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Structures of AlN/VN Superlattices with Different AlN Layer Thicknesses

Published online by Cambridge University Press:  31 January 2011

Quan Li ,
I. W. Kim ,
S. A. Barnett  and
L. D. Marks
Quan Li*
Affiliation:
Department of Physics, The Chinese University of Hong Kong, Shatin, New Territory, Hong Kong
I. W. Kim
Affiliation:
Department of Material Science & Engineering, Northwestern University, Evanston, Illinois 60208
S. A. Barnett
Affiliation:
Department of Material Science & Engineering, Northwestern University, Evanston, Illinois 60208
L. D. Marks
Affiliation:
Department of Material Science & Engineering, Northwestern University, Evanston, Illinois 60208
*
a)Address all correspondence to this author. e-mail: liquan@phy.cuhk.edu.hk
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Extract

AlN/VN superlattices with different periods were studied using x-ray diffraction and transmission electron microscopy (TEM). A phase transformation of the AlN from an epitaxially stabilized rock-salt structure to a hexagonal wurtzite structure was observed for an AlN layer thickness greater than 4 nm. A structural model is proposed on the basis of TEM results for the orientation of the transformed phase. The VN layer grown on top of the hexagonal AlN was observed to be reoriented compared to that in the stabilized B1-AlN/VN. The VN nucleated by taking the w-AlN(002) plane as its (111) plane instead of the (002) plane.

Type
Articles
Information
Journal of Materials Research , Volume 17 , Issue 5 , May 2002 , pp. 1224 - 1231
Copyright
Copyright © Materials Research Society 2002

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