Hostname: page-component-78c5997874-lj6df Total loading time: 0 Render date: 2024-11-13T11:37:23.707Z Has data issue: false hasContentIssue false

A Novel Method for Determining Poisson's Ratio of Thin Film Materials Using Ultra-Wide Micromachined Bilayer Cantilevers

Published online by Cambridge University Press:  05 May 2011

Max Ti-Kuang Hou*
Affiliation:
Department of Mechanical Engineering, China Institute of Technology, Taipei, Taiwan 11581, R.O.C.
Rongshun Chen*
Affiliation:
Department of Power Mechanical Engineering, National Tsing Hua University, Hsinchu, Taiwan 30013, R.O.C.
*
*Assistant Professor
**Professor
Get access

Abstract

Narrow micromachined bilayer cantilevers, which are broadly used to determine different thin film material properties, have rarely been used to characterize the Poisson's ratio. It is difficult to be determined from the tip deflection, and thus the Poisson's ratio, of the narrow bilayer cantilever. In this paper, the tip deflections of ultra-wide micromachined bilayer cantilevers carry the needed information for finding the Poisson's ratio of thin-film materials. The measurement process and its corresponding model, based on the plate theory, is introduced and tested. The Poisson's ratio of the thin film is determined by comparing the tip deflections of the bilayer cantilever before and after the deposition of the upper layer. Because the fabrication processes are widely used in surface micromachining, the method can be easily implemented.

Type
Articles
Copyright
Copyright © The Society of Theoretical and Applied Mechanics, R.O.C. 2004

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1.Dunn, M. L., Zhang, Y. and Bright, V. M., “Deformation and Structural Stability of Layered Plate,” IEEEJ. MEMS, 11(4), pp. 372384 (2002).CrossRefGoogle Scholar
2.Maier-Schneider, D., Maibach, J. and Obermeier, E., “A New Analytical Solution for the Load-Deflection of Square Membranes,” IEEE J. MEMS, 4(4), pp. 238–41 (1995).CrossRefGoogle Scholar
3.Sharpe, W. N., Yuan, B., Vaidyanathan, R. and Edwards, R. L., “Measurements of Young's Modulus, Poisson's Ratio, and Tensile Strength of Polysilicon,” Proc. 10th IEEE Int. Workshop on MEMS, Nagoya, Japan, pp. 424429 (1997).Google Scholar
4.Thornton, J. A. and Hoffman, D. W., “Stress-Related Effects in Thin Film,” Thin Solid Films, 171, pp. 531(1989).CrossRefGoogle Scholar
5.Vkassak, J. J. and Nix, W. D., “A New Bulge Test Technique for the Determination of Young's Modulus and Poisson's Ratio of Thin Films,” J Mater. Res., 7(12), pp. 32423249 (1992).CrossRefGoogle Scholar
6.Luo, C., Schneider, T. W., White, R. C., Currie, J. and Paranjape, M., “A Simple Deflection-Testing Method to Determine Poisson's Ratio for MEMS Applications,” J. Micromech. Microeng., 13(1), pp. 129133 (2003).CrossRefGoogle Scholar
7.Tsai, H.-C. and Fang, W., “Determining the Poisson's Ratio of Thin Film Materials Using Resonant Method,” Sensors and Actuators A, 103(3), pp. 377383 (2003).CrossRefGoogle Scholar
8.Fang, W., “Determination of the Elastic Modulus of Thin Film Materials Using Self-Deformed Micromachined Cantilevers,” J. Micromech. Microeng., 9(3), pp. 230235 (1999).CrossRefGoogle Scholar
9.Fang, W. and Wickert, J. A., “Determining Mean and Gradient Residual Stresses in Thin Films Using Micromachined Cantilevers,” J. Micromech. Microeng., 6(3), pp. 301309 (1996).CrossRefGoogle Scholar
10.Hou, M. T.-K. and Chen, R., “Effect of Width on the Stress-Induced Bending of Micromachined Bilayer Cantilevers,” J. Micromech. Microeng., 13(1), pp. 141148 (2003).CrossRefGoogle Scholar
11.Chu, W. H., Mehregany, M. and Mullen, R. L., “Analysis of Tip Deflection and Force of a Bimetallic Cantilever Microactuator,” J. Micromech. Microeng., 3(1), pp. 47 (1993).CrossRefGoogle Scholar
12.Judy, M. W, Cho, Y., Howe, R. T. and Pisano, A. P., “Self-Adjusting Microstructures (SAMS),” MEMS ′91, Proc., pp. 51–56(1991).Google Scholar
13.Ugural, A. C., Stresses in Plates and Shells, Ch 3, pp. 7184, McGraw-Hill New York (1999).Google Scholar
14.Min, Y.-H. and Kim, Y.-K., “In Situ Measurement of Residual Stress in Micromachined Thin Films Using a Specimen with Composite-Layered Cantilevers,” J. Micromech. Microeng., 10(3), pp. 314321 (2000).CrossRefGoogle Scholar
15.Roark, R. J. and Young, W. C., Formulas for Stress and Strain, Ch. 10, p. 377, McGraw-Hill New York (1975).Google Scholar