Hostname: page-component-cd9895bd7-jkksz Total loading time: 0 Render date: 2024-12-28T16:29:18.675Z Has data issue: false hasContentIssue false
  • English
  • Français

RBS and XPS analyses of phosphor packages for laser-heat thermoluminescence dosimetry

Published online by Cambridge University Press:  31 January 2011

S.H. Stern ,
J.L. Price ,
D.G. Simons ,
D.J. Land ,
V.K. Mathur ,
C.R. Anderson  and
B.C. Beard
S.H. Stern
Affiliation:
United States Naval Surface Warfare Center, Silver Spring, Maryland 20903–5000
J.L. Price
Affiliation:
United States Naval Surface Warfare Center, Silver Spring, Maryland 20903–5000
D.G. Simons
Affiliation:
United States Naval Surface Warfare Center, Silver Spring, Maryland 20903–5000
D.J. Land
Affiliation:
United States Naval Surface Warfare Center, Silver Spring, Maryland 20903–5000
V.K. Mathur
Affiliation:
United States Naval Surface Warfare Center, Silver Spring, Maryland 20903–5000
C.R. Anderson
Affiliation:
United States Naval Surface Warfare Center, Silver Spring, Maryland 20903–5000
B.C. Beard
Affiliation:
United States Naval Surface Warfare Center, Silver Spring, Maryland 20903–5000
Get access

Abstract

Phosphor packages for a laser-heat thermoluminescence radiation-dosimetry system have been analyzed with Rutherford Backscattering Spectrometry and X-ray Photoelectron Spectroscopy. Samples consist of 20–50 μm diameter powder grains of CaSO4: Tm and LiF: (Mg, Ti) phosphor embedded in a transparent silicone matrix about 60 μm thick. Our principal finding with regard to layer morphology indicates an inhomogeneous outer layer of areal density at least ∼300 μg/cm2 depleted of phosphor and contaminated with boron.

Type
Articles
Information
Journal of Materials Research , Volume 6 , Issue 7 , July 1991 , pp. 1574 - 1579
Copyright
Copyright © Materials Research Society 1991

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1.Braunlich, P.F., Radiation Protection Dosimetry 34, 345–351 (1990);CrossRefGoogle Scholar
Bloomsburg, C.D., Braunlich, P.F., Hegland, J.E., Hoelscher, J.W., and Tetzlaff, W., Radiation Protection Dosimetry 34 365–368 (1990).CrossRefGoogle Scholar
2.Braunlich, Peter F., Fillard, Jean, and Gasiot, Jean, U.S. Patent No. 4507562 (26 March 1985).Google Scholar
3.McKeever, S. W. S., Thermoluminescence of Solids (Cambridge University Press, Cambridge, 1985), pp. 10, 11, and 91.CrossRefGoogle Scholar
4.Yamashita, T., Nada, N., Onichi, H., and Kitamura, S., Health Phys. 21, 295–300 (1971).CrossRefGoogle Scholar
5.Portal, G., in Applied Thermoluminescence Dosimetry, edited by Oberhofer, M. and Scharmann, A. (Adam Hilger, Ltd., Bristol, 1981), pp. 115 and 97–105.Google Scholar
6.Land, David J., U.S. Naval Surface Warfare Center, technical report in preparation (unpublished).Google Scholar
7.Ziegler, J. F., Biersack, J. P., and Littmark, U., The Stopping and Range of Ions in Matter (Pergamon Press, New York, 1985), Vol. 1.Google Scholar
8.Bevington, Philip R., Data Reduction and Error Analysis for the Physical Sciences (McGraw-Hill Book Company, New York, 1969), pp. 232–233 and 224–226.Google Scholar
9.Dale Beers, M., in Handbook ofAdhesives, edited by Skeist, Irving, 2nd ed. (Van Nostrand Reinhold Company, New York, 1977), pp. 628–639.Google Scholar
10.Leavitt, J. A., “Non-Rutherford 4He Cross Sections for Ion-Beam Analysis,” paper BA3 at the Eleventh International Conference on the Application of Accelerators in Research and Industry, University of North Texas, Denton, TX, 5 November 1990 [Bull. Am. Phys. Soc. 35, 1695 (1990)].Google Scholar
11.Warrick, E. L. and McGregor, R. R., Dow Corning Company, U.S. Patent No. 2460 805 (8 February 1949).Google Scholar
12.Wagner, C.D., Riggs, W.M., Davis, L.E., and Moulder, J.F., Handbook ofX-Ray Photoelectron Spectroscopy, edited by Muilenberg, G. E. (Perkin-Elmer Corp., Physical Electronics Division, Eden Prairie, MN, 1979).Google Scholar
13.Douglas, J. A., in Applied Thermoluminescence Dosimetry, op. cit., pp. 229–240.Google Scholar
14.Klein, Jacob, Science 250, 640–646 (1990).CrossRefGoogle Scholar