press:  03 March 2011

O.D. Gordan ,
M. Friedrich ,
W. Michaelis ,
R. Kröger ,
T. Kampen ,
D. Schlettwein  and
D.R.T. Zahn
O.D. Gordan*
Affiliation:
Semiconductor Physics, University of Technology Chemnitz, D-09107 Chemnitz, Germany
M. Friedrich
Affiliation:
Semiconductor Physics, University of Technology Chemnitz, D-09107 Chemnitz, Germany
W. Michaelis
Affiliation:
Physical Chemistry 1, Institute of Pure and Applied Chemistry, Faculty of Science, University of Oldenburg, D-26111 Oldenburg, Germany
R. Kröger
Affiliation:
Institute of Solid State Physics, University of Bremen, D-28334 Bremen, Germany
T. Kampen
Affiliation:
Physics Institute, University of Technology Chemnitz, D-09107 Chemnitz, Germany
D. Schlettwein
Affiliation:
Physical Chemistry 1, Institute of Pure and Applied Chemistry, Faculty of Science, University of Oldenburg, D-26111 Oldenburg, Germany
D.R.T. Zahn
Affiliation:
Semiconductor Physics, University of Technology Chemnitz, D-09107 Chemnitz, Germany
*
a) Address all correspondence to this author. e-mail: ovidiu.gordan@s2002.tu-chemnitz.de
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Abstract

Thin films of perfluorinated vanadyl phthalocyanine F16PcVO were prepared by physical vapor deposition in high vacuum on KBr and fused silica substrates. The absorption spectra in the visible region show that the films on different substrates have different structure. The optical constants for F16PcVO films were obtained in the spectral range of 0.7–4.5 eV from the simulation of ellipsometry spectra with an anisotropic uniaxial model. From the difference between the in-plane and out-of-plane components of the extinction coefficient the average tilt angle of the F16PcVO molecular planes with respect to the substrate plane was found to be 56° for fused silica substrates and between 0° and 3° for KBr substrates.

Keywords

OrganicThin filmOptical properties
Type
Articles—Organic Electronics Special Section
Information
Journal of Materials Research , Volume 19 , Issue 7 , July 2004 , pp. 2008 - 2013
Copyright
Copyright © Materials Research Society 2004

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References

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