Hostname: page-component-78c5997874-dh8gc Total loading time: 0 Render date: 2024-11-13T01:58:48.941Z Has data issue: false hasContentIssue false
  • English
  • Français

TlBaCaCuO and YBaCuO superconductor thin films via an electrodeposition process

Published online by Cambridge University Press:  31 January 2011

R.N. Bhattacharya ,
P.A. Parilla ,
A. Mason ,
L.L. Roybal ,
R.K. Ahrenkiel ,
R. Noufi ,
R.P. Hellmer ,
J.F. Kwak  and
D.S. Ginley
R.N. Bhattacharya
Affiliation:
Solar Energy Research Institute, Golden, Colorado 80401
P.A. Parilla
Affiliation:
Solar Energy Research Institute, Golden, Colorado 80401
A. Mason
Affiliation:
Solar Energy Research Institute, Golden, Colorado 80401
L.L. Roybal
Affiliation:
Solar Energy Research Institute, Golden, Colorado 80401
R.K. Ahrenkiel
Affiliation:
Solar Energy Research Institute, Golden, Colorado 80401
R. Noufi
Affiliation:
Solar Energy Research Institute, Golden, Colorado 80401
R.P. Hellmer
Affiliation:
Sandia National Laboratories, Albuquerque, New Mexico 87185
J.F. Kwak
Affiliation:
Sandia National Laboratories, Albuquerque, New Mexico 87185
D.S. Ginley
Affiliation:
Sandia National Laboratories, Albuquerque, New Mexico 87185
Get access

Abstract

Thin-film superconductors of TlBaCaCuO (TBCCO) and YBaCuO (YBCO) were fabricated via an electrodeposition process. The precursors of the superconducting TBCCO films were codeposited at a constant potential of −4 V onto a silver-coated SrTiO3 substrate. The YBCO precursors also were codeposited but under pulsed-potential conditions (in order to improve the film morphology) and onto a silver-coated MgO substrate. The pulsed-potential cycle consisted of 1 s at −4 V followed by 1 s at −1 V. The post-annealed TBCCO film showed zero resistance at about 102 K and critical current density at 76 K of 20 000 A/cm2 in zero magnetic field and 5000 A/cm2 in a 10 kOe field parallel to the film plane. The post-annealed YBCO film showed zero resistance at approximately 80 K and critical current density of 5160 A/cm2 at 4 K in zero magnetic field.

Type
Rapid Communications
Information
Journal of Materials Research , Volume 6 , Issue 7 , July 1991 , pp. 1389 - 1392
Copyright
Copyright © Materials Research Society 1991

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1.Zurawski, D. J., Kulesza, P. J., and Weickowski, A., J. Electrochem. Soc. 135, 1607 (1988).CrossRefGoogle Scholar
2.Maxfield, M., Eckhardt, H., Iqbal, Z., Reidinger, F., and Baughman, R.H., Appl. Phys. Lett. 54, 1932 (1989).CrossRefGoogle Scholar
3.Maxfield, M., Behi, M., Reidinger, F., Eckhardt, H., and Baughman, R.H., 177th J. Electrochemical Soc. Meeting, Abstract No. 536, vol. 90–1 (1990).Google Scholar
4.Bhattacharya, R.N., Noufi, R., Roybal, L.L., Ahrenkiel, R.K., Parlila, P., Mason, A., and Albin, D., in Science and Technology of Thin Film Superconductors 2, 243–250 (1991).Google Scholar
5.Bhattacharya, R. N., Noufi, R., Roybal, L. L., and Ahrenkiel, R. K., J. Electrochemical Soc. 138, 1643 (1991).CrossRefGoogle Scholar
6.Kwak, J. F., Ginley, D. S., Venturini, E. L., Morosin, B., Baughman, R. J., Barbour, J. C., and Eatough, M. O., in Studies of High Temperature Superconductors, edited by Narlikar, A. (Nova, Commack, New York, 1990), Vol. 7 (in press).Google Scholar