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Structure and thermoelectric properties of binary and Fe-doped iridium silicide thin films

Published online by Cambridge University Press:  31 January 2011

W. Pitschke ,
R. Kurt ,
A. Heinrich ,
J. Schumann ,
H. Grießmann ,
H. Vinzelberg  and
A. T. Burkov
W. Pitschke
Affiliation:
Institute of Solid State and Materials Research Dresden, D-01171 Dresden, Germany
R. Kurt
Affiliation:
Institute of Solid State and Materials Research Dresden, D-01171 Dresden, Germany
A. Heinrich
Affiliation:
Institute of Solid State and Materials Research Dresden, D-01171 Dresden, Germany
J. Schumann
Affiliation:
Institute of Solid State and Materials Research Dresden, D-01171 Dresden, Germany
H. Grießmann
Affiliation:
Institute of Solid State and Materials Research Dresden, D-01171 Dresden, Germany
H. Vinzelberg
Affiliation:
Institute of Solid State and Materials Research Dresden, D-01171 Dresden, Germany
A. T. Burkov
Affiliation:
Department of Physics, University of Ryukyus, Okinawa 903–01, Japan
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Abstract

The structure-formation process and thermoelectric properties of binary and Fe-doped IrxSi1−x (0.30 ≤ x ≤ 0.41) thin films were investigated. The films were prepared by means of physical vapor deposition techniques, in particular by magnetron co-sputtering and electron beam co-evaporation. The amount of Fe dopant varied between 0 and 5 at.%. The phase-formation process depends on the volume fractions of the major components Ir and Si, whereas the small concentrations of dopant did not change the sequence of the crystalline phases formed. On the other hand, the thermoelectric transport properties correlate strongly with both the structure-formation process and the chemical composition of the films. Fe-doped iridium silicide films with useful thermoelectric power factors were successfully obtained by both magnetron co-sputtering and electron beam co-evaporation. A maximum thermoelectric power factor of 8.5 μW/(K2 cm) at 1200 K was observed for evaporated layers with thechemical composition Ir0.35Si0.63Fe0.02.

Type
Articles
Information
Journal of Materials Research , Volume 15 , Issue 3 , March 2000 , pp. 772 - 782
Copyright
Copyright © Materials Research Society 2000

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