Hostname: page-component-78c5997874-fbnjt Total loading time: 0 Render date: 2024-11-10T05:49:49.289Z Has data issue: false hasContentIssue false
  • English
  • Français

Synthesis and properties of Tl–Ba–Ca–Cu–O superconductors

Published online by Cambridge University Press:  31 January 2011

M. P. Siegal ,
E. L. Venturini ,
B. Morosin  and
T. L. Aselage
M. P. Siegal
Affiliation:
Sandia National Laboratories, Albuquerque, New Mexico 87185–1421
E. L. Venturini
Affiliation:
Sandia National Laboratories, Albuquerque, New Mexico 87185–1421
B. Morosin
Affiliation:
Sandia National Laboratories, Albuquerque, New Mexico 87185–1421
T. L. Aselage
Affiliation:
Sandia National Laboratories, Albuquerque, New Mexico 87185–1421
Get access

Abstract

We review the synthesis methods and properties of single crystal, powder, and thin film TlBaCaCuO high-temperature superconducting (Tl-HTS) materials. With transition temperatures ≥ 100 K for several compounds, Tl-HTS materials present real opportunities for applications above 77 K. Experiments using (1) single crystals: determined precise structural parameters and identified the complex Tl1+–Tl3+ equilibrium model; (2) powders: studied the complex thermodynamic phase diagram; and (3) epitaxial films: studied fundamental properties such as electron pair symmetry and the effect of controlled extrinsic defects on flux pinning strength, as well as providing the large-area surfaces required for device applications.

Type
Articles
Information
Journal of Materials Research , Volume 12 , Issue 11 , November 1997 , pp. 2825 - 2854
Copyright
Copyright © Materials Research Society 1997

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1.Bednörz, J. G. and Müller, K. A., Z. Phys. B 64, 189 (1986).CrossRefGoogle Scholar
2.Kondoh, S., Ando, Y., Onoda, M., and Sato, M., Solid State Commun. 65, 1329 (1988).CrossRefGoogle Scholar
3.Sheng, Z. Z. and Hermann, A. M., Nature 332, 55 (1988).CrossRefGoogle Scholar
4.Sheng, Z. Z., Hermann, A. M., Ali, A. E., Almasan, C., Estrada, J., Datta, T., and Matson, R. J., Phys. Rev. Lett. 60, 937 (1988).CrossRefGoogle Scholar
5.Sheng, Z. Z. and Hermann, A. M., Nature 332, 138 (1988).CrossRefGoogle Scholar
6.Hazen, R. M., Finger, L. W., Angel, R. J., Prewitt, C. T., Ross, N. L., Hadidiacos, C. G., Heaney, P. J., Veblen, D. R., Sheng, Z. Z., Ali, A. E., and Hermann, A. M., Phys. Rev. Lett. 60, 1657 (1988).CrossRefGoogle Scholar
7.Parkin, S. S. P., Lee, V. Y., Engler, E. M., Nazzal, A. I., Huang, T. C., Gorman, G., Savoy, R., and Beyers, R., Phys. Rev. Lett. 60, 2539 (1988).CrossRefGoogle Scholar
8.Ginley, D. S., Venturini, E. L., Kwak, J. F., Baughman, R. J., Carr, M. J., Hlava, P. F., Schirber, J. E., and Morosin, B., Physica C 152, 217 (1988).CrossRefGoogle Scholar
9.Ihara, H., Sugise, R., Shimomura, T., Hirabayashi, M., Terada, N., Jo, M., Hayashi, K., Tokumoto, M., Murata, K., and Ohashi, S., in Advances in Superconductivity, Proc. of the 1st International Symposium on Superconductivity, edited by Kitazawa, and Ishiguro, (Springer-Verlag, Tokyo, 1988), p. 793.Google Scholar
10.Ihara, H., Sugise, R., Hayashi, K., Terada, N., Jo, M., Hirabayashi, M., Negishi, A., Atoda, N., Oyanagi, H., Shimomura, T., and Ohashi, S., Phys. Rev. B 38, 11952 (1988).CrossRefGoogle Scholar
11.Parkin, S. S. P., Lee, V. Y., Nazzal, A. I., Savoy, R., Beyers, R., and Placa, S. J. La, Phys. Rev. Lett. 61, 750 (1988).CrossRefGoogle Scholar
12.Sugise, R., Hirabayashi, M., Terada, N., Jo, M., Shimomura, T., and Ihara, H., Jpn. J. Appl. Phys. 27, L1709 (1988).CrossRefGoogle Scholar
13.Morosin, B., Ginley, D. S., Hlava, P. F., Carr, M. J., Baughman, R. J., Schirber, J. E., Venturini, E. L. and Kwak, J. F., Physica C 152, 413 (1988).CrossRefGoogle Scholar
14.Hervieu, M., Maignan, A., Martin, C., Michel, C., Provost, J., and Raveau, B., J. Solid State Chem. 75, 212 (1988).CrossRefGoogle Scholar
15.Morosin, B., Baughman, R. J., Ginley, D. S., Schirber, J. E., and Venturini, E. L., Physica C, 161, 115 (1990), and references therein.CrossRefGoogle Scholar
16.Morosin, B., Ginley, D. S., Venturini, E. L., Baughman, R. J., and Tigges, C. P., Physica C 172, 413 (1991).CrossRefGoogle Scholar
17.Morosin, B., Venturini, E. L., and Ginley, D. S., Physica C 183, 90 (1991).CrossRefGoogle Scholar
18.Ginley, D. S., Morosin, B., Baughman, R. J., Venturini, E. L., Schirber, J. E., and Kwak, J. F., J. Cryst. Growth, 91, 456 (1988).CrossRefGoogle Scholar
19.Torardi, C. C., Subramanian, M. A., Calabrese, J. C., Gopalakrishnan, J., McCarron, E. M., Morrisey, K. J., Askew, T. R., Flippen, R. B., Chowdry, U., and Sleight, A. W., Phys. Rev. B 38, 225 (1988).CrossRefGoogle Scholar
20.Kotani, T., Kaneko, T., Takei, H., and Tada, K., Jpn. J. Appl. Phys. 28, L1378 (1989).CrossRefGoogle Scholar
21.Kolesnikov, N. N., Korotkov, V. E., Kulakov, M. P., Lagvenov, G. A., Molchanov, V. N., Muradyan, L. A., Simonov, V. I., Tamazyan, R. A., Shibaeva, R. P., and Shchegolev, I. F., Physica C 162–164, 1663 (1989).CrossRefGoogle Scholar
22.Subramanian, M. A., Calabrese, J. C., Torardi, C. C., Gopalakrishnan, J., Askew, T. R., Flippen, R. B., Morrissey, K. J., Chowdhry, U., and Sleight, A. W., Nature 332, 420 (1988).CrossRefGoogle Scholar
23.Morosin, B., Ginley, D. S., Venturini, E. L., Hlava, P. F., Baughman, R. J., Kwak, J. F., and Schirber, J. E., Physica C 152, 223 (1988). The paper reports the composition as Tl-5526 from wavelength dispersive x-ray spectral analysis, but the crystals were actually Tl-2212.CrossRefGoogle Scholar
24.Onoda, M., Kondoh, S., Fukuda, K., and Sato, M., Jpn. J. Appl. Phys. 27, L1234 (1988).CrossRefGoogle Scholar
25.Bukowski, E. D. and Ginsberg, D. M., J. Low Temp. Phys. 77, 285 (1989).CrossRefGoogle Scholar
26.Guillot, M., Tholence, J. L., Laborde, O., Potel, M., Gougeon, P., Noël, H., and Levet, J. C., Physica C 162–164, 361 (1989).CrossRefGoogle Scholar
27.Morosin, B., Ginley, D. S., Schirber, J. E., and Venturini, E. L., Physica C 156, 587 (1988).CrossRefGoogle Scholar
28.Laborde, O., Monceau, P., Potel, M., Padiou, J., Gougeon, P., Levet, J. C., and Noël, H., Physica C 162–164, 1619 (1989).CrossRefGoogle Scholar
29.Torardi, C. C., Subramanian, M. A., Calabrese, J. C., Gopalakrishnan, J., Morrissey, K. J., Askew, T. R., Flippen, R. B., Chowdry, U., and Sleight, A. W., Science 240, 631 (1988).CrossRefGoogle Scholar
30.Liu, J. Z., Vandervoort, K. G., Claus, H., Crabtree, G. W., and Lam, D. J., Physica C 156, 256 (1988).CrossRefGoogle Scholar
31.Kajitani, T., Hiraga, K., Nakajima, S., Kikuchi, M., Syono, Y., and Kabuto, C., Physica C 161, 483 (1989).CrossRefGoogle Scholar
32.Togano, K., Kumakura, H., Mukaida, H., Kawaguchi, K., and Nakao, M., Jpn. J. Appl. Phys. 28, L907 (1989).CrossRefGoogle Scholar
33.Paranthaman, M., Duan, H. M., and Hermann, A. M., in Thallium-Based High-Temperature Superconductors, edited by Hermann, A. M. and Yakhmi, J. V. (Marcel Dekker, New York, 1994), Chap. 8.Google Scholar
34.Venturini, E. L., Tigges, C. P., Morosin, B., Barbour, J. C., Mitchell, M. A., and Ginley, D. S., J. Cryst. Growth 109, 441 (1991).CrossRefGoogle Scholar
35.McCarty, K. F., Ginley, D. S., Boehme, D. R., Baughman, R. J., and Morosin, B., Solid State Comm. 68, 77 (1988).CrossRefGoogle Scholar
36.McCarty, K. F., Ginley, D. S., Boehme, D. R., Baughman, R. J., Venturini, E. L., and Morosin, B., Physica C 156, 119 (1988).CrossRefGoogle Scholar
37.McCarty, K. F., Morosin, B., Ginley, D. S., and Boehme, D. R., Physica C 157, 135 (1989).CrossRefGoogle Scholar
38.Subramanian, M. A., Parise, J. B., Calabrese, J. C., Torardi, C. C., Gopalakrishnan, J., and Sleight, A. W., J. Solid State Chem. 77, 192 (1988).CrossRefGoogle Scholar
39.Cox, D. E., Torardi, C. C., Subramanian, M. A., Gopalakrishnan, J., and Sleight, A. W., Phys. Rev. B 38, 6624 (1988).CrossRefGoogle Scholar
40.Kolesnikov, N. N., Korotkov, V. E., Kulakov, M. P., Lagvenov, G. A., Molchanov, V. N., Muradyan, L. A., Simonov, V. I., Tamazyan, R. A., Shibaeva, R. P., and Shchegolev, I. F., Physica C 162–164, 1663 (1989).CrossRefGoogle Scholar
41.Sinclair, D. C., Aranda, M. A. G., Attfield, P., and Rodriguez-Carvajal, J., Physica C 223, 283 (1994).Google Scholar
42.Aranda, M. A. C., Adv. Mater. 6, 905 (1994).CrossRefGoogle Scholar
43.Sequeira, A., Rajagopal, H., Gopalakrishnan, I. K., Sastry, P. V. P. S. S., Phatak, G. M., Yakhmi, J. V., and Iyer, R. M., Physica C 156, 599 (1988).CrossRefGoogle Scholar
44.Suzuki, T., Nagoshi, M., Fukuda, Y., Syono, Y., Kikuchi, M., Kobayashi, N., and Tachiki, M., Phys. Rev. B 40, 5184 (1989).CrossRefGoogle Scholar
45.Jung, D., Whangbo, M-H., Herron, N., and Torardi, C. C., Physica C 160, 381 (1989).CrossRefGoogle Scholar
46.Studer, F., Bourgault, D., Martin, C., Retoux, R., Michel, C., Raveau, B., Dartyge, E., and Fontaine, A., Physica C 159, 609 (1989).CrossRefGoogle Scholar
47.Gopalakrishnan, I. K., Sastry, P. V. P. S. S., Rajagopal, H., Sequeira, A., Yakhmi, J. V., and Iyer, R. M., Physica C 159, 811 (1989).CrossRefGoogle Scholar
48.Suzuki, T., Nagoshi, M., Fukuda, Y., Nakajima, S., Kikuchi, M., Syono, Y., and Tachiki, M., Physica C 162–164, 1387 (1989).CrossRefGoogle Scholar
49.Nakajima, S., Kikuchi, M., Oku, T., Kobayashi, N., Suzuki, T., Nagase, K., Hiraga, K., Muto, Y., and Syono, Y., Physica C 160, 458 (1989).CrossRefGoogle Scholar
50.Paranthaman, M., Manthiram, A., and Goodenough, J. B., J. Solid State Chem. 87, 479 (1990).CrossRefGoogle Scholar
51.Manthiram, A. and Goodenough, J. B., Physica C 171, 135 (1990).CrossRefGoogle Scholar
52.Shimakawa, Y., Kubo, Y., Manako, T., Igarashi, H., Izumi, F., and Asano, H., Phys. Rev. B 42, 10165 (1990).CrossRefGoogle Scholar
53.Morosin, B., Venturini, E. L., Newcomer, P. P., Missert, N., and Padilla, R. R., unpublished.Google Scholar
54.Venturini, E. L., Morosin, B., Ginley, D. S., Kwak, J. F., Schirber, J. E., Baughman, R. J., and Graham, R. A., in High Temperature Superconductors: Relationship between Properties, Structure, and Solid-State Chemistry, edited by Jorgensen, J. R., Kitazawa, K., Tarascon, J. M., Thompson, M. S., and Torrance, J. B. (Mater. Res. Soc. Symp. Proc. 156, Pittsburgh, PA, 1989), p. 239.Google Scholar
55.Morosin, B., Venturini, E. L., and Ginley, D. S., Physica C 175, 241 (1991), and references therein.CrossRefGoogle Scholar
56.Morosin, B., Venturini, E. L., Dunn, R. G., Schirber, J. E., and Newcomer, P. P., Bull. Am. Phys. Soc. 39, 878 (1994).Google Scholar
57.Morosin, B., Dunn, R. G., Venturini, E. L., and Newcomer, P. P., Physica C, unpublished.Google Scholar
58.Morosin, B. and Venturini, E. L., Phys. Rev. B 46, 510 (1992).CrossRefGoogle Scholar
59.Moulton, N. E., Wolf, S. A., Skelton, E. F., Liebenberg, D. H., Vanderah, T. A., Hermann, A. M., and Duan, H. M., Phys. Rev B 44, 12632 (1991).CrossRefGoogle Scholar
60.Mori, N., Takahashi, H., Shimakawa, Y., Manako, T., and Kubo, Y., J. Phys. Soc. Jpn. 59, 3839 (1990).CrossRefGoogle Scholar
61.Allegrier, A., Sieburger, R., Grossner, H., Diedrichs, J., Neumair, H., Keith, W., Müller, P., and Schilling, J. S., Physica C, 162–164, 741 (1989).CrossRefGoogle Scholar
62.Jayaraman, A., Dernier, P. D., and Longinotti, L. D., High Temp. High Press. 7, 1 (1975), and references therein.Google Scholar
63.Sieberg, R. and Schilling, J. S., Physica C 173, 403 (1991).CrossRefGoogle Scholar
64.Holstein, W. L., J. Phys. Chem. 97, 4224 (1993).CrossRefGoogle Scholar
65.Cubicciotti, D. and Keneshea, F. J., J. Phys. Chem. 71, 808 (1967).CrossRefGoogle Scholar
66.Aselage, T. L., Venturini, E. L., and Van Deusen, S. B., J. Appl. Phys. 75, 1023 (1994).CrossRefGoogle Scholar
67.Aselage, T. L., Voigt, J. A., and Keefer, K. D., J. Am. Ceram. Soc. 73, 3345 (1990).CrossRefGoogle Scholar
68.Siegrist, T., Zahurak, S. M., Murphy, D. W., and Roth, R. S., Nature 334, 231 (1988).CrossRefGoogle Scholar
69.Burns, G., Crawford, M. K., Daco, F. H., McCarron, E. M. III, and Shaw, T. M., Phys. Rev. B 40, 6717 (1989).CrossRefGoogle Scholar
70.Sugise, R. and Ihara, H., Jpn. J. Appl. Phys. 28, 334 (1989).CrossRefGoogle Scholar
71.Bunker, B., Lamppa, D. L., and Voigt, J. A., U. S. Patent No. 4839339 (1989).Google Scholar
72.Voigt, J. A., Bunker, B. C., Hammetter, W. F., Ginley, D. S., Venturini, E. L., Kwak, J. F., and Lamppa, D. L., in High-Temperature Superconducting Compounds: Processing and Related Properties, edited by Whang, S. H. and DasGupta, A. (The Minerals, Metals, and Materials Society, Warrendale, PA, 1991), p. 291.Google Scholar
73.Lanham, M., James, T. W., Eddy, M., Lange, F. F., and Clarke, D. R., Appl. Phys. Lett. 62, 3028 (1993).CrossRefGoogle Scholar
74.Aselage, T. L., Venturini, E. L., Van Deusen, S. B., Headley, T. J., Eatough, M. O., and Voigt, J. A., Physica C 203, 25 (1992).CrossRefGoogle Scholar
75.DeLuca, J. A., Garbauskas, M. F., Bolon, R. B., McMullen, J. G., Balz, W. E., and Karas, P. L., J. Mater. Res. 6, 1415 (1991).CrossRefGoogle Scholar
76.Aselage, T. L., Venturini, E. L., Voigt, J. A., and Miller, D. J., J. Mater. Res. 11, 1635 (1996).CrossRefGoogle Scholar
77.Ahn, B. T., Lee, W. Y., and Beyers, R., Appl. Phys. Lett. 60, 2150 (1992).CrossRefGoogle Scholar
78.Lee, W. Y., Garrison, S. M., Kawasaki, M., Venturini, E. L., Ahn, B. T., Beyers, R., Salem, J., Savoy, R., and Vasquez, J., Appl. Phys. Lett. 60, 772 (1992).CrossRefGoogle Scholar
79.Kim, D. H., Gray, K. E., Kampwirth, R. T., Smith, J. C., Richeson, D. S., Marks, T. J., Kang, J. H., Talvacchio, J., and Eddy, M., Physica C 177, 431 (1991).CrossRefGoogle Scholar
80.Nabatame, T., Saito, Y., Aihara, K., Kamo, T., and Matsuda, S. P., Jpn. J. Appl. Phys. 32, Pt. 2, L484 (1993).CrossRefGoogle Scholar
81.DeLuca, J. A., Karas, P. L., Tkaczyk, J. E., Bednarczyk, P. J., Garbauskas, M. F., Briant, C. L., and Sorensen, D. B., Physica C 205, 21 (1993).CrossRefGoogle Scholar
82.Doi, T., Okada, M., Soeta, A., Yuasa, T., Aihara, K., Kamo, T., and Matsuda, S. P., Physica C 183, 67 (1991).CrossRefGoogle Scholar
83.Kamo, T., Doi, T., Soeta, A., Yuasa, T., Inoue, N., Aihara, K., and Matsuda, S-P., Appl. Phys. Lett. 59, 3186 (1991).Google Scholar
84.Yuasa, T., Doi, T., Soeta, A., Inoue, N., Aihara, K., Kamo, T., and Matsuda, S. P., Jpn. J. Appl. Phys. 31, Pt. 2, L1176 (1992).CrossRefGoogle Scholar
85.Aselage, T. L. and Eatough, M. O., Powder Diffraction 7, 115 (1992).CrossRefGoogle Scholar
86.Siegal, M. P., Missert, N., Venturini, E. L., Newcomer, P. P., Dominguez, F., and Dunn, R., IEEE Trans. on Appl. Supercond. 5, 1343 (1995).CrossRefGoogle Scholar
87.Siegal, M. P., Overmyer, D. L., Venturini, E. L., Newcomer, P. P., Dunn, R., Dominguez, F., Padilla, R. R., and Sokolowski, S. S., IEEE Trans. on Supercond. 7, 1881 (1997).CrossRefGoogle Scholar
88.Morgan, P. E. D., Piche, J. D., and Housley, R. M., Physica C 191, 179 (1992).CrossRefGoogle Scholar
89.Morgan, P. E. D., Housley, R. M., Porter, J. R., and Ratto, J. J., Physica C 176, 279 (1991).CrossRefGoogle Scholar
90.Ratto, J. J., Porter, F. R., Housley, R. M., and Morgan, P. E. D., Jpn. J. Appl. Phys. 29, 244 (1990).CrossRefGoogle Scholar
91.Aselage, T. L., Venturini, E. L., Voigt, J. A., Lamppa, D. L., and Van Deusen, S. B., J. Mater. Res. 9, 2470 (1994).CrossRefGoogle Scholar
92.Myers, K. E., Face, D. W., Kountz, K. J., and Nestlerode, J. P., Appl. Phys. Lett. 65, 490 (1994).CrossRefGoogle Scholar
93.Nakao, M., Yuasa, R., Nemoto, M., Kuwahara, H., Mukaida, H., and Mizukami, A., Jpn. J. Appl. Phys., 27, L849 (1988).CrossRefGoogle Scholar
94.Kang, J. H., Kampwirth, R. T., and Gray, K. E., Phys. Lett. A 131, 208 (1988).CrossRefGoogle Scholar
95.Ginley, D. S., Kwak, J. F., Hellmer, R. P., Baughman, R. J., Venturini, E. L., and Morosin, B., Appl. Phys. Lett. 53, 406 (1988).CrossRefGoogle Scholar
96.Shih, I. and Qiu, C. X., Appl. Phys. Lett. 53, 523 (1988).CrossRefGoogle Scholar
97.Lee, W. Y., Lee, V. Y., Salem, J., Huang, T. C., Savoy, R., Bullock, D. C., and Parkin, S. S. P., Appl. Phys. Lett. 53, 329 (1988).CrossRefGoogle Scholar
98.Ginley, D. S., Kwak, J. F., Hellmer, R. P., Baughman, R. J., Venturini, E. L., Mitchell, M. A., and Morosin, B., Physica C 156, 592 (1988).CrossRefGoogle Scholar
99.Ichikawa, Y., Adachi, H., Setsune, K., Hatta, S-I., Hirochi, K., and Wasa, K., Appl. Phys. Lett. 53, 919 (1988).CrossRefGoogle Scholar
100.Hong, M., Liou, S. H., Bacon, D. D., Grader, G. S., Kwo, J., Kortan, A. R., and Davidson, B. A., Appl. Phys. Lett. 53, 2102 (1988).CrossRefGoogle Scholar
101.Qiu, C. X. and Shih, I., Appl. Phys. Lett. 53, 1122 (1988).CrossRefGoogle Scholar
102.Shah, S. I., Herron, N., Fincher, C. R., and Holstein, W. L., Appl. Phys. Lett. 56, 782 (1990).CrossRefGoogle Scholar
103.Manzel, M., Bruchlos, H., Bruchlos, G., Eick, Th., Steinbess, E., and Illgen, L., Phys. Status Solidi (a) 128, 175 (1991).CrossRefGoogle Scholar
104.Liou, S. H., Chan, V. K., Foong, F., Lee, W. Y., Gou, Y. S., and Uen, T. M., IEEE Trans. Magn. 27, 1227 (1991).CrossRefGoogle Scholar
105.Coudrier, L., Mercey, B., and Murray, H., Supercond. Sci. Technol. 6, 119 (1993).CrossRefGoogle Scholar
106.Holstein, W. L., Parisi, L. A., Kountz, D. J., Wilker, C., Matthews, A. L., Arendt, P. N., and Taber, R. C., IEEE Trans. Magn. 27, 1568 (1991).CrossRefGoogle Scholar
107.Chrzanowski, J., Burany, S. M., Curzon, A. E., Irwin, J. C., Heinrich, B., Fortier, N., and Cragg, A., Physica C 207, 25 (1993).CrossRefGoogle Scholar
108.Liou, S. H., Aylesworth, K. D., Ianno, N. J., Hohs, B., Thompson, D., Meyer, D., Woollam, J. A., and Barry, C., Appl. Phys. Lett. 54, 760 (1989).CrossRefGoogle Scholar
109.Johs, B., Thompson, D., Ianno, N. J., Woollam, J. A., Liou, S. H., Hermann, A. M., Sheng, Z. Z., Kiehl, W., Shams, Q., Fei, X., Sheng, L., and Liu, Y. H., Appl. Phys. Lett. 54, 1810 (1989).CrossRefGoogle Scholar
110.Piehler, A., Low, R., Betz, J., Schonberger, R., and Renk, K. F., J. Appl. Phys. 74, 6437 (1993).CrossRefGoogle Scholar
111.Michael, P. C., Johansson, L-G., Bengtsson, L., Claeson, T., Ivanov, Z. G., Olsson, E., Berastegui, P., and Stepantsov, E., Physica C 235–240, 717 (1994).CrossRefGoogle Scholar
112.Chrzanowski, J., Meng-Burany, S., Xing, W. B., Curzon, A. E., Irwin, J. C., Heinrich, B., Cragg, R. A., Fortier, N., Habib, F., Angus, V., Anderson, G., and Fife, A. A., Supercond. Sci. Technol. 9, 113 (1996).CrossRefGoogle Scholar
113.Richeson, D. S., Tonge, L. M., Zhao, J., Zhang, J., Marcy, H. O., Marks, T. J., Wessels, B. W., and Kannewurf, C. R., Appl. Phys. Lett. 54, 2154 (1989).CrossRefGoogle Scholar
114.Zhang, K., Boyd, E. P., Kwak, B. S., Wright, A. C., and Erbil, A., Appl. Phys. Lett. 55, 1258 (1989).CrossRefGoogle Scholar
115.Richeson, D. S., Tonge, L. M., Wang, X. K., Marcy, H. O., Marks, T. J., Ketterson, J. B., Chang, R. P. H., and Kannewurf, C. R., Appl. Phys. Lett. 55, 2778 (1989).CrossRefGoogle Scholar
116.Hamaguchi, N., Gardiner, R., Kirlin, P. S., Dye, R., Hubbard, K. M., and Muenchausen, R. E., Appl. Phys. Lett. 57, 2136 (1990).CrossRefGoogle Scholar
117.Malandrino, G., Richeson, D. S., Marks, T. J., DeGroot, D. C., Schindler, J. L., and Kannewurf, C. R., Appl. Phys. Lett. 58, 182 (1991).CrossRefGoogle Scholar
118.Ladd, J. A., Collins, B. T., Matey, J. R., Zhao, J., and Norris, P., Appl. Phys. Lett. 59, 1368 (1991).CrossRefGoogle Scholar
119.Hinds, B. J., Schulz, D. L., Neumayer, D. A., Han, B., Marks, T. J., Wang, Y. Y., Dravid, V. P., Schindler, J. L., Hogan, T. P., and Kannewurf, C. R., Appl. Phys. Lett. 65, 231 (1994).CrossRefGoogle Scholar
120.Zeng, L., Zhao, Z., Zhang, L., Chen, H., Qian, Z., and Wu, D., Appl. Phys. Lett. 56, 1573 (1990).CrossRefGoogle Scholar
121.Olson, W. L., Eddy, M. M., James, T. W., Hammond, R. B., Gruner, G., and Drabeck, L., Appl. Phys. Lett. 55, 188 (1989).CrossRefGoogle Scholar
122.Kordas, G. and Teepe, M. R., Appl. Phys. Lett. 57, 1461 (1990).CrossRefGoogle Scholar
123.Bhattacharya, R. N., Parilla, P. A., Mason, A., Roybal, L. L., Ahrenkiel, R. K., Noufi, R., Hellmer, R. P., Kwak, J. F., and Ginley, D. S., J. Mater. Res. 6, 1389 (1991).CrossRefGoogle Scholar
124.Collins, B. T., Ladd, J. A., and Matey, J. R., J. Appl. Phys. 70, 2458 (1991).CrossRefGoogle Scholar
125.Aselage, T. L., Voigt, J. A., Venturini, E. L., Hammetter, W. F., Van Deusen, S. B., Lamppa, D. L., Tissot, R. G., Eatough, M. O., and Keefer, K. D., in Ceramic Transactions, edited by Nair, K. M., Balachandran, U., Y-M., Chiang, and Bhalla, A. S. (American Ceramic Society, Westerville, OH 1991), Vol. 18, p. 9.Google Scholar
126.Naziripour, A., Duan, H. M., Tello, R., Tigges, C. P., Ginley, D. S., Bhattacharya, R., Blaugher, R., and Hermann, A. M., Physica C 200, 334 (1992).CrossRefGoogle Scholar
127.Kwak, J. F., Venturini, E. L., Baughman, R. J., Morosin, B., and Ginley, D. S., Cryogenics 29, 291 (1988).CrossRefGoogle Scholar
128.Lee, W. Y., Garrison, S. M., Kawasaki, M., Venturini, E. L., Ahn, B. T., Beyers, R., Salem, J., Savoy, R., and Vazquez, J., Appl. Phys. Lett. 60, 772 (1992).CrossRefGoogle Scholar
129.Manzel, M., Bruchlos, H., Steinbeib, E., Eick, T., Klinger, M., Fuchs, J., and Kley, B., Physica C 201, 337 (1992).CrossRefGoogle Scholar
130.Manzel, M., Bruchlos, H., Huber, S., Kuhn, M., Keppler, A., and Hinken, J. H., Physica C 235–240, 713 (1994).CrossRefGoogle Scholar
131.Huber, S., Manzel, M., Bruchlos, H., Hensen, S., and Müller, G., Physica C 244, 337 (1995).CrossRefGoogle Scholar
132.Holstein, W. L., Parisi, L. A., Wilker, C., and Flippen, R. B., Appl. Phys. Lett. 60, 2014 (1992).CrossRefGoogle Scholar
133.Hammond, R. B., Negrete, G. V., Bourne, L. C., Strother, D. D., Cardona, A. H., and Eddy, M. M., Appl. Phys. Lett. 57, 825 (1990).CrossRefGoogle Scholar
134.Yan, S. L., Fang, L., Song, Q. X., Yan, J., Zhu, Y. P., Chen, J. H., and Zhang, S. B., Appl. Phys. Lett. 63, 1845 (1993).CrossRefGoogle Scholar
135.Yan, S. L., Fang, L., Si, M. S., Cao, H. L., Song, Q. X., Yan, Y., Zhou, X. D., and Hao, J. M., Supercond. Sci. Technol. 7, 681 (1994).CrossRefGoogle Scholar
136.Holstein, W. L., Parisi, L. A., Flippen, R. B., and Swartzfager, D. G., J. Mater. Res. 8, 962 (1993).CrossRefGoogle Scholar
137.Ginley, D. S., Kwak, J. F., Venturini, E. L., Morosin, B., and Baughman, R. J., Physica C 160, 42 (1989).CrossRefGoogle Scholar
138.Geller, S. and Bala, V. B., Acta Crystallogr. 9, 1019 (1956).CrossRefGoogle Scholar
139.Tang, Y. Q., Chen, K. Y., Afonso, S., Xu, X. L., Xiong, Q., Salamo, G., Chan, F. T., Guo, R., and Bhalla, A., J. Appl. Phys. 78, 6846 (1995).CrossRefGoogle Scholar
140.O'Connor, J. D., Dew-Hughes, D., Bramley, A. P., Grovenor, C. R. M., Goringe, M. J., and Morley, S. M., Appl. Phys. Lett. 69, 115 (1996).CrossRefGoogle Scholar
141.Holstein, W. L. and Parisi, L. A., J. Mater. Res. 11, 1349 (1996).CrossRefGoogle Scholar
142.Kaneko, T., Yamauchi, H., and Tanaka, S., Physica C 178, 377 (1991).CrossRefGoogle Scholar
143.Liu, R. S., Tallon, J. L., and Edwards, P. P., Physica C 182, 119 (1991).CrossRefGoogle Scholar
144.Kaneko, T., Hamada, K., Adachi, S., and Yamauchi, H., Physica C 197, 385 (1992).CrossRefGoogle Scholar
145.Tsai, M-J., Wu, S. F., Huang, Y. T. and Lu, S. W., Physica C 198, 125 (1992).CrossRefGoogle Scholar
146.Ogborne, D. M., Weller, M. T., and Lanchester, P. C., Physica C 200, 167 (1992).CrossRefGoogle Scholar
147.Liu, R. S., Hervieu, M., Michel, C., Raveau, B., and Edwards, P. P., J. Solid State Chem. 100, 186 (1992).CrossRefGoogle Scholar
148.Nemoto, M., Yoshikawa, S., Yuasa, R., Yoshida, I., Yoshisato, Y., and Maekawa, S., Jpn. J. Appl. Phys. 35, 1720 (1996).CrossRefGoogle Scholar
149.Carlson, D. J., Siegal, M. P., Phillips, J. M., Tiefel, T. H., and Marshall, J. H., J. Mater. Res. 5, 2797 (1990).CrossRefGoogle Scholar
150.Juang, J. Y., Horng, J. H., Lin, H. C., Wang, S. J., Fu, C. M., Wu, K. H., Uen, T.M., and Gou, Y. S., IEEE Trans. Appl. Supercond. 5, 1689 (1995).CrossRefGoogle Scholar
151.Siegal, M. P., Venturini, E. L., Newcomer, P. P., Overmyer, D. L., Dominguez, F., and Dunn, R., J. Appl. Phys. 78, 7186 (1995).CrossRefGoogle Scholar
152.Pluym, T. C., Muenchausen, R. E., Arendt, P. N., Wu, X. D., Mueller, F.M., Campbell, I. H., Jia, Q. X., Hawley, M. E., Peterson, E. J., and Tiwari, P., IEEE Trans. Appl. Supercond. 5, 1339 (1995).CrossRefGoogle Scholar
153.Venturini, E. L., Voigt, J. A., Lamppa, D. L., Aselage, T. L., and Roth, E. P., IEEE Trans. Appl. Supercond. 5, 1966 (1995).CrossRefGoogle Scholar
154.Bhattacharya, R. N., Duda, A., Ginley, D. S., DeLuca, J. A., Ren, Z. F., Wang, C. A., and Wang, J. H., Physica C 229, 145 (1994).CrossRefGoogle Scholar
155.Schulz, D. L., Parilla, P. A., Ginley, D. S., Voigt, J. A., and Roth, E. P., Appl. Phys. Lett. 65, 2472 (1994).CrossRefGoogle Scholar
156.Parilla, P. A., Schulz, D. L., Bhattacharya, R., Blaugher, R. D., Ginley, D. S., Voigt, J. A., and Roth, E. P., IEEE Trans. Appl. Supercond. 5, 1958 (1995).CrossRefGoogle Scholar
157.Schulz, D. L., Parilla, P. A., Ginley, D. S., Voigt, J. A., Roth, E. P., and Venturini, E. L., IEEE Trans. Appl. Supercond. 5, 1962 (1995).CrossRefGoogle Scholar
158.Kroeger, D. M., Goyal, A., Specht, E. D., Wang, Z. L., Tkaczyk, J. E., Sutliff, J. A., and DeLuca, J. A., Appl. Phys. Lett. 64, 106 (1994).CrossRefGoogle Scholar
159.Specht, E. D., Goyal, A., Kroeger, D. M., DeLuca, J. A., Tkaczyk, J. E., Briant, C. L., and Sutliff, J. A., Physica C 242, 164 (1995).CrossRefGoogle Scholar
160.Tkaczyk, J. E., Sutliff, J. A., DeLuca, J. A., Bednarczyk, P. J., Briant, C. L., Wang, Z. L., and Goyal, A., J. Mater. Res. 10, 2203 (1995).CrossRefGoogle Scholar
161.Goyal, A., Specht, E. D., Kroeger, D. M., Tkacyzk, J. E., Briant, C. L., and DeLuca, J. A., IEEE Trans. Appl. Supercond. 5, 1950 (1995).CrossRefGoogle Scholar
162.Goyal, A., Specht, E. D., Kroeger, D. M., Tkacyzk, J. E., Briant, C. L., and DeLuca, J. A., Appl. Phys. Lett. 67, 2563 (1995).CrossRefGoogle Scholar
163.Goyal, A., Paranthaman, M., He, Q., List, F. A., Specht, E. D., Christen, D. K., Kroeger, D. M., Tkacyzk, J. E., and Haldar, P., IEEE Trans. Appl. Supercond. 5, 1405 (1995).CrossRefGoogle Scholar
164.Ren, Z. F., Wang, C. A., and Wang, J. H., Appl. Phys. Lett. 65, 237 (1994).CrossRefGoogle Scholar
165.Siegal, M. P., Venturini, E. L., Newcomer, P. P., Morosin, B., Overmyer, D. L., Dominguez, F., and Dunn, R., Appl. Phys. Lett. 67, 3966 (1995).CrossRefGoogle Scholar
166.Siegal, M. P., Overmyer, D. L., Dominguez, F., Venturini, E. L., Dunn, R., Newcomer, P. P., and Myers, K. E., presentation at the 1996 Spring MRS Meeting, San Francisco, CA.Google Scholar
167.Siegal, M. P., Overmyer, D. L., and Dominguez, F., unpublished.Google Scholar
168.Tsuei, C. C., Kirtley, J. R., Rupp, M., Sun, J. Z., Gupta, A., Ketchen, M. B., Wang, C. A., Ren, Z. F., Wang, J. H., and Bhushan, M., Science 271, 329 (1996), and references therein.CrossRefGoogle Scholar
169.Cooper, L. N., Phys. Rev. 104, 1189 (1956).CrossRefGoogle Scholar
170.Tsuei, C. C., Kirtley, J. R., Chi, C. C., Yujahnes, L. S., Gupta, A., Shaw, T., Sun, J. Z., and Ketchen, M. B., Phys. Rev. B 73, 593 (1994).Google Scholar
171.Wang, C. A., Ren, Z. F., Wang, J. H., Petrov, D. K., Naughton, M. J., Yu, W. Y., and Petrou, A., Physica C 262, 98 (1996).CrossRefGoogle Scholar
172.Ren, Z. F., Wang, J. H., and Miller, D. J., Appl. Phys. Lett. 69, 1798 (1996).CrossRefGoogle Scholar
173.Sigrist, M. and Rice, T. M., J. Phys. Soc. Jpn. 61, 4283 (1992).CrossRefGoogle Scholar
174.Clem, J. R., Physica C 162–164, 1137 (1989).CrossRefGoogle Scholar
175.Farrell, D. E., Williams, C. M., Wolf, S. A., Bansal, N. P., and Kogan, V. G., Phys. Rev. Lett. 61, 2805 (1988).CrossRefGoogle Scholar
176.Farrell, D. E., Bonham, S., Foster, J., Chang, Y. C., Jiang, P. Z., Vandervoort, K. G., Lam, D. J., and Kogan, V. G., Phys. Rev. Lett. 63, 782 (1989).CrossRefGoogle Scholar
177.Gray, K. E., Kampwirth, R. T., and Farrell, D. E., Phys. Rev. B 41, 819 (1990).CrossRefGoogle Scholar
178.Farrell, D. E., Beck, R. G., Booth, M. F., Allen, C. J., Bukowski, E. D., and Ginsberg, D. M., Phys. Rev. B 42, 6758 (1990).CrossRefGoogle Scholar
179.Kang, J. H., Gray, K. E., Kampwirth, R. T., and Day, D. W., Appl. Phys. Lett. 53, 2560 (1988).CrossRefGoogle Scholar
180.Duan, H. M., Kiehl, W., Dong, C., Cordes, A. W., Saeed, M. J., Viar, D. L., and Hermann, A. M., Phys. Rev. B 43, 12925 (1991).CrossRefGoogle Scholar
181.Tigges, C. P., Venturini, E. L., Kwak, J. F., Morosin, B., Baughman, R. J., and Ginley, D. S., Appl. Phys. Lett. 57, 517 (1990).CrossRefGoogle Scholar
182.Thompson, J. R., Christen, D. K., Deeds, H. A., Kim, Y. C., Brynestad, J., Sekula, S. T., and Budai, J., Phys. Rev. B 41, 7293 (1990).CrossRefGoogle Scholar
183.Thompson, J. R., Christen, D. K., and Ossandon, J. G., Physica B 194–196, 1557 (1994).CrossRefGoogle Scholar
184.Maignan, A., Martin, C., Hardy, V., Simon, Ch., Hervieu, M., and Raveau, B., Physica C 219, 407 (1994).CrossRefGoogle Scholar
185.Schilling, A., Hulliger, F., and Ott, H. R., Z. Phys. B 82, 9 (1991).CrossRefGoogle Scholar
186.Thompson, J. R., Ossandon, J. G., Christen, D. K., Chakoumakos, B. C., Sun, Y. R., Paranthaman, M., and Brynestad, J., Phys. Rev. B 48, 14031 (1993).CrossRefGoogle Scholar
187.Wahl, A., Maignan, A., Hardy, V., Provost, J., Ch. Simon, and Raveau, B., Physica C 244, 341 (1995).CrossRefGoogle Scholar
188.Clem, J. R., Phys. Rev. B 43, 7837 (1991).CrossRefGoogle Scholar
189.García, A., Zhang, X. X., and Tejada, J., J. Appl. Phys. 79, 6589 (1996).CrossRefGoogle Scholar
190.Yeh, W. J., Yu, L. K., Yu, Z. Q., Xin, Y. and Wong, W. K., Physica B 194–196, 1485 (1994).CrossRefGoogle Scholar
191.Beck, R. G., Booth, M. F., Farrell, D. E., Rice, J. P., and Ginsberg, D. M., Philos. Mag. B 65, 1373 (1992).CrossRefGoogle Scholar
192.Moonen, J. T. and Brom, H. B., Physica C 244, 10 (1995).CrossRefGoogle Scholar
193.Müller, K. A., Takashige, M., and Bednörz, J. G., Phys. Rev. Lett. 58, 1143 (1987).CrossRefGoogle Scholar
194.Yeshurun, Y. and Malozemoff, A. P., Phys. Rev. Lett. 60, 2202 (1988).CrossRefGoogle Scholar
195.Mukaida, H., Kawaguchi, K., Nakao, M., Kumakura, H., Dietderich, D. R., and Togano, K., Phys. Rev. B 42, 2659 (1990).CrossRefGoogle Scholar
196.Palstra, T. T. M., Batlogg, B., van Dover, R. B., Schneemeyer, L. F., and Waszczak, J. V., Phys. Rev. B 41, 6621 (1990).CrossRefGoogle Scholar
197.Umezawa, A., Crabtree, G. W., Liu, J. Z., Weber, H. W., Kwok, W. K., Nunez, L. H., Moran, T., Sowers, C. H., and Claus, H., Phys. Rev. B 36, 7151 (1987).CrossRefGoogle Scholar
198.van Dover, R. B., Gyorgy, E. M., Schneemeyer, L. F., Mitchell, J. W., Rao, K. V., Puzniak, R., and Waszczak, J. V., Nature 342, 55 (1989).CrossRefGoogle Scholar
199.Schindler, W., Roas, B., Saemann-Ischenko, G., Schultz, L., and Gerstenberg, H., Physica C 169, 117 (1990).CrossRefGoogle Scholar
200.Civale, L., Marwick, A., McElfresh, M. W., Worthington, T. K., Malozemoff, A. P., Holtzberg, F., Thompson, J. R., and Kirk, M. R., Phys. Rev. Lett. 65, 1164 (1990).CrossRefGoogle Scholar
201.Venturini, E. L., Barbour, J. C., Ginley, D. S., Baughman, R. S., and Morosin, B., Appl. Phys. Lett. 56, 2456 (1990).CrossRefGoogle Scholar
202.Barbour, J. C., Venturini, E. L., Ginley, D. S., and Kwak, J. F., Nucl. Instrum. and Meth. B 65, 531 (1992).CrossRefGoogle Scholar
203.Weaver, B. D., Reeves, M. E., Summers, G. P., Soulen, R. J., Olson, W. L., Eddy, M. M., James, T. W., and Smith, E. J., Appl. Phys. Lett. 59, 2600 (1991).CrossRefGoogle Scholar
204.Hosseinali, G. Samadi, Straif, W., Starchl, B., Kundzins, K., Weber, H. W., Yan, S. L., Manzel, M., Stangl, E., Proyer, S., Bäuerle, D., and Mezzetti, E., Physica C 268, 307 (1996).CrossRefGoogle Scholar
205.Civale, L., Marwick, A. D., Worthington, T. K., Kirk, M. A., Thompson, J. R., Krusin-Elbaum, L., Sun, Y., Clem, J. R., and Holtzberg, F., Phys. Rev. Lett. 67, 648 (1991).CrossRefGoogle Scholar
206.Konczykowski, M., Rullier-Albenque, F., Jacoby, E. R., Shaulov, A., Yeshurun, Y., and Lejay, P., Phys. Rev. B 44, 7167 (1991).CrossRefGoogle Scholar
207.Zhu, Y., Cai, Z. X., Budhani, R. C., Suenaga, M., and Welch, D. O., Phys. Rev. B 48, 6436 (1993).CrossRefGoogle Scholar
208.Hardy, V., Groult, D., Provost, J., Hervieu, M., Raveau, B., and Bouffard, S., Physica C 178, 255 (1991).CrossRefGoogle Scholar
209.Budhani, R. C., Suenaga, M., and Liou, S. H., Phys. Rev. Lett. 69, 3816 (1992).CrossRefGoogle Scholar
210.Budhani, R. C., Holstein, W. L., and Suenaga, M., Phys. Rev. Lett. 72, 566 (1994).CrossRefGoogle Scholar
211.Gray, K. E., Hettinger, J. D., Miller, D. J., Washburn, B. R., Moreau, C., Lee, C., Glagola, B. G., and Eddy, M. M., Phys. Rev. B 54, 3622 (1996).CrossRefGoogle Scholar
212.Hardy, V., Wahl, A., Hébert, S., Ruyter, A., Provost, J., Groult, D., and Simon, Ch., Phys. Rev. B 54, 656 (1996).CrossRefGoogle Scholar
213.Steel, D. G., Hettinger, J. D., Parkman, J. T., Yoder, M. E., Gray, K. E., Glagola, B. G., and Eddy, M. M., Physica C 265, 159 (1996).CrossRefGoogle Scholar
214.Nowak, E. R., Anders, S., Jaeger, H. M., Fendrich, J. A., Kwok, W. K., Mogilevsky, R., and Hinks, D. G., Phys. Rev. B 54, R12725 (1996).CrossRefGoogle Scholar
215. Films provided by DuPont Superconductivity, Wilmington, DE.Google Scholar
216.Venturini, E. L., Newcomer, P. P., Schöne, H., Doyle, B. L., and Myers, K. E., Nucl. Instrum. Meth. B 127/128, 587 (1997).CrossRefGoogle Scholar
217.Newcomer, P. P., Venturini, E. L., Schöne, H., Doyle, B. L., and Myers, K. E., Mater. Res. Soc. Symp. Proc. 439, 639 (1997).CrossRefGoogle Scholar
218.Oussena, M., Porter, S., Volkozub, A. V., de Groot, P. A. J., Lanchester, P. C., Ogborne, D., Weller, M. T., Balakrishnan, G., and Paul, D. M., Phys. Rev. B 48, 10575 (1993).CrossRefGoogle Scholar
219.Lauder, A., Wilker, C., Kountz, D. J., Holstein, W. L., and Face, D. W., IEEE Trans. Appl. Supercond. 3, 1683 (1993).CrossRefGoogle Scholar
220.Gyorgy, E. M., van Dover, R. B., Jackson, K. A., Schneemeyer, L. F., and Waszczak, J. V., Appl. Phys. Lett. 55, 283 (1989).CrossRefGoogle Scholar
221.Zhang, L., Liu, J. Z., Hoellwarth, C., Irons, S. H., Shelton, R. N., and Lan, M. D., Physica C 268, 287 (1996).CrossRefGoogle Scholar
222.Maley, M. P., Willis, J. O., Lessure, H., and McHenry, M. E., Phys. Rev. B 42, 2639 (1990).CrossRefGoogle Scholar
223.Vasquez, R. P., Hunt, B. D., and Foote, M. C., Appl. Phys. Lett. 53, 2692 (1988).CrossRefGoogle Scholar
224.Vasquez, R. P. and Olson, W. L., Physica C 177, 223 (1991).CrossRefGoogle Scholar
225.Vasquez, R. P., Ren, Z. F., and Wang, J. H., Phys. Rev. B 54, 6115 (1996).CrossRefGoogle Scholar
226.Vasquez, R. P., Novikov, D. L., Freeman, A. J. and Siegal, M. P., Phys. Rev. B 54, 14623 (1997).CrossRefGoogle Scholar
227.Ginley, D. S., Barr, L., Ashby, C. I. H., Plut, T. A., Urea, D., Siegal, M. P., and Martens, J. S., Appl. Phys. Lett. 63, 2429 (1993).CrossRefGoogle Scholar
228.Ginley, D. S., Barr, L., Ashby, C. I. H., Plut, T. A., Urea, D., Siegal, M. P., Martens, J. S., and Johansson, M. E., J. Mater. Res. 9, 1126 (1994).CrossRefGoogle Scholar
229.Koch, R. H., Gallagher, W. J., Bumble, B., and Lee, W. Y., Appl. Phys. Lett. 54, 951 (1989).CrossRefGoogle Scholar
230.Foglietti, V., Koch, R. H., Gallagher, W. J., Oh, B., Bumble, B., and Lee, W. L., Appl. Phys. Lett. 54, 2259 (1989).CrossRefGoogle Scholar
231.Martens, J. S., Hietela, V. M., Zipperian, T. E., Vawter, G. A., Ginley, D. S., Tigges, C. P., and Hohenwarter, G. K. G., Appl. Phys. Lett. 60, 1013 (1992).CrossRefGoogle Scholar
232.Martens, J. S., Wendt, J. R., Hietela, V. M., Ginley, D. S., Ashby, C. I. H., Plut, T. A., Vawter, G. A., Tigges, C. P., Siegal, M. P., Hou, S. Y., Phillips, J. M., and Hohenwarter, G. K. G., J. Appl. Phys. 72, 5970 (1992).CrossRefGoogle Scholar
233.Cardona, A. H., Suzuki, H., Yamashita, T., Young, K. H., and Bourne, L. C., Appl. Phys. Lett. 62, 411 (1993).CrossRefGoogle Scholar
234.Sarnelli, E., Chaudhari, P., Lee, W. Y., and Esposito, E., Appl. Phys. Lett. 65, 362 (1994).CrossRefGoogle Scholar
235.Dimos, D., Chaudhari, P., Mannhart, J., and LeGoues, F. K., Phys. Rev. Lett. 61, 219 (1988).CrossRefGoogle Scholar
236.Chen, Y. F., Ivanov, Z. G., Stepantsov, E. A., Tzalenchuk, A.Ya., Zarembinski, S., Claeson, T., and Johansson, L-G., J. Appl. Phys. 79, 9221 (1996).CrossRefGoogle Scholar
237.Yoshikawa, S., Nemoto, M., Shimaoka, K., Niki, K., Yoshida, I., and Yoshisato, Y., Physica C 273, 143 (1996).CrossRefGoogle Scholar
238.Martens, J. S., Ginley, D. S., Beyer, J. B., Nordman, J. E., and Hohenwarter, G. K. G., IEEE Trans. Magn. 27, 3284 (1991).CrossRefGoogle Scholar
239.Hohenwarter, G. K. G., Martens, J. S., Thompson, J. H., Beyer, J. B., Nordman, J. E., and Ginley, D. S., IEEE Trans. Magn. 27, 3297 (1991).CrossRefGoogle Scholar
240.Martens, J. S., Hietela, V. M., Zipperian, T. E., Ginley, D. S., Tigges, C. P., and Phillips, J. M., IEEE Trans. Microwave Theory Tech. 39, 2018 (1991).CrossRefGoogle Scholar
241.Martens, J. S. and Ginley, D. S., Adv. Mater. 4, 55 (1992).CrossRefGoogle Scholar
242.Martens, J. S., Zipperian, T. E., Hietela, V. M., Ginley, D. S., Tigges, C. P., Phillips, J. M., and Siegal, M. P., IEEE Trans. Electron Devices 40, 656 (1993).CrossRefGoogle Scholar
243.Hilbert, C., Ghoshal, U., Kroger, H., Martens, J. S., Hietela, V. M., and Plut, T. A., Appl. Phys. Lett. 64, 2442 (1994).CrossRefGoogle Scholar
244.Schlenga, K., Hechtfischer, G., Walkenhorst, W., Müller, P., Regi, F. X., Savary, H., Schneck, J., Veith, M., Brodkorb, W., and Steinbeib, E., IEEE Trans. Appl. Supercond. 5, 3272 (1995).CrossRefGoogle Scholar
245.Veith, M., Eick, T., Brodkorb, W., Manzel, M., Bruchlos, H., Köhler, T., Schmidt, H-G., Fuchs, J-J., Schlenga, K., Hechtfischer, G., and Müller, P., J. Appl. Phys. 80, 3396 (1996).CrossRefGoogle Scholar
246.Wilker, C., Shen, Z-Y., Pang, P., Face, D. W., Holstein, W. L., Matthews, A. L., and Laubacher, D. B., IEEE Trans. Microwave Theory and Tech. 39, 1462 (1991).CrossRefGoogle Scholar
247.Wilker, C., Shen, Z. Y., Pang, P., Face, D. W., Holstein, W. L., and Matthews, A. L., IEEE Trans. Microwave Theory Tech. 39, 1462 (1991).CrossRefGoogle Scholar
248.Thompson, J. H., Beyer, J. B., and Nordman, J. E., IEEE Trans. Magn. 27, 2817 (1991).CrossRefGoogle Scholar
249.Schmidt, M. S., Forse, R. J., Hammond, R. B., Eddy, M. M., and Olson, W. L., IEEE Trans. Microwave Theory Tech. 39, 1475 (1991).CrossRefGoogle Scholar
250.Ruggiero, S. T., Cardona, A., and Fetterman, H. R., IEEE Trans. Microwave Theory Tech. 39, 3070 (1991).Google Scholar
251.Subramanyam, G., Kapoor, V. J., and Bhasin, K. B., IEEE Trans. Microwave Theory and Tech. 43, 566 (1995).CrossRefGoogle Scholar
252.Shen, Z-Y., Wilker, C., Pang, P., Holstein, W. L., Face, D., and Kountz, D. J., IEEE Trans. Microwave Theory Tech. 40, 2424 (1992).CrossRefGoogle Scholar
253.Zhang, D., Fetterman, H. R., Eddy, M. M., Nilsson, J. L., and Forse, R. J., IEEE Trans. Microwave Theory Tech. 42, 158 (1994).CrossRefGoogle Scholar
254.Steinbeib, E., Manzel, M., Veith, M., Bruchlos, H., Eick, T., Huber, S., Steenbeck, K., Brodkorb, W., Morgenroth, W., Bruchlos, G., Schmidt, H. G., Bornmann, S., Köhler, T., Redlich, L., Fuchs, H. J., Schlenga, K., Hechtfischer, G., and Müller, P., Vacuum 47, 1117 (1996).CrossRefGoogle Scholar
255.Hietela, V. M., Martens, J. S., Plut, T. A., Tigges, C. P., Zipperian, T. E., Ginley, D. S., and Truman, J. K., IEEE Trans. Microwave Theory Tech. 42, 972 (1994).CrossRefGoogle Scholar
256.Lai, Y. S., Funk, E. E., Liu, Y. Q., Cao, W. L., Lee, C. H., Shen, Z-Y., Pang, P., Kountz, D. J., and Holstein, W. L., Appl. Phys. Lett. 65, 1048 (1994).CrossRefGoogle Scholar
257.Lai, Y. S., Liu, Y. Q., Cao, W. L., Lee, C. H., Shen, Z-Y., Pang, P., Kountz, D. J., and Holstein, W. L., Appl. Phys. Lett. 66, 1135 (1995).CrossRefGoogle Scholar
258.Shen, Z-Y. and Wilker, C., Microwaves & RF, April 1994, pp. 129–138.Google Scholar
259.Wilker, C., Shen, Z-Y., Pang, P., Holstein, W. L., and Face, D. W., IEEE Trans. Supercond. 5, 1665 (1995).CrossRefGoogle Scholar
260.Shen, Z-Y., Wilker, C., Pang, P., and Carter, C. III, IEEE Trans. Microwave Theory Tech. 44, 984 (1996).CrossRefGoogle Scholar
261.Shen, Z-Y., Wilker, C., Pang, P., Face, D. W., Carter, C. F. III, and Harrington, C. M., IEEE Trans. Appl. Supercond. 7, 2446 (1997).CrossRefGoogle Scholar
262.Hewat, A. W., Hewat, E. A., Brynestad, J., Mook, H. A., and Specht, E. D., Physica C 152, 438 (1988).CrossRefGoogle Scholar
263.Kikuchi, M., Kajitani, T., Suzuki, T., Nakajima, S., Hiraga, H., Kobayashi, N., Iwasaki, H., Syono, Y., and Muto, Y., Jpn. J. Appl. Phys. 28, L382 (1989).CrossRefGoogle Scholar
264.Shimakawa, Y., Kubo, Y., Manako, T., Nakabayashi, Y., and Igarashi, H., Physica C 156, 97 (1988); Y.Shimakawa, Y. Kubo, T. Manako, T. Satoh, S. Iijima, T. Ichihashi, and H. Igarashi, Physica C 157, 279 (1989).CrossRefGoogle Scholar