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Evolution of surface structure, microstructure, and superconducting properties during YBa2Cu3O7a-axis thin film growth

Published online by Cambridge University Press:  31 January 2011

A. F. Marshall
A. F. Marshall
Affiliation:
Center for Materials Research, Stanford University, Stanford, California 94305
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Abstract

The evolution of surface structure, grain microstructure, and superconducting transition temperature of a-axis YBa2Cu3O7 thin films has been studied as a function of film thickness. The grain size increases and develops a bimodal distribution of grain size during film growth, concurrent with an improvement in Tc. The surface structure does not represent the grain size, but rather the development of the bimodal grain structure follows the formation of the surface structure. The results are discussed in terms of thin film growth modes.

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Articles
Information
Journal of Materials Research , Volume 13 , Issue 3 , March 1998 , pp. 551 - 556
Copyright
Copyright © Materials Research Society 1998

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References

REFERENCES

1.Linker, G., Xi, X. X., Meyer, O., Li, Q., and Geerk, J., Solid State Commun. 69, 249 (1989).CrossRefGoogle Scholar
2.Eom, C. B., Sun, J. Z., Lairson, B. M., Streiffer, S. K., Marshall, A. F., Yamamoto, K., Anlage, S. M., Bravman, J. C., Geballe, T. H., Laderman, S. S., Taber, R. C., and Jacowitz, R. D., Physica C 171, 354 (1990).CrossRefGoogle Scholar
3.Eom, C. B., Marshall, A. F., Laderman, S. S., Jacowitz, R. D., and Geballe, T. H., Science 249, 1549 (1990).CrossRefGoogle Scholar
4.Ramesh, R., Chang, C. C., Ravi, T. S., Hwang, D. M., Inam, A., Xi, X. X., Li, Q., Wu, X. D., and Venkatesan, T., Appl. Phys. Lett. 57, 1064 (1990).CrossRefGoogle Scholar
5.Kanehori, K., Sughii, N., Fukazawa, T., and Miyauchi, K., Thin Solid Films 182, 265 (1991).CrossRefGoogle Scholar
6.Yamane, H.et al., J. Appl. Phys. 69, 7948 (1991).CrossRefGoogle Scholar
7.Li, Y. Q., Zhao, J., Chern, C. S., Gallois, B., Norris, P., and Kear, B., J. Appl. Phys. 71, 2472 (1992).CrossRefGoogle Scholar
8.Mukaida, M. and Miyazawa, S., Jpn. J. Appl. Phys. 32, 4521 (1993).CrossRefGoogle Scholar
9.Ito, W., Yoshida, Y., Mahajan, S., Morishita, T., Kumagai, M., and Yabuta, K., Appl. Phys. Lett. 65, 1051 (1994); W. Ito, A. Oishi, S. Okayama, Y. Yoshida, N. Homma, and T. Morishita, Physica C 204, 295 (1993).CrossRefGoogle Scholar
10.Inam, A., Rogers, C. T., Ramesh, R., Remschnig, K., Farrow, L., Hart, D., Venkatesan, T., and Wilkens, B., Appl. Phys. Lett. 57, 2484 (1990).CrossRefGoogle Scholar
11.Ramesh, R., Inam, A., Hart, D. L., and Rogers, C. T., Physica C 170, 325 (1990).CrossRefGoogle Scholar
12.Hamet, J. F., Mercey, B., Hervieu, M., and Raveau, B., Physica C 193, 465 (1992).CrossRefGoogle Scholar
13.Sodtke, E. and Munder, H., Appl. Phys. Lett. 60, 1630 (1992).CrossRefGoogle Scholar
14.Mahajan, S., Ito, W., Yoshida, Y., and Morishita, T., Physica C 213, 445 (1993).CrossRefGoogle Scholar
15.Sodtke, E., Munder, H., and Braginski, A. I., Physica C 204, 375 (1993).CrossRefGoogle Scholar
16.Schneider, R., Reiner, J., Geerk, J., Meyer, O., and Linker, G., Solid State Commun. 89, 81 (1994).CrossRefGoogle Scholar
17.Park, Y. K., Ha, D. H., Park, K., and Park, J-C., Physica C 235–240, 603 (1994).CrossRefGoogle Scholar
18.Ito, W., Mahajan, S., Yoshida, Y., Watanabe, N., and Morishita, T., J. Mater. Res. 9, 1625 (1994).CrossRefGoogle Scholar
19.Trajanovic, Z., Takeuchi, I., Warburton, P. A., Lobb, C. J., and Venkatesan, T., Appl. Phys. Lett. 66, 1536 (1995).CrossRefGoogle Scholar
20.Hontsu, S., Mukai, N., Ishii, J., Kawai, T., and Kawai, S., Appl. Phys. Lett. 61, 1134 (1992).CrossRefGoogle Scholar
21.Mukaida, M. and Miyazawa, S., Appl. Phys. Lett. 63, 999 (1993).CrossRefGoogle Scholar
22.Suzuki, Y., Lew, D., Marshall, A. F., Beasley, M. R., and Geballe, T. H., Phys. Rev. B 48, 10 642 (1993).CrossRefGoogle Scholar
23.Mahajan, S., Wen, J. G., Ito, W., Yoshida, Y., Kubota, N., Liu, C-J., and Morishita, T., Appl. Phys. Lett. 65, 3129 (1994).CrossRefGoogle Scholar
24.Fujita, J., Yoshitake, T., Kamijo, A., Satoh, T., and Igarashi, H., J. Appl. Phys. 64, 1292 (1988).CrossRefGoogle Scholar
25.Burmann, T., Geerk, J., Meyer, O., Schneider, R., and Linder, G., Solid State Commun. 90, 599 (1994).CrossRefGoogle Scholar
26.Stranski, I. N. and Krastanow, Von L., Akad. Wiss. Lit. Mainz Math.-Natur. Kl. IIb 146, 797 (1939).Google Scholar
27.Eaglesham, D. J. and Cerullo, M., Phys. Rev. Lett. 64, 1943 (1990).CrossRefGoogle Scholar
28.Streiffer, S. K., Lairson, B. M., Zielinski, E. M., and Bravman, J. C., Phys. Rev. B 47, 11 431 (1993).CrossRefGoogle Scholar
29.Herrmann, K., Kunkel, G., Siegel, M., Schubert, J., Zander, W., Braginski, A. I., Jia, C. L., Kabius, B., and Urban, K., J. Appl. Phys. 78, 1131 (1995).CrossRefGoogle Scholar
30.Eom, C. B., Marshall, A. F., Suzuki, Y., Geballe, T. H., Boyer, B., Pease, R. F. W., van Dover, R. B., and Philips, J. M., Phys. Rev. B 46, 11 902 (1992-II).CrossRefGoogle Scholar
31.Lew, D. J., Suzuki, Y., Marshall, A. F., Geballe, T. H., and Beasley, M. R., Appl. Phys. Lett. 65, 1584 (1994).CrossRefGoogle Scholar
32. C. L. Jia, B. Kabius, K. Urban, K. Herrmann, G. J. Cui, J. Schubert, W. Zander, A. I. Braginski, and C. Heiden, Physica C 175, 545 (1991); C. L. Jia, B. Kabius, K. Urban, K. Herrmann, J. Schubert, W. Zander, and A. I. Braginski, ibid.196, 211 (1992).Google Scholar