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Relationship between characteristics of modulation peaks and modulation wavelength, average composition, and interdiffusion tendency of multilayers

Published online by Cambridge University Press:  31 January 2011

H.Y. Bai ,
W.H. Wang ,
Y. Zhang ,
H. Chen  and
W.K. Wang
H.Y. Bai
Affiliation:
Institute of Physics, Academia Sinica, Beijing 100080, People's Republic of China
W.H. Wang
Affiliation:
Institute of Physics, Academia Sinica, Beijing 100080, People's Republic of China
Y. Zhang
Affiliation:
Institute of Physics, Academia Sinica, Beijing 100080, People's Republic of China
H. Chen
Affiliation:
Institute of Physics, Academia Sinica, Beijing 100080, People's Republic of China
W.K. Wang
Affiliation:
Institute of Physics, Academia Sinica, Beijing 100080, and International Center for Materials, Academia Sinica, Shenyang 110015, People's Republic of China
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Abstract

It was found that the modulation wavelength and average composition of multilayers are related to the position, intensity, and diffraction order of x-ray modulation peaks for multilayers. The relation between the characteristics of the modulation peaks in different as-deposited multilayers and their interdiffusion capability is also discussed.

Type
Articles
Information
Journal of Materials Research , Volume 7 , Issue 6 , June 1992 , pp. 1423 - 1426
Copyright
Copyright © Materials Research Society 1992

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References

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