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Nanoindentation near the edge

Published online by Cambridge University Press:  31 January 2011

J.E. Jakes ,
C.R. Frihart ,
J.F. Beecher ,
R.J. Moon ,
P.J. Resto ,
Z.H. Melgarejo ,
O.M. Suárez ,
H. Baumgart ,
A.A. Elmustafa  and
D.S. Stone
J.E. Jakes
Affiliation:
Materials Science Program, University of Wisconsin—Madison, Madison, Wisconsin 53706; and United States Forest Service, Forest Products Laboratory, Madison, Wisconsin 53726
C.R. Frihart
Affiliation:
Materials Science Program, University of Wisconsin—Madison, Madison, Wisconsin 53706; and United States Forest Service, Forest Products Laboratory, Madison, Wisconsin 53726
J.F. Beecher
Affiliation:
Materials Science Program, University of Wisconsin—Madison, Madison, Wisconsin 53706; and United States Forest Service, Forest Products Laboratory, Madison, Wisconsin 53726
R.J. Moon
Affiliation:
United States Forest Service, Forest Products Laboratory, Madison, Wisconsin 53726
P.J. Resto
Affiliation:
Materials Science Program, University of Wisconsin—Madison, Madison, Wisconsin 53706; and United States Forest Service, Forest Products Laboratory, Madison, Wisconsin 53726
Z.H. Melgarejo
Affiliation:
Materials Science Program, University of Wisconsin—Madison, Madison, Wisconsin 53706
O.M. Suárez
Affiliation:
Engineering Science and Materials Department, University of Puerto Rico—Mayagüez, Mayagüez, Puerto Rico 00681-9044
H. Baumgart
Affiliation:
Applied Research Center, Jefferson National Accelerator Facility, Newport News, Virginia 23606; and Department of Electrical Engineering, Old Dominion University, Norfolk, Virginia 23529
A.A. Elmustafa
Affiliation:
Applied Research Center, Jefferson National Accelerator Facility, Newport News, Virginia 23606; and Department of Mechanical Engineering, Old Dominion University, Norfolk, Virginia 23529
D.S. Stone*
Affiliation:
Materials Science Program, University of Wisconsin—Madison, Madison, Wisconsin 53706; and Department of Materials Science and Engineering, University of Wisconsin—Madison, Madison, Wisconsin 53706
*
a) Address all correspondence to this author. e-mail: dsstone@wisc.edu
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Abstract

Whenever a nanoindent is placed near an edge, such as the free edge of the specimen or heterophase interface intersecting the surface, the elastic discontinuity associated with the edge produces artifacts in the load–depth data. Unless properly handled in the data analysis, the artifacts can produce spurious results that obscure any real trends in properties as functions of position. Previously, we showed that the artifacts can be understood in terms of a structural compliance, Cs, which is independent of the size of the indent. In the present work, the utility of the SYS (Stone, Yoder, Sproul) correlation is demonstrated in its ability to remove the artifacts caused by Cs. We investigate properties: (i) near the surface of an extruded polymethyl methacrylate rod tested in cross section, (ii) of compound corner middle lamellae of loblolly pine (Pinus taeda) surrounded by relatively stiff wood cell walls, (iii) of wood cell walls embedded in a polypropylene matrix with some poorly bonded wood–matrix interfaces, (iv) of AlB2 particles embedded in an aluminum matrix, and (v) of silicon-on-insulator thin film on substrate near the free edge of the specimen.

Keywords

Elastic propertiesHardnessNanoindentation
Type
Articles
Information
Journal of Materials Research , Volume 24 , Issue 3 , March 2009 , pp. 1016 - 1031
Copyright
Copyright © Materials Research Society 2009

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