Hostname: page-component-78c5997874-mlc7c Total loading time: 0 Render date: 2024-11-10T02:52:39.807Z Has data issue: false hasContentIssue false
  • English
  • Français

Structural phase evolution of strontium-doped lead titanate thin films prepared by the soft chemical technique

Published online by Cambridge University Press:  31 January 2011

F. M. Pontes ,
S. H. Leal ,
P. S. Pizani ,
M. R. M. C. Santos ,
E. R. Leite ,
E. Longo ,
F. Lanciotti Jr. ,
T. M. Boschi  and
J. A. Varela
F. M. Pontes
Affiliation:
Laboratório Interdisciplinar de Eletroquímica e Cerâmica (LIEC), Centro Multidisciplinar Para Desenvolvimento de Materiais Cerâmicos (CMDMC), Departamento de Química, Universidade Federal de São Carlos (UFSCar), Via Washington, Km 235, CP-676, CEP-13565–905, São Carlos, S. P., Brazil
S. H. Leal
Affiliation:
Laboratório Interdisciplinar de Eletroquímica e Cerâmica (LIEC), Centro Multidisciplinar Para Desenvolvimento de Materiais Cerámicos (CMDMC), Departamento de Química, Universidade Federal de São Carlos (UFSCar), Via Washington, Km 235, CP-676, CEP-13565–905, São Carlos, S. P., Brazil, and Centro de Ciências da Natureza (CCN), Departamento de Química, Universidade Federal do Piauí (UFPI), Teresina, PI, Brazil
P. S. Pizani
Affiliation:
Departamento de Física, Universidade Federal de São Carlos (UFSCar), Via Washington, Km 235, CEP-13565–905, São Carlos, S. P., Brazil
M. R. M. C. Santos
Affiliation:
Centro de Ciências da Natureza (CCN), Departamento de Química, Universidade Federal do Piauí (UFPI), Teresina, PI, Brazil
E. R. Leite
Affiliation:
Laboratório Interdisciplinar de Eletroquímica e Cerâmica (LIEC), Centro Multidisciplinar Para Desenvolvimento de Materiais Cerâmicos (CMDMC), Departamento de Química, Universidade Federal de São Carlos (UFSCar), Via Washington, Km 235, CP-676, CEP-13565–905, São Carlos, S. P., Brazil
E. Longo*
Affiliation:
Laboratório Interdisciplinar de Eletroquímica e Cerâmica (LIEC), Centro Multidisciplinar Para Desenvolvimento de Materiais Cerâmicos (CMDMC), Departamento de Química, Universidade Federal de São Carlos (UFSCar), Via Washington, Km 235, CP-676, CEP-13565–905, São Carlos, S. P., Brazil
F. Lanciotti Jr.
Affiliation:
Departamento de Física, Universidade Federal de São Carlos (UFSCar), Via Washington, Km 235, CEP-13565–905, São Carlos, S. P., Brazil
T. M. Boschi
Affiliation:
Departamento de Física, Universidade Federal de São Carlos (UFSCar), Via Washington, Km 235, CEP-13565–905, São Carlos, S. P., Brazil
J. A. Varela
Affiliation:
Instituto de Química, Universidade Estadual Paulista (UNESP), Araraquara, S. P., Brazil
*
a)Address all correspondence to this author. e-mail: liec@power.ufscar.br
Get access

Abstract

Strontium-modified lead titanate thin films with composition Pb1−xSrxTiO3 were grown on Pt/Ti/SiO2/Si substrates using the polymeric precursor method. The structural phase evolution as a function of the Sr contents was studied using micro-Raman scattering, specular reflectance infrared Fourier transform spectroscopy, and x-ray diffraction. The results showed a gradual change from tetragonal to cubic structure, the transition occurring at about x = 0.58. The infrared reflectance spectra showed that the frequency of several peaks decreases as the strontium concentration increases. These features are correlated with a decrease in the tetragonal distortion of the TiO6 octahedra as the strontium concentration increases.

Type
Articles
Information
Journal of Materials Research , Volume 18 , Issue 3 , March 2003 , pp. 659 - 663
Copyright
Copyright © Materials Research Society 2003

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1.Preda, L., Courselle, L., Despax, B., Bandet, J., and Ianculescu, A., Thin Solid Films 389, 43 (2001).Google Scholar
2.Zou, Q., Nourbaskhsh, S., and Kim, J., Mater. Lett. 40, 240 (1999).Google Scholar
3.Pontes, F.M., Longo, E., Leite, E.R., and Varela, J.A., Thin Solid Films 386, 91 (2001).CrossRefGoogle Scholar
4.Lin, C.H., Lee, S.W., Chen, H., and Wu, T.B., Appl. Phys. Lett. 75, 2485 (1999).CrossRefGoogle Scholar
5.Wang, C.H. and Choi, D.J., J. Am. Ceram. Soc. 84, 207 (2001).CrossRefGoogle Scholar
6.Iijima, T., He, G., and Funakubo, H., Integr. Ferroelectr. 36, 255 (2001).CrossRefGoogle Scholar
7.Bosak, A.A., Samoilenkov, S.V., Gorbenko, O.Y., Graboy, I.E., Botev, A.N., Kaul, A.R., and Zandbergen, H.W., Chem. Mater. 13, 981 (2001).CrossRefGoogle Scholar
8.Chu, S.Y. and Chen, C.Z., Sens. Actuators, A 89, 210 (2001).CrossRefGoogle Scholar
9.Venkateswarlu, P., Bharadwaja, S.S.N., and Krupanidhi, S.B., Thin Solid Films 389, 84 (2001).Google Scholar
10.Li, H., Tang, X., Li, Q., Liu, Y., Tang, Z., Zhang, Z.Y., and Mo, D., Solid State Commun. 114, 347 (2000).CrossRefGoogle Scholar
11.Calzada, M.L., Sirera, R., Ricote, J., and Pardo, L., J. Mater. Chem. 8, 111 (1998).CrossRefGoogle Scholar
12.Wang, C.C.M., Huang, Y.T., Chen, Y.C., Lee, M.S., and Kao, M.C., Jpn. J. Appl. Phys. 39, 3579 (2000).Google Scholar
13.Shen, G. and Du, P.Y., J. Inorg. Mater. 17, 117 (2002).Google Scholar
14.Chung, H.J., Chung, S.J., Kim, J.H., and Woo, S.I., Thin Solid Films 394, 213 (2001).Google Scholar
15.Kang, D.H., Kim, J.H., Park, J.H., and Yoon, K.H., Mater. Res. Bull. 36, 265 (2001).CrossRefGoogle Scholar
16.Pontes, F.M., Araújo, E.B., Leite, E.R., Eiras, J.A., Longo, E., Varela, J.A., Pereira-da-Silva, M.A., J. Mater. Res. 15, 1176 (2000).Google Scholar
17.Pontes, F.M., Pontes, D.S.L., Leite, E.R., Longo, E., Santos, E.M.S., Mergulhão, S., Chiquito, A., Pizani, P.S., Lanciotti, F., Jr., Boschi, T.M., and Varela, J.A., J. Appl. Phys. 91, 6650 (2002).Google Scholar
18.Foster, C.M., Li, Z., Grimsditch, M., Chan, S.K., and Lam, D.J., Phys. Rev. B 48, 10160 (1993).CrossRefGoogle Scholar
19.Cho, S.M. and Jang, H.M., Appl. Phys. Lett. 76, 3014 (2000).Google Scholar
20.Dobal, P.S., Majumder, S.B., Bhaskar, S., and Katiyar, R.S., J. Raman Spectrosc. 30, 567 (1999).3.0.CO;2-J>CrossRefGoogle Scholar
21.Meng, J., Zou, G., Ma, Y., Wang, X., and Zhao, M., J. Phys.: Condens. Matter. 6, 6549 (1994).Google Scholar
22.Burns, G. and Scott, B.A., Phys. Rev. Lett. 25, 1191 (1970).Google Scholar
23.Sivasubramanian, V., Murthy, V.R.K., Viswanathan, B., and Sieskind, M., J. Phys.: Condens. Matter. 8, 2447 (1996).Google Scholar
24.Adams, D.M., Metal-Ligand and Related Vibration (Edward Arnold, London, U.K., 1967).Google Scholar
25.Chen, H.Y., Lin, J., Tan, K.L., and Feng, Z.C., Thin Solid Films 289, 59 (1996).Google Scholar
26.Wu, W., Wong, K.H., and Choy, C.L., Thin Solid Films 360, 103 (2000).CrossRefGoogle Scholar