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Effect of temperature on the cure shrinkage measurement of non-conductive adhesives for flip chip interconnects

Published online by Cambridge University Press:  03 March 2011

H. Yu*
Affiliation:
School of Materials Science & Engineering, Nanyang Technological University, Singapore 639798
S.G. Mhaisalkar
Affiliation:
School of Materials Science & Engineering, Nanyang Technological University, Singapore 639798
E.H. Wong
Affiliation:
MicroSystems, Modules & Components Lab., Institute of Microelectronics, Singapore 117685
*
a)Address all correspondence to this author. e-mail: yuho0001@ntu.edu.sg
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Abstract

Non-conductive adhesive (NCA) flip chip interconnects are emerging as attractive alternatives to lead or lead-free solder interconnects due to their environmental friendliness, lower processing temperatures, and extendability to fine pitch applications. The electrical connectivity of a NCA interconnect relies solely on the pure mechanical contact between the integrated circuit bump and the substrate pad; the electrical conductivity of the contact depends on the mechanical contact pressure, which in turns depends to a large extend on cure shrinkage characteristic of the NCA. In addition, to reduce the cost and increase the output, NCA is usually ramped up to 200 °C and cured for 1 min during the assembly process. However, fast cure reaction poses a great challenge for the accurate measurement of cure shrinkage. In this paper, to precisely determine the cure shrinkage at high temperature, cure shrinkage was first measured at lower temperatures with slow reaction rate by means of thermomechanical analyzer and then extrapolated to high temperatures. With the increase of cure temperature, the maximum of degree of cure will increase, but the maximum cure shrinkage reduces due to the expansion of materials at higher cure temperature. Furthermore, the slopes of the linear relationship between the cure shrinkage and the degree of cure at different cure temperatures after gelation were found to be similar and independent of the cure temperature. The cure shrinkage from gel-point to complete curing was determined to be 4.275%.

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Articles
Copyright
Copyright © Materials Research Society 2005

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References

REFERENCES

1.Liu, J.: Recent advances in conductive adhesives for direct chip attach applications. Microsyst. Technol. 5, 72 (1998).CrossRefGoogle Scholar
2.The, L.K., Wong, C.C., Mhaisalkar, S.G., Ong, K., Teo, P.S. and Wong, E.H.: Characterization of nonconductive adhesive for flip-chip interconnection. J. Electron. Mater. 33, 271 (2004).Google Scholar
3.Gunawan, M., Wong, E.H., Mhaisalkar, S.G., Davila, L.T., Hong, Y., Caers, J.F.J.M. and Tsai, T.K.: Characterization and modelling of static and cyclic relaxation in non conductive adhesives. J. Electron. Mater. 33, 1041 (2004).CrossRefGoogle Scholar
4.Caers, J.F.J.M., Zhao, X.J., Wong, E.H., Ong, C.K., Zhang, X.W. and Rajoo, R.: Prediction of moisture induced failures in flip chip on flex interconnections with non-conductive adhesives, 53rd Electronic Components and Technology Conference, IEEE, Piscataway, NJ, 2003, pp. 11761180.Google Scholar
5.Braga, R.R. and Ferracane, J.L.: Contraction stress related to degree of conversion and reaction kinetics. J. Dent. Res. 81(2), 114 (2002).CrossRefGoogle ScholarPubMed
6.Ishida, H. and Low, H.Y.: A study on the volumetric expansion of benzoxazine-based phenolic resin. Macromolecules 30, 1099 (1997).CrossRefGoogle Scholar
7.Lai, J.H. and Johnson, A.E.: Measuring polymerization shrinkage of photo-activated restorative materials by a water-filled dilatometer. Dent. Mater. 9, 139 (1993).CrossRefGoogle ScholarPubMed
8.Cook, W.D., Forrest, M. and Goodwin, A.A.: A simple method for the measurement of polymerization shrinkage in dental composites. Dent. Mater. 15, 447 (1999).CrossRefGoogle ScholarPubMed
9.Li, C., Potter, K., Wisnom, M.R. and Stringer, G.: In-situ measurement of chemical shrinkage of MY750 epoxy resin by a novel gravimetric method. Comp. Sci. Technol. 64, 55 (2004).CrossRefGoogle Scholar
10.Thomas, C.L. and Bur, A.J.: In-situ monitoring of product shrinkage during injection molding using an optical sensor. Polym. Eng. Sci. 39, 1619 (1999).CrossRefGoogle Scholar
11.Fano, V., Ortalli, I., Pizzi, S. and Bonanini, M.: Polymerization shrinkage of microfilled composites determined by laser beam scanning. Biomaterials 18, 467 (1997).CrossRefGoogle ScholarPubMed
12.Lu, D., Tong, Q.K. and Wong, C.P.: Conductivity mechanisms of isotropic conductive adhesives (ICAs). IEEE Trans. Electron. Packaging Manufacturing 22, 223 (1999).Google Scholar
13.Kwon, W-S. and Paik, K-W.: Fundamental understanding of ACF conduction establishment with emphasis on the thermal and mechanical analysis. Int. J. Adhes. Adhes. 24, 135 (2004).CrossRefGoogle Scholar
14.Lu, D. and Wong, C.P.: Effect of shrinkage on conductivity of isotropic conductive adhesives, in 1999 International Symposium on Advanced Packaging Materials, IEEE, Piscataway, NJ, 1999, pp. 295301.Google Scholar
15.Yu, H., Mhaisalkar, S.G. and Wong, E.H.: Cure shrinkage measurement of non-conductive adhesives by means of a thermo-mechanical analyzer. (unpublished).Google Scholar
16.Yu, H., Mhaisalkar, S.G., Wong, E.H., Teh, L.K. and Wong, C.C.: Investigation of cure kinetics and its effect on adhesion strength of non-conductive adhesives used in flip chip assembly. IEEE Trans. Comp. Packaging Technol. (in press).Google Scholar