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Measurement of the loss tangent of a thin polymeric film using the atomic force microscope

Published online by Cambridge University Press:  03 March 2011

P.M. McGuiggan  and
D.J. Yarusso
P.M. McGuiggan*
Affiliation:
Polymers Division, National Institute of Standards and Technology, Gaithersburg, Maryland 20899
D.J. Yarusso
Affiliation:
3M Center, Commercial Graphics Division, St. Paul, Minnesota 55144
*
a)Address all correspondence to this author.patricia.mcguiggan@nist.gov
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Abstract

An atomic force microscope was used to measure the loss tangent, tan δ, of a pressure-sensitive adhesive transfer tape as a function of frequency (0.01 to 10 Hz). For the measurement, the sample was oscillated normal to the surface and the response of the cantilever resting on the polymer surface (as measured via the photodiode) was monitored. Both oscillation amplitude and phase were recorded as a function of frequency. The atomic force microscopy measurement gave the same frequency dependence of tan δ as that measured by a dynamic shear rheometer on a film 20 times thicker. The results demonstrate that the atomic force microscope technique can quantitatively measure rheological properties of soft thin polymeric films.

Keywords

Mechanical propertiesScanning probe microscopy (SPM)Polymer
Type
Articles
Information
Journal of Materials Research , Volume 19 , Issue 1 , January 2004 , pp. 387 - 395
Copyright
Copyright © Materials Research Society 2004

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