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Local structure and defects in ultrahigh-temperature materials of borosilicon carbonitride

Published online by Cambridge University Press:  31 January 2011

Kazuhiro Yamamoto*
Affiliation:
Department of Applied Chemistry, Faculty of Science and Engineering, Ritsumeikan University, Nojihigashi, Kusatsu, Shiga 525-8577, Japan
Naoya Tsuganezawa
Affiliation:
Department of Applied Chemistry, Faculty of Science and Engineering, Ritsumeikan University, Nojihigashi, Kusatsu, Shiga 525-8577, Japan
Shin-ichi Makimura
Affiliation:
Department of Applied Chemistry, Faculty of Science and Engineering, Ritsumeikan University, Nojihigashi, Kusatsu, Shiga 525-8577, Japan
Daigo Sawa
Affiliation:
Department of Applied Chemistry, Faculty of Science and Engineering, Ritsumeikan University, Nojihigashi, Kusatsu, Shiga 525-8577, Japan
Shin-ichi Nakahigashi
Affiliation:
Department of Applied Chemistry, Faculty of Science and Engineering, Ritsumeikan University, Nojihigashi, Kusatsu, Shiga 525-8577, Japan
Kazuo Kojima
Affiliation:
Department of Applied Chemistry, Faculty of Science and Engineering, Ritsumeikan University, Nojihigashi, Kusatsu, Shiga 525-8577, Japan
Yoshio Hasegawa
Affiliation:
Art Kagaku Co., Ltd., Tohkai-Mura, Naka-Gun, Ibaraki 319-1112, Japan
*
a)Address all correspondence to this author. e-mail: kokontohzai@hotmail.co.jp
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Abstract

We have investigated structural changes of amorphous borosilicon carbonitride materials with atomic ratios of B/Si/C of 2/3/6 and 4/3/6 calcined at several temperatures. The boron K-edge x-ray absorption spectra showed that the structures of both hexagonal boron nitride ([BN3] unit) with nitrogen-void defects ([BN2] and [BN1] units) and boron oxide existed in the samples, and the relative peak intensity due to the [BN3] unit became stronger by increasing the calcined temperature. It is thought that the well-developed B–N chain and the borosilicate glass coating lead to the high resistance to oxidation at high temperature. X-ray diffraction and infrared measurements followed the x-ray absorption near-edge spectroscopy findings.

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Articles
Copyright
Copyright © Materials Research Society 2008

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References

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