Hostname: page-component-78c5997874-mlc7c Total loading time: 0 Render date: 2024-11-10T07:45:37.943Z Has data issue: false hasContentIssue false
  • English
  • Français

Microstructure and superconducting properties of Y–Ba–Cu–O and Yb–Ba–Cu–O thin films formed by metalorganic deposition

Published online by Cambridge University Press:  31 January 2011

Y. L. Chen ,
J. V. Mantese ,
A. H. Hamdi  and
A. L. Micheli
Y. L. Chen
Affiliation:
General Motors Research Laboratories, Warren, Michigan 48090–9055
J. V. Mantese
Affiliation:
General Motors Research Laboratories, Warren, Michigan 48090–9055
A. H. Hamdi
Affiliation:
General Motors Research Laboratories, Warren, Michigan 48090–9055
A. L. Micheli
Affiliation:
General Motors Research Laboratories, Warren, Michigan 48090–9055
Get access

Abstract

Thin films of Y–Ba–Cu–O and Yb–Ba–Cu–O, 0.5–1.5 μm in thickness, were deposited onto (211) and (100) SrTiO3 single crystal substrates by metalorganic deposition (MOD). After deposition the samples were annealed either by conventional furnace annealing or rapid thermal annealing (RTA). The microstructures of these films were then characterized by x-ray diffraction (XRD), scanning electron microscopy (SEM), transmission electron microscopy (TEM), and energy-dispersive x-ray spectrometry (EDS). Grain size of the annealed films varied from 0.25 to 1.0 μm. Improved superconducting properties were found for the RTA samples, compared to furnace annealing, and were attributed to larger grain size, little strontium diffusion into the thin films from the substrate, and highly preferred orientation of the 1:2:3 phase.

Type
Articles
Information
Journal of Materials Research , Volume 4 , Issue 5 , October 1989 , pp. 1065 - 1071
Copyright
Copyright © Materials Research Society 1989

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1Bednorz, J.G. and Miiller, K. A.Z. Phys. B64, 189 (1986).CrossRefGoogle Scholar
2Wu, M. K.Ashburn, J. R.Torng, C. T.Hor, P. H.Meng, R. L.Gao, L.Huang, Z.J.Wang, Y.Q. and Chu, C.W.Phys. Rev. Lett. 58, 908 (1987).CrossRefGoogle Scholar
3Bardeen, J.Mater. Res. Soc. Symp. Proc. 99, 27 (1988).CrossRefGoogle Scholar
4Maeda, H.Tanaka, Y.Fukutomi, M. and Asano, T.Jpn. J. Appl. Phys. 27, L209 (1988).CrossRefGoogle Scholar
5Chu, C. W.Bechtold, J.Gao, L.Hor, P. H.Huang, Z. J.Meng, R. L.Sun, Y. Y.Wang, Y.Q. and Xue, Y. Y.Phys. Rev. Lett. 60, 941 (1988).CrossRefGoogle Scholar
6Sheng, Z. Z. and Hermann, A. M.Nature 332, 138 (1988).CrossRefGoogle Scholar
7Jin, S.Sherwood, R. C.van Dover, R.B., Tiefel, T. H. and Johnson, D.W. Jr. , Appl. Phys. Lett. 51, 203 (1987).CrossRefGoogle Scholar
8Togano, K.Kumakura, H. and Shimizu, H.Mater. Res. Soc. Symp. Proc. 99, 191 (1988).CrossRefGoogle Scholar
9Adachi, H.Setsune, K.Mitsuyu, T.Hirochi, K.Ichikawa, Y.Kamada, T. and Wasa, K.Jpn. J. Appl. Phys. 26, L709 (1987).CrossRefGoogle Scholar
10Laibowitz, R. B.Koch, R. H.Chaudhari, P. and Gambino, R. J.Phys. Rev. B 35, 8821 (1987).CrossRefGoogle Scholar
11Hong, M.Liou, S.H.Kwo, J. and Davidson, B. A.Appl. Phys. Lett. 51, 694 (1987).CrossRefGoogle Scholar
12Scheuermann, M.Chi, C. C.Tsuei, C. C.Yee, D.S.Cuomo, J.J.Laibowitz, R.B.Koch, R. H.Braren, B.Srinivasan, R. and Plechaty, M.M.Appl. Phys. Lett. 51, 1951 (1987).CrossRefGoogle Scholar
13Dijkkamp, D.Venkatesan, T.Wu, X. D.Shaheen, S.A.Jisrawi, N.Min-Lee, Y.H., McLean, W. L. and Croft, M.Appl. Phys. Lett. 51, 619 (1987).CrossRefGoogle Scholar
14Webb, C.Weng, S.L.Eckstein, J. N.Missert, N.Char, K.Schlom, D. G.Hellman, E. S.Beasley, M. R.Kapitulnik, A. and Harris, J. S. Jr. , Appl. Phys. Lett. 51, 1191 (1987).CrossRefGoogle Scholar
15Kwo, J.Hsieh, T.C.Fleming, R. M.Hong, M.Liou, S.H.Davidson, B.A. and Feldman, L. C.Phys. Rev. B 36, 4039 (1987).CrossRefGoogle Scholar
16Hamdi, A. H.Mantese, J. V.Micheli, A. L.Laugal, R. C. O.Dungan, D. F.Zhang, Z. H. and Padmanabhan, K.R.Appl. Phys. Lett. 51, 2152 (1987).CrossRefGoogle Scholar
17Mantese, J.V.Hamdi, A.H.Micheli, A.L.Chen, Y.L.Wong, C.A.Johnson, J. L.Karmarkar, M. M. and Padmanabhan, K. R.Appl. Phys. Lett. 52, 1631 (1988).CrossRefGoogle Scholar
18Gross, M. E.Hong, M.Liou, S. H.Gallagher, P. K. and Kwo, J.Appl. Phys. Lett. 52, 160 (1988).CrossRefGoogle Scholar
19Koch, R.H.Umbach, C.P.Clark, G.J.Chaudhari, P. and Laibowitz, R.B.Appl. Phys. Lett. 51, 200 (1987).CrossRefGoogle Scholar
20Clarke, J.Nature 333, 29 (1988).CrossRefGoogle Scholar
21Damento, M. A.Gschneidner, K. A. Jr. , and McCallum, R.W.Appl. Phys. Lett. 51, 690 (1987).CrossRefGoogle Scholar
22Hamdi, A. H.Mantese, J. V.Micheli, A. L.Waldo, R. A.Chen, Y. L. and Wong, C. A.Appl. Phys. Lett. 53, 435 (1988).CrossRefGoogle Scholar
23Frase, K. G.Liniger, E. G. and Clarke, D. R.Adv. Ceram. Mater. 2, 698 (1987).CrossRefGoogle Scholar
24Yan, M.F.Barns, R. L.O'Bryan, H.M. Jr., Gallagher, P. K.Sherwood, R. C. and Jin, S.Appl. Phys. Lett. 51, 532 (1987).CrossRefGoogle Scholar
25Hamdi, A. H.Mantese, J. V.Micheli, A. L.Laugal, R. C. O. and Dungan, D. F. (unpublished research).Google Scholar
26Marshall, A.F.Barton, R.W.Char, K.Kapitulnik, A.Oh, B.Hammond, R. H. and Laderman, S.S.Phys. Rev. B 37, 9353 (1988).CrossRefGoogle Scholar
27Zandbergen, H. W.Gronsky, R.Wang, K. and Thomas, G.Mater. Res. Soc. Symp. Proc. 99, 553 (1988).CrossRefGoogle Scholar
28Eaglesham, D.J.Humphreys, C.J. N. McAlford, N.Clegg, W. J.Harmer, M. A. and Birchall, J.D.Appl. Phys. Lett. 51, 457 (1987).CrossRefGoogle Scholar
29Veal, B.W.Kwok, W. K.Umezawa, A.Crabtree, G.W.Jorgensen, J.D.Downey, J.W.Nowicki, L.J.Mitchell, A.W.Paulikas, A. P. and Sowers, C. H.Appl. Phys. Lett. 51, 279 (1987).CrossRefGoogle Scholar
30Fornasini, M. L.Costa, G.A.Ferretti, M. and Olcese, G.L.Solid State Commun. 65, 1121 (1988).CrossRefGoogle Scholar
31Wong-Ng, W., McMurdie, H.Paretzkin, B.Zhang, Y.Davis, K.Hubbard, C.Dragoo, A. and Stewart, J.Powder Diffraction 2, 116 (1987).Google Scholar
32Weast, R. C.Astle, M. J. and Beyer, W. H.CRC Handbook of Chemistry and Physics, 69th edition (CRC Press, Inc., Boca Raton, FL, 1988).Google Scholar
33Hamdi, A.H.Mantese, J.V.Micheli, A. L.Waldo, R.A.Chen, Y. L.Wong, C.A.Karmarkar, M.M. and Padmanabhan, K.R.J. Mater. Res. 3, 1311 (1988).CrossRefGoogle Scholar