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Interfacial reactions and impact reliability of Sn–Zn solder joints on Cu or electroless Au/Ni(P) bond-pads

Published online by Cambridge University Press:  01 October 2004

M. Date
Affiliation:
Department of Materials Science and Engineering, University of California—Los Angeles, Los Angeles, California 90095
K.N. Tu
Affiliation:
Department of Materials Science and Engineering, University of California—Los Angeles, Los Angeles, California 90095
T. Shoji
Affiliation:
Hitachi Metals, Ltd., Shimane 692-8601, Japan
M. Fujiyoshi
Affiliation:
Hitachi Metals, Ltd., Shimane 692-8601, Japan
K. Sato
Affiliation:
Hitachi Metals, Ltd., Shimane 692-8601, Japan
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Abstract

Sn–9Zn and Sn–8Zn–3Bi solder balls were bonded to Cu or electroless Au/Ni(P)pads, and the effect of aging on joint reliability, including impact reliability, was investigated. For the purpose of quantitatively evaluating the impact toughness ofthe solder joints, a test similar to the classic Charpy impact test was performed.The interfacial compounds formed in the solder/Cu joint during soldering wereCu–Zn intermetallic compounds (IMCs), not Cu–Sn IMCs. One of the Cu–Zn IMCs, γ–Cu5Zn8, thickened remarkably with aging, and eventually its morphology changed from layer-type into discontinuous. The rapid growth of the γ–Cu5Zn8 and void formation at the bond interface led to the significant degradation of the joint reliability due to a ductile-to-brittle transition of the joint. Meanwhile, the compound formed in the solder/Au/Ni(P) joint during soldering was a Au–Zn IMC, above which Zn redeposited during aging. Both the dissolution and diffusion of Ni into the solders were extremely slow, which contributes to negligible void formation at the bond interface. As a result, the solder bumps on the Au/Ni(P) pads were able to maintain the high joint strength and impact toughness even after prolonged aging.

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Articles
Copyright
Copyright © Materials Research Society 2004

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References

REFERENCES

1Tu, K.N. and Zeng, K.: Tin-lead (SnPb) solder reaction in flip chip technology. Mater. Sci. Eng. R 34, 1 (2001).CrossRefGoogle Scholar
2Suganuma, K., Murata, T., Noguchi, H. and Toyoda, Y.: Heat resistance of Sn–9Zn solder/Cu interface with or without coating. J. Mater. Res. 15, 884 (2000).CrossRefGoogle Scholar
3Kim, K.S., Kim, Y.S., Suganuma, K. and Nakajima, H.: Microstructure changes in Sn–Zn/Cu joints during heat-exposure. J. Jpn. Inst. Electron. Packag. 5, 666 (2002).CrossRefGoogle Scholar
4Lee, H.M., Yoon, S.W. and Lee, B.J.: Thermodynamic prediction of interface phases at Cu/solder joints. J. Electron. Mater. 27, 1161 (1998).CrossRefGoogle Scholar
5Lee, B.J., Hwang, N.M. and Lee, H.M.: Prediction of interface reaction products between Cu and various solder alloys by thermodynamic calculation. Acta Mater. 45, 1867 (1997).CrossRefGoogle Scholar
6Harris, P.: Interfacial reactions of tin-zinc-bismuth alloys. Soldering Surf. Mount Technol. 11, 46 (1999).CrossRefGoogle Scholar
7Chonan, Y., Komiyama, T., Onuki, J., Urao, R., Kimura, T. and Nagano, T.: Influence of P content in electroless plated Ni-P alloy film on interfacial structures and strength between Sn–Zn solder and plated Au/Ni-P alloy film. Mater. Trans. 43, 1887 (2002).CrossRefGoogle Scholar
8Yu, S.P., Lin, H.J., Hon, M.H. and Wang, M.C.: Effects of process parameters on the soldering behavior of the eutectic Sn–Zn solder on Cu substrate. J. Mater. Sci.–Mater. Electron. 11, 461 (2000).CrossRefGoogle Scholar
9Chan, Y.C., Chiu, M.Y. and Chuang, T.H.: Intermetallic compounds formed during the soldering reactions of eutectic Sn–9Zn with Cu and Ni substrates. Z. Metallkd. 93, 95 (2002).CrossRefGoogle Scholar
10Chiu, M.Y., Wang, S.S. and Chuang, T.H.: Intermetallic compounds formed during between liquid Sn–8Zn-3Bi solders and Ni substrates. J. Electron. Mater. 31, 494 (2002).CrossRefGoogle Scholar
11Shohji, I., Nakamura, T., Mori, F. and Fujiuchi, S.: Interface reaction and mechanical properties of lead-free Sn–Zn alloy/Cu joints. Mater. Trans. 43, 1797 (2002).CrossRefGoogle Scholar
12Nishiura, M., Nakayama, A., Sakatani, S., Kohara, Y., Uenishi, K. and Kobayashi, K.F.: Mechanical strength and microstructure of BGA joints using lead-free solders. Mater. Trans. 43, 1802 (2002).CrossRefGoogle Scholar
13Hung, K.C., Chan, Y.C., Ong, H.C., Tu, P.L. and Tang, C.W.: Effect of pinhole Au/Ni/Cu substrate on self-alignment of advanced packages. Mater. Sci. Eng. B 76, 87 (2000).CrossRefGoogle Scholar
14Morita, T., Kajiwara, R., Yamamoto, K., Sato, K., Date, M., Shoji, T., Ueno, I., and Okabe, S.: Impact reliability of Pb-free BGA solder joints. Proceedings of the 16th JIEP Annual Meeting, (JIEP, Tokyo, Japan, 2002), p. 107.Google Scholar
15Shoji, T., Yamamoto, K., Kajiwara, R., Morita, T., Sato, K., and Date, M.: Interfacial reactions between Pb-free solders and Cu substrates, in Proceedings of the 16th JIEP Annual Meeting (JIEP, Tokyo, Japan, 2002), p. 97.Google Scholar
16Lyman, T.: Metals Handbook, 8th ed. (American Society for Metals, Materials Park, OH, 1973), Vol. 8.Google Scholar
17Massalski, T.B. and King, H.W.: The lattice spacing relationships in H.C.P. ε and η phases in the systems Cu–Zn, Ag-Zn; Au-Zn and Ag-Cd. Acta Metall. 10, 1171 (1962).CrossRefGoogle Scholar
18Schaffer, J.P., Saxena, A., Antolovich, S.D., Sanders, T.H. Jr. and Warner, S.B.: The Science and Design of Engineering Materials (The McGraw-Hill companies, New York, 1999), p. 384.Google Scholar
19Dyson, B.F., Anthony, T.R. and Turnbull, D.: Interstitial diffusion of copper in tin. J. Appl. Phys. 38, 3408 (1967).CrossRefGoogle Scholar
20Huang, F.H. and Huntington, H.B.: Diffusion of Sb124, Cd109, Sn113, and Zn65 in tin. Phys. Rev. B 9, 1479 (1974).Google Scholar
21Krautheim, G., Neidhardt, A., Reinhold, U. and Zehe, A.: Impurity diffusion of Sn–113 and Sb-124 in copper. Phys. Lett. 72A, 181 (1979).CrossRefGoogle Scholar
22Dutt, M.B. and Sen, S.K.: Diffusion of zinc in copper and silver. Jpn. J. Appl. Phys. 18, 1025 (1979).Google Scholar
23Thwaites, C.J., Warwick, M.E. and Scott, B.: Metals Handbook, 9th ed. (American Society for Metals, Materials Park, OH, 1985), Vol. 9, p. 455.Google Scholar
24Omi, T., Kokunai, S. and Yamamoto, H.: Structure of amorphous Ni-P electrodeposits. Trans. Jpn. Inst. Metals 17, 370 (1976).Google Scholar
25Jang, J.W., Kim, P.G., Tu, K.N., Frear, D.R. and Thompson, P.: Solder reaction-assisted crystallization of electroless Ni-P under bump metallization in low cost flip chip technology. J. Appl. Phys. 85, 8456 (1999).CrossRefGoogle Scholar
26Kim, Y.S., Kim, K.S., Hwang, C.W. and Suganuma, K.: Effect of composition and cooling rate on microstructure and tensile properties of Sn–Zn–Bi alloys. J. Alloys Compd. 352, 237 (2003).CrossRefGoogle Scholar