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Microstructure and morphology of surface oxide films on Ti–6A1–4V

Published online by Cambridge University Press:  31 January 2011

M. Ask ,
U. Rolander ,
J. Lausmaa  and
B. Kasemo
M. Ask
Affiliation:
Department of Physics, Chalmers University of Technology, S-412 96 Göteborg, Sweden
U. Rolander
Affiliation:
Department of Physics, Chalmers University of Technology, S-412 96 Göteborg, Sweden
J. Lausmaa*
Affiliation:
Department of Physics, Chalmers University of Technology, S-412 96 Göteborg, Sweden
B. Kasemo
Affiliation:
Department of Physics, Chalmers University of Technology, S-412 96 Göteborg, Sweden
*
a)Address correspondence to this author.
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Abstract

The microstructure of anodic oxide films grown on Ti–6A1–4V in H2SO4 was investigated by SEM, TEM, STEM, EDX, and AES, as a complement to a recent surface spectroscopic investigation of the same oxides by XPS, AES, and SIMS. The anodic oxide films are heterogeneous and the texture reflects the duplex microstructure (α and β phases) of the underlying metal. Porous oxide regions are observed with different appearances on α-phase and mixed-phase regions. The oxide films are essentially amorphous in the investigated thickness range 60–300 nm (in contrast to as-grown anodic films on pure Ti), but crystallize to the anatase structure upon annealing. Considerable lateral variation of the V content in the oxide is observed, reflecting the corresponding variation in the underlying metal. The results are compared with a previous, similar investigation of anodic oxides on pure Ti.

Type
Articles
Information
Journal of Materials Research , Volume 5 , Issue 8 , August 1990 , pp. 1662 - 1667
Copyright
Copyright © Materials Research Society 1990

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