Hostname: page-component-cd9895bd7-jn8rn Total loading time: 0 Render date: 2024-12-30T22:05:19.787Z Has data issue: false hasContentIssue false

Superconductivity of epitaxially grown α-axis YBCO films on SrTiO3 substrate

Published online by Cambridge University Press:  03 March 2011

W. Ito
Affiliation:
Superconductivity Research Laboratory, ISTEC, 10–13 Shinonome 1 chome, Koto-ku, Tokyo 135, Japan
S. Mahajan
Affiliation:
Superconductivity Research Laboratory, ISTEC, 10–13 Shinonome 1 chome, Koto-ku, Tokyo 135, Japan
Y. Yoshida
Affiliation:
Superconductivity Research Laboratory, ISTEC, 10–13 Shinonome 1 chome, Koto-ku, Tokyo 135, Japan
N. Watanabe
Affiliation:
Superconductivity Research Laboratory, ISTEC, 10–13 Shinonome 1 chome, Koto-ku, Tokyo 135, Japan
T. Morishita
Affiliation:
Superconductivity Research Laboratory, ISTEC, 10–13 Shinonome 1 chome, Koto-ku, Tokyo 135, Japan
Get access

Abstract

The a-axis oriented YBa2Cu3Ox (YBCO) films were epitaxially grown on (100) SrTiO3 substrate by dc-100 MHz hybrid plasma sputtering. The films prepared at different temperatures with and without in situ annealing had different superconductivity, which was improved with the degradation of the crystallinity of the films. The Raman spectra for the films were very similar to each other and to that expected for YBa2Cu3O7, in spite of the different superconductivity. This indicates the importance of the symmetry of the Cu–O chains rather than the oxygen content for the superconductivity. In Rutherford backscattering measurements using a 3.05 MeV He2+ ion beam, an increase of dechanneling due to the barium atoms along the film depth was clearly observed only for the most improved superconducting film. This result suggests that the relief of the strain contained in the film is also important for improving the superconductivity in the case of a-axis oriented YBCO films.

Type
Articles
Copyright
Copyright © Materials Research Society 1994

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1Ito, W., Oishi, A., Okayama, S., Yoshida, Y., Homma, N., Morishita, T., Haga, T., and Yamaya, K., Physica C 204, 295 (1993).CrossRefGoogle Scholar
2Ito, W., Oishi, A., Mahajan, S., Yoshida, Y., and Morishita, T. (unpublished).Google Scholar
3Ito, W., Mahajan, S., Okayama, S., Yoshida, Y., and Morishita, T., J. Mater. Res. 9, 1082 (1994).CrossRefGoogle Scholar
4Mahajan, S., Ito, W., Yoshida, Y., and Morishita, T., Physica C 213, 445 (1993).CrossRefGoogle Scholar
5Mukaida, M. and Miyazawa, S., Jpn. J. Appl. Phys. 31, 3317 (1992).CrossRefGoogle Scholar
6Burns, G., Dacol, F. H., Feild, C., and Holtzberg, F., Solid State Commun. 77, 367 (1991).CrossRefGoogle Scholar
7Iliev, M., Thomsen, C., Hadjiev, V., and Cardona, M., Phys. Rev. B 47, 12341 (1993).CrossRefGoogle Scholar
8Sodtke, E. and Münder, H., Appl. Phys. Lett. 60, 1630 (1992).CrossRefGoogle Scholar
9Sodtke, E., Münder, H., and Braginski, A. I., Appl. Phys. Lett. 60, 1630 (1992).CrossRefGoogle Scholar
10Cameron, J. R., Phys. Rev. 90, 839 (1953); or see, for example, the following: Chu, W. K., Mayer, J. W., and Nicolet, M. A., Backscattering Spectrometry (Academic Press, Boston, San Diego, New York, London, Sydney, Tokyo, Toronto, 1978).CrossRefGoogle Scholar
11Rammel, J., Geerk, J., Linker, G., Meyer, O., Wang, R. L., and Wolf, Th., Nucl. Instrum. Methods B64, 174 (1992).Google Scholar
12Li, Q., Meyer, O., Xi, X. X., Geerk, J., and Linker, G., Appl. Phys. Lett. 55, 310 (1989).CrossRefGoogle Scholar