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Scanning nonlinear dielectric microscopy

Published online by Cambridge University Press:  23 August 2011

Yasuo Cho
Yasuo Cho*
Affiliation:
Research Institute of Electrical Communication, Tohoku University, Aoba-ku, Sendai 980-8577, Japan
*
a)Address all correspondence to this author. e-mail: yasuocho@riec.tohoku.ac.jp
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Abstract

In this article, scanning nonlinear dielectric microscopy (SNDM) with atomic resolution is reviewed. First, experimental results on the detection of ferroelectric domains are shown following a presentation about the theory and principle of SNDM. Next, a three-dimensional (3D) type of SNDM for measuring the 3D distribution of ferroelectric polarization and noncontact scanning nonlinear dielectric microscopy (NC-SNDM) are proposed. Using NC-SNDM under ultrahigh vacuum conditions, we clearly resolve the electric dipole moment distribution of Si atoms on a Si(111)7 × 7 surface. We also succeeded to resolve a fullerene (C60) molecule. Since the technique is applicable not only to semiconductors but also to both polar and non-polar dielectric materials, SrTiO3 and TiO2 surfaces were observed by NC-SNDM. Finally, we characterize an ultrahigh-density ferroelectric data storage system using SNDM as a pickup device and a congruent lithium tantalate single crystal as a ferroelectric recording medium.

Keywords

FerroelectricScanning probe microscopy
Type
Invited Feature Review
Information
Journal of Materials Research , Volume 26 , Issue 16 , 28 August 2011 , pp. 2007 - 2016
Copyright
Copyright © Materials Research Society 2011

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References

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