Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by
Crossref.
Thibault, Jany
Rouviere, Jean‐Luc
and
Bourret, Alain
2000.
Handbook of Semiconductor Technology Set.
p.
377.
Thibault, Jany
Rouviere, Jean‐Luc
and
Bourret, Alain
2000.
Handbook of Semiconductor Technology.
p.
377.
Tangen, Inger‐Lise
Yu, Yingda
Grande, Tor
Høier, Ragnvald
and
Einarsrud, Mari‐Ann
2004.
Phase Relations and Microstructural Development of Aluminum Nitride–Aluminum Nitride Polytypoid Composites in the Aluminum Nitride–Alumina–Yttria System.
Journal of the American Ceramic Society,
Vol. 87,
Issue. 9,
p.
1734.
Tangen, Inger-Lise
Yu, Yingda
Grande, Tor
Høier, Ragnvald
and
Einarsrud, Mari-Ann
2005.
Preparation and characterization of silica-doped aluminum nitride–aluminum nitride polytypoid composites.
Ceramics International,
Vol. 31,
Issue. 4,
p.
591.
Brien, V.
and
Pigeat, P.
2007.
Microstructures diagram of magnetron sputtered AlN deposits: Amorphous and nanostructured films.
Journal of Crystal Growth,
Vol. 299,
Issue. 1,
p.
189.
Brien, V.
and
Pigeat, P.
2008.
Correlation between the oxygen content and the morphology of AlN films grown by r.f. magnetron sputtering.
Journal of Crystal Growth,
Vol. 310,
Issue. 16,
p.
3890.
McCullen, E. F.
Thakur, J. S.
Danylyuk, Y. V.
Auner, G. W.
and
Rosenberger, L. W.
2008.
Investigation of the occupation behavior for oxygen atoms in AlN films using Raman spectroscopy.
Journal of Applied Physics,
Vol. 103,
Issue. 6,
Thompson, Derek P.
2010.
Ceramics Science and Technology.
p.
229.
Thibault, Jany
Rouviere, Jean‐Luc
and
Bourret, Alain
2013.
Materials Science and Technology.
Thompson, Derek P.
2013.
Ceramics Science and Technology.
p.
229.
Won, Dongjin
and
Redwing, Joan M.
2013.
Effect of AlN buffer layers on the surface morphology and structural properties of N-polar GaN films grown on vicinal C-face SiC substrates.
Journal of Crystal Growth,
Vol. 377,
Issue. ,
p.
51.
Zhang, J. Y.
Xie, Y. P.
Guo, H. B.
and
Chen, Y. G.
2018.
Thermodynamics of inversion-domain boundaries in aluminum nitride: Interplay between interface energy and electric dipole potential energy.
Journal of Applied Physics,
Vol. 123,
Issue. 17,
Stolyarchuk, N.
Markurt, T.
Courville, A.
March, K.
Zúñiga-Pérez, J.
Vennéguès, P.
and
Albrecht, M.
2018.
Intentional polarity conversion of AlN epitaxial layers by oxygen.
Scientific Reports,
Vol. 8,
Issue. 1,
Базлов, Н. В.
Вывенко, О. Ф.
Ниязова, Н. В.
Котина, И. М.
Трушин, М. В.
and
Бондаренко, А. С.
2024.
Структура и электропроводность тонких пленок нитрида алюминия на кремнии.
Kristallografiâ,
Vol. 69,
Issue. 1,
p.
91.
Bazlov, N. V.
Vyvenko, O. F.
Niyazova, N. V.
Kotina, I. M.
Trushin, M. V.
and
Bondarenko, A. S.
2024.
Structure and Electrical Conductivity of Thin AlN Films on Si.
Crystallography Reports,
Vol. 69,
Issue. 1,
p.
65.