Hostname: page-component-cd9895bd7-7cvxr Total loading time: 0 Render date: 2025-01-02T17:51:55.755Z Has data issue: false hasContentIssue false
  • English
  • Français

Identification and characterization of (Ti, Cu, A1)6N, a new η nitride phase

Published online by Cambridge University Press:  31 January 2011

A. H. Carim
A. H. Carim
Affiliation:
Department of Chemical and Nuclear Engineering and Center for Micro-Engineered Ceramics, University of New Mexico, Albuquerque, New Mexico 87131
Get access

Abstract

In the interfacial reaction zone between AlN and a Ag Cu–Ti braze alloy, a previously unreported phase belonging to the η family (M6X) has been found by transmission electron microscopy. The compound has an approximate stoichiometry of (Ti3−x Cu3−xAl2x)N and space group symmetry of Fd3m, with a cubic lattice parameter of a0 = 1.13 ± 0.02 nm. Large (>1 μm diameter), defect-free grains are present with occasional {111} twinning. Grain boundaries are free of second phases and amorphous interlayers. The formation of continuous layers that grow with reaction time indicate possible stability of the η nitride at 900 °C. The presence of this phase is integral to the chemical and structural development of the ceramic-metal interface.

Type
Articles
Information
Journal of Materials Research , Volume 4 , Issue 6 , December 1989 , pp. 1456 - 1461
Copyright
Copyright © Materials Research Society 1989

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1Rautala, P. and Norton, J. T.J. Metals 4, 1045 (1952) and further discussion on this paper in J. Metals 5, 744 (1953).Google Scholar
2Ettmayer, P. and Suchentrunk, R.Monatsh. Chem. 101, 1098 (1970).Google Scholar
3Jeitschko, W.Holleck, H.Nowotny, H. and Benesovsky, F.Monatsh. Chem. 95, 1004 (1964).Google Scholar
4Kim, Y.W.Rabenberg, L. and Bourell, D. L.J. Mater. Res. 3, 1336 (1988).CrossRefGoogle Scholar
5Carim, A. H. and Loehman, R. E. in preparation.Google Scholar
6Bravman, J. C. and Sinclair, R.J. Electron Microsc. Tech. 1, 53 (1984).CrossRefGoogle Scholar
7Buxton, B.F.Eades, J. A.Steeds, J.W. and Rackham, G.M.Phil. Trans. Roy. Soc. London 281, 171 (1976).Google Scholar
8Raghavan, M.Scanlon, J. C. and Steeds, J. W.Metall. Trans. A 15A, 1299 (1984).Google Scholar
9Eades, J. A.Kaufman, M. J. and Fraser, H. L.Mat. Res. Soc. Symp. Proc. 62, 143 (1986).Google Scholar
10International Tables for X-ray Crystallography, vol. I: Symmetry Groups, edited by Henry, N. F. M. and Lonsdale, K. (International Union of Crystallography, Birmingham, England, 1965), p. 553.Google Scholar
11See e.g., discussion of the [011] zone axis image of Si in Carim, A. H. and Sinclair, R.Mat. Letters 5, 94 (1987); similar images are seen for Ge, GaAs, Al, etc.CrossRefGoogle Scholar