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TEM studies on the crystal structure of YBa2Cu3O7−x thin films prepared by pulsed laser deposition
Published online by Cambridge University Press: 31 January 2011
Abstract
The crystal structures of YBa2Cu3O7−x thin films deposited on MgO(100) substrates have been investigated by cross-sectional transmission electron microscopy (TEM). At a substrate temperature of 670 °C, Cu–O chains become wavy. Stacking faults are formed between the Cu–O chains. Therefore, the domains with c-axis lattice constants of 15 Å, 27 Å, and 39 Å are observed. By applying a biasing voltage of + 300 V, deviation in the c-axis orientation is reduced compared to that at an unbiased condition; even some grain boundaries remain. Near substrate surfaces, deviation of the c-axis direction from the substrate normal increases with a decreasing substrate temperature from 700 °C to 670 °C. Application of a substrate bias voltage of +300 V improved the heteroepitaxial growth of the c-axis oriented YBa2Cu3O7−x.
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- Copyright © Materials Research Society 1992