Hostname: page-component-cd9895bd7-fscjk Total loading time: 0 Render date: 2024-12-29T05:10:06.432Z Has data issue: false hasContentIssue false
  • English
  • Français

A novel route for the synthesis of Sr1−xBaxNb2O6 thin films

Published online by Cambridge University Press:  03 March 2011

A. Kashani ,
M.S. Tomar  and
E. Dayalan
A. Kashani
Affiliation:
Physics and Engineering Physics Department, The University of Tulsa, Tulsa, Oklahoma 74104-3189
M.S. Tomar
Affiliation:
Physics and Engineering Physics Department, The University of Tulsa, Tulsa, Oklahoma 74104-3189
E. Dayalan
Affiliation:
Erosion/Corrosion Research Center, Mechanical Engineering Department, The University of Tulsa, Tulsa, Oklahoma 74104-3189
Get access

Abstract

Stoichiometric Sr1−xBaxNb2O6 (SBN) powder and thin films were prepared by a chemical method. The starting materials were niobium ethoxide and the hydroxides of strontium and barium. Powders were obtained by evaporation of the precursor solution, and thin films were deposited by spin coating. Annealing temperature required to obtain complete conversion to the crystalline material was about 700 °C. Stoichiometric polycrystalline films of Sr1−xBaxNb2O6 were deposited on quartz and silicon substrates. Leakage current-voltage and the capacitance-voltage measurements on a metal/SBN/n-silicon structure show a diode-type characteristic.

Type
Rapid Communication
Information
Journal of Materials Research , Volume 10 , Issue 10 , October 1995 , pp. 2404 - 2407
Copyright
Copyright © Materials Research Society 1995

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1Nomura, S. and Kojima, H., Jpn. J. Appl. Phys. 13, 1185 (1974).CrossRefGoogle Scholar
2Swartz, S. L., IEEE Trans. Electr. Insulation 25, 935 (1990).CrossRefGoogle Scholar
3Burfoot, J. C., in Active and Passive Thin Film Devices, edited by Coutts, J.C. (Academic Press, New York, 1978), pp. 697–741.Google Scholar
4Dayalan, E. and Tomar, M. S., Thin Solid Films 236, 37 (1993).CrossRefGoogle Scholar
5Xu, R., Xu, Y., Chen, C. J., and Mackenzie, J. D., J. Mater. Res. 5, 916 (1990).CrossRefGoogle Scholar
6Chen, C.J., Xu, Y., Xu, R., and Mackenzie, J. D., J. Appl. Phys. 69, 1763 (1991).CrossRefGoogle Scholar
7Thony, S. S., Youden, K. E., Harris, J. S. Jr., and Hesselink, L., J. Appl. Phys. Lett. 65, 2018 (1994).CrossRefGoogle Scholar