Hostname: page-component-cd9895bd7-jn8rn Total loading time: 0 Render date: 2024-12-30T20:03:15.780Z Has data issue: false hasContentIssue false

Erratum: “Electronic transport and microstructure in MoSi2 thin films” [J. Mater. Res. 1, 493 (1986)]

Published online by Cambridge University Press:  31 January 2011

T.L. Martin
Affiliation:
Department of Electrical Engineering and Condensed Matter Sciences Laboratory, Colorado State University, Fort Collins, Colorado 80523
J.E. Mahan
Affiliation:
Department of Electrical Engineering and Condensed Matter Sciences Laboratory, Colorado State University, Fort Collins, Colorado 80523

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Errata
Copyright
Copyright © Materials Research Society 1986