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Electron transport properties of graphene with charged impurities and vacancy defects

Published online by Cambridge University Press:  26 March 2013

Yasuhiko Kudo ,
Kazuyuki Takai  and
Toshiaki Enoki
Yasuhiko Kudo*
Affiliation:
Department of Chemistry, Graduate School of Science and Engineering, Tokyo Institute of Technology, Meguro-ku, Tokyo 152-8551, Japan
Kazuyuki Takai*
Affiliation:
Department of Chemistry, Graduate School of Science and Engineering, Tokyo Institute of Technology, Meguro-ku, Tokyo 152-8551, Japan
Toshiaki Enoki*
Affiliation:
Department of Chemistry, Graduate School of Science and Engineering, Tokyo Institute of Technology, Meguro-ku, Tokyo 152-8551, Japan
*
a)Address all correspondence to these authors. e-mail: kudo.y.ad@m.titech.ac.jp
b)e-mail: takai.k.aa@m.titech.ac.jp
c)e-mail: enoki.t.aa@m.titech.ac.jp
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Abstract

Nano-structured graphene has recently attracted extraordinary attention due to its potential use as an electronic or spintronic material. We investigated the electrical conductivities of antidot and Ar-sputtered graphene samples under a magnetic field in terms of the carrier density. Antidot samples exhibit conductivity that is well explained by charged impurity scattering, which is associated with intravalley scattering. This suggestion is supported by the low intensity of the Raman D band, which is related to intervalley scattering induced by structural defects. In contrast, Ar-sputtered samples show a strong D band and conductivity that is affected by defect scattering. The difference in the main scattering mechanism between the two types of samples appears as Shubnikov-de Haas oscillations at high magnetic fields, which are observed in antidot samples but not in Ar-sputtered samples. Furthermore, an analysis of weak localization effects in both samples at low fields reveals that intra- and intervalley scatterings play significant roles in antidot and Ar-sputtered samples, respectively.

Keywords

Cnanostructuremagnetoresistance (transport)
Type
Articles
Information
Journal of Materials Research , Volume 28 , Issue 8 , 28 April 2013 , pp. 1097 - 1104
Copyright
Copyright © Materials Research Society 2013

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