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Single-crystal x-ray diffraction from an icosahedral quasicrystal

Published online by Cambridge University Press:  31 January 2011

A. R. Kortan ,
H. S. Chen  and
J. V. Waszczak
A. R. Kortan
Affiliation:
AT&T Bell Laboratories. 600 Mountain Avenue, Murray Hill, New Jersey 07974
H. S. Chen
Affiliation:
AT&T Bell Laboratories. 600 Mountain Avenue, Murray Hill, New Jersey 07974
J. V. Waszczak
Affiliation:
AT&T Bell Laboratories. 600 Mountain Avenue, Murray Hill, New Jersey 07974
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Abstract

Single-crystal x-ray diffraction measurements made on a millimeter-size single icosahedral quasicrystal of an Al–Li–Cu alloy are reported. The point symmetries observed directly by real-time transmission Laue x-ray diffraction and the measured angles between the major symmetry axis are consistent with an icosahedral quasicrystal, and the peaks observed in the single-crystal diffraction scans are found to be indexable with six indices that belong to a primitive icosahedral Bravais quasilattice.

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Type
Rapid Communications
Information
Journal of Materials Research , Volume 2 , Issue 3 , June 1987 , pp. 294 - 297
Copyright
Copyright © Materials Research Society 1987

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References

REFERENCES

1Shechtman, D.Blech, I.Gratias, D. and Cahn, J. W.Phys. Rev. Lett. 53, 1951 (1984).Google Scholar
2For a general review see Phys, J.. (Paris) Colloq. C3 47 (1986).Google Scholar
3Levine, D. and Steinhardt, P. J.Phys. Rev. Let. 53, 2477 (1984).Google Scholar
4Kalugin, P. A.Kitayev, A. Yu, and Levitov, L. S.JETP 41, 119 (1985).Google Scholar
5Bak, P.Phys. Rev. Lett. 54, 1517 (1985); N. D. Mermin and S. M., Troian ibid. 55, 607 (1985); S. Sachdev and D. R., Nelson Phys. Rev. B 32, 4592 (1985).Google Scholar
6Penrose, R.J. Inst. Math. Its Appl. 10, 266 (1974).Google Scholar
7Duneau, M. and Katz, A.Phys. Rev. Lett. 54, 2688 (1985).Google Scholar
8Elser, V.Phys. Rev. B 32, 4892 (1985).Google Scholar
9Elser, V. and Henley, C. L.Phys. Rev. Lett. 55, 2883 (1985); M. Audierand P., Guyot, Philos. Mag. B 53, L43 (1986).Google Scholar
10Stephens, P. W. and Goldman, A. I.Phys. Rev. Lett. 56, 1168 (1986).Google Scholar
11Bancel, P. A.Heiney, P. A.Stephens, P. W.Goldman, A. and Horn, P. M., Phys. Rev. Lett. 54, 2422 (1985).Google Scholar
12Ball, M. D. and Lloyd, D. J.Scr. Metall. 19, 1065 (1985).CrossRefGoogle Scholar
13Sainfort, P. and Dubost, B.J. Phys. (Paris) C3 47, 321 (1986); also C. R. Acad. Sci. Paris 301, 689 (1985).Google Scholar
14Cassada, W. A.Shiflet, G. J. and Poon, S. J.Phys. Rev. Lett. 56, 2276 (1986).CrossRefGoogle Scholar
15Marcus, M. A. and Elser, V. Philos. Mag. (to be published); H. K. Hardy and J. M., Silcock J. Inst. Met. 84, 423 (1955).Google Scholar
16Bartges, C.Tosten, M. H.Howell, P. R. and Ryba, E. R. (preprint submitted to J. Mater. Sci.).Google Scholar
17Cahn, J. W.Shechtman, D. and Gratias, D.J. Mater. Res. 1, 13 (1986).Google Scholar
18International Tablesfor Crystallography, edited by Hahn, T. (Reidel, Hirgham, MA, 1983), Vol. A.Google Scholar
19Kalugin, P. A.Kitayev, A. Yu, and Levitov, L. S.J. Phys. Lett. 46, L601 (1985).Google Scholar
20Henley, C.L. and Elser, V.Philos. Mag. B 53, L59 (1986).Google Scholar
21Socolar, J. E. S.Lubensky, T. C. and Steinhardt, P. J. (preprint).Google Scholar