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Nanoindentation studies of sublimed fullerene films using atomic force microscopy

Published online by Cambridge University Press:  03 March 2011

Juai Ruan  and
Bharat Bhushan
Juai Ruan
Affiliation:
Computer Microtribology and Contamination Laboratory, Department of Mechanical Engineering, The Ohio State University, 206 West 18th Avenue, Columbus, Ohio 43210-1107
Bharat Bhushan
Affiliation:
Computer Microtribology and Contamination Laboratory, Department of Mechanical Engineering, The Ohio State University, 206 West 18th Avenue, Columbus, Ohio 43210-1107
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Abstract

Nanoindentation studies of sublimed fullerene films have been conducted using an atomic force microscope (AFM). Transfer of fullerene molecules from the as-deposited films to the AFM tip was observed during the indentation of AFM tip into some of the samples, whereas such a transfer was not observed for ion-bombarded films. The fullerene molecules transferred to the AFM tip were subsequently transported to a diamond surface when the diamond sample was scanned with the contaminated tip. This demonstrates the capability of material manipulation on a molecular scale using AFM. Atomic-scale friction of the fullerene films was measured to be low. Ability of fullerene films to form transfer film on the mating AFM tip surface may be partly responsible for low friction.

Type
Rapid Communications
Information
Journal of Materials Research , Volume 8 , Issue 12 , December 1993 , pp. 3019 - 3022
Copyright
Copyright © Materials Research Society 1993

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References

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