Hostname: page-component-78c5997874-dh8gc Total loading time: 0 Render date: 2024-11-10T23:42:44.429Z Has data issue: false hasContentIssue false
  • English
  • Français

Evaluation and simulations of a Thomson scattering X-ray source based on ray tracing methods

Published online by Cambridge University Press:  01 July 2004

BING XIA ,
ZHENG LI ,
KEJUN KANG ,
WENHUI HUANG ,
GANG HUANG ,
XIAOZHONG HE ,
YINGCHAO DU  and
CHUANXIANG TANG
BING XIA
Affiliation:
Department of Engineering Physics, Tsinghua University, Beijing, P. R. China
ZHENG LI
Affiliation:
Department of Engineering Physics, Tsinghua University, Beijing, P. R. China
KEJUN KANG
Affiliation:
Department of Engineering Physics, Tsinghua University, Beijing, P. R. China
WENHUI HUANG
Affiliation:
Department of Engineering Physics, Tsinghua University, Beijing, P. R. China
GANG HUANG
Affiliation:
Department of Engineering Physics, Tsinghua University, Beijing, P. R. China
XIAOZHONG HE
Affiliation:
Department of Engineering Physics, Tsinghua University, Beijing, P. R. China
YINGCHAO DU
Affiliation:
Department of Engineering Physics, Tsinghua University, Beijing, P. R. China
CHUANXIANG TANG
Affiliation:
Department of Engineering Physics, Tsinghua University, Beijing, P. R. China
Get access Rights & Permissions [Opens in a new window]

Abstract

We propose to build up a facility of sub-picosecond hard X-ray pulses based on Thomson scattering between femtosecond laser pulses and relativistic electrons which is a useful tool for the purpose of material investigation, plasma diagnostics, and shock wave measurement. This article reviews the principles and the development of X-ray sources based on Thomson scattering. Then New Light Source®, the Thomson scattering X-ray facility we will develop is introduced. The characteristics of a Thomson scattering X-ray source are analyzed. A computer model of the Thomson source to be developed is described in order to provide a source of the rays used in a ray tracing method, which has proved to be an essential computer tool for designing and optimizing the optical system of high brightness X-ray facilities. A code for the ray tracing source model is created based on the Monte Carlo approach. It is able to evaluate the properties and performances of the light source under development using this model. According to the simulation results, we discuss the dependence of imaging quality and source properties including spectral distribution, emittance, flux which depends on the laser and electron beam parameters, in order to check if operation performances are as expected. We also estimate the possibility of measuring the energy spectrum of a Thomson scattering source by using a crystal diffraction method. Ray tracing calculations are performed using SHADOW program package, and a new model of Thomson scattering X-ray source which can be processed in that program is established with additional code.

Keywords

Crystal spectroscopyRay tracingThomson scattering
Type
Research Article
Information
Laser and Particle Beams , Volume 22 , Issue 3 , July 2004 , pp. 355 - 365
Copyright
© 2004 Cambridge University Press

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

Arutyunian, F.R. & Tumanian, V.A. (1963). The Compton effect on relativistic electrons and the possibility of obtaining high energy beams. Phys. Lett. 4, 176–178.Google Scholar
Bertin, E. (1975). Principles and Practice of X-Ray Spectrometric Analysis. New York-London: Plenum Press.
Born, M. & Wolf, E. (1999). Principles of optics: Electromagnetic theory of propagation, interference and diffraction of light, 7th ed. New York: Cambridge University Press.
Crane, J., Cross, R., Betts, S., Barty, C., Gibson, D., Anderson, G., Anderson, S., Brown, W., Fittinghoff, D., Hartemann, F., Jacobs, J., James, L., Kuba, J., Patterson, W., Springer, P., Robbins, C., Tremaine, A. & Tsai, V. (2003a). Short-Pulse Thomson X-Ray Source. LS&T Program Update, UCRL-TB-136126-03-3.
Crane, J., Cross, R., Betts, S., Barty, C., Gibson, D., Anderson, G., Anderson, S., Brown, W., Fittinghoff, D., Hartemann, F., Jacobs, J., Kuba, J., James, L., Patterson, W., Springer, P., Tremaine, A. & Tsai, V. (2003b). Brightest 70-keV X-Ray Flux Generated by Thomson Scattering in PLEIADES. LS&T Program Update, UCRL-TB-136126-03-10.
Endo, A. (2000). A Compact Laboratory Femtosecond X-ray Source based on Precision Control of Electron Photon Collisions. Workshop on Femtosecond X-Ray Science at ALS 2000, Berkeley.
Greiner, W. & Reinhardt, J. (2001). Quantum electrodynamics, pp. 156–166. Ma, B. Q., translator, Peking University Press, Beijing. (in Chinese).
Hölzer, G., Förster, E., Grätz, M., Tillman, C. & Svanberg, S. (1997). X-Ray Crystal Spectroscopy of Sub-picosecond Laser-Produced Plasmas beyond 50 keV. Journal of X-Ray Science and Technology 7, 50–70.Google Scholar
Huang, W.H. (2003). Schemes and Parameters for the construction of New Light Source?. Report No. 2003-15. Beijing, Dept. Engineering Physics, Tsinghua University.
Huang, W.H., He, X.Z., Huang, G., Tang, C.X. & Lin, Y.Z. (2004). On physical problems in the X-ray sources based on Thomson scattering. High Energy Physics and Nuclear Physics 28, 304–307 (in Chinese).Google Scholar
Kashiwagi, S., Washio, M., Kobuki, T., Kuroda, R., Ben-Zvi, I., Pogorelsky, I., Kusche, K., Skaritka, J., Yakimenko, V., Wang, X. J., Hirose, T., Dobashi, K., Muto, T., Urakawa, J., Omori, T., Okugi, T., Tsunemi, A., Liu, Y., He, P., Cline, D. & Segalov, Z. (2000). Observation of high-intensity X-rays in inverse Compton scattering experiment. Nuclear Instruments & Methods in Physics Research Section a-Accelerators Spectrometers Detectors and Associated Equipment 455, 36–40.Google Scholar
Kotaki, H., Kando, M., Dewa, H., Kondo, S., Watanabe, T., Ueda, T., Kinoshita, K., Yoshii, K., Uesaka, M. & Nakajima, K. (2000). Compact X-ray sources by intense laser interactions with beams and plasmas. Nuclear Instruments & Methods in Physics Research Section a-Accelerators Spectrometers Detectors and Associated Equipment. 455, 166–171.Google Scholar
Lai, B. & Cerrina, F. (1986). SHADOW: a synchrotron radiation ray tracing program. Nuclear Instruments & Methods in Physics Research Section a-Accelerators Spectrometers Detectors and Associated Equipment 246, 337–341.Google Scholar
Lai, B., Chapman, K. & Cerrina F. (1988). SHADOW: New developments. Nuclear Instruments & Methods in Physics Research Section a-Accelerators Spectrometers Detectors and Associated Equipment. 266, 544–549.Google Scholar
Li, Y.L., Huang, Z.R., Borland, M.D., & Milton, S. (2002). Small-angle Thomson scattering of ultrafast laser pulses for bright, sub-100-fs x-ray radiation. Physical Review Special Topics-Accelerators and Beams 5, 044701.Google Scholar
Palmer, D.T., Miller, R.H. & Winick, H. (1995). Microwave measurements of the BNL/SLAC/UCLA 1.6 cell photocathode RF gun. 16th IEEE Particle Accelerator Conference (PAC 95) and International Conference on High Energy Accelerators (IUPAP), Dallas, Texas, 1–5 May 1995.
Palmer, D.T., Wang, X.J., Miller, R.H., Babzien, M., Ben-Zvi, I., Pellegrini, C., Sheehan, J., Skaritka, J., Winick, H., Woodle, M., & Yakimenko, V. (1997). Emittance studies of the BNL/SLAC/UCLA 1.6 cell photocathode rf gun. Proc. of the 1997 Particle Accelerator Conf. 2687.
Pogorelsky, I.V., Ben-Zvi, I., Wang, X.J., & Hirose, T. (2000a). Femtosecond laser synchrotron sources based on Compton scattering in plasma channels. Nuclear Instruments & Methods in Physics Research Section a-Accelerators Spectrometers Detectors and Associated Equipment. 455, 176–180.Google Scholar
Pogorelsky, I.V., Ben-Zvi, I., Hirose, T., Kashiwagi, S., Yakimenko, V., Kusche, K., Siddons, P., Skaritka, J., Kumita, T., Tsunemi, A., Omori, T., Urakawa, J., Washio, M., Yokoya, K., Okugi, T., Liu, Y., He, P. & Cline, D. (2000b). Demonstration of 8 × 1018 photons/second peaked at 1.8 Å in a relativistic Thomson scattering experiment. Physical Review Special Topics-Accelerators and Beam 3, 090702.Google Scholar
Sánchez del Rìo, M. (1996). Experience with ray-tracing simulations at the European Synchrotron Radiation Facility, The 9th National conference on synchrotron radiation instrumentation (pp. 3380). Argonne, Illinois (USA): AIP.
Schoenlein, R.W., Leemans, W.P., Chin, A.H., Volfbeyn, P., Glover, T.E., Balling, P., Zolotorev, M., Kim, K.J., Chattopadhyay, S. & Shank, C.V. (1996). Femtosecond x-ray pulses at 0.4 angstrom generated by 90 degrees Thomson scattering: A tool for probing the structural dynamics of materials. Science 274, 236–238.Google Scholar
Ting, A., Fischer, R., Fisher, A., Evans, K., Burris, R., Krall, J., Esarey, E. & Sprangle, P. (1995). Observation of 20 Ev X-Ray Generation in a Proof-of-Principle Laser Synchrotron Source Experiment. Journal of Applied Physics 78, 575–577.Google Scholar
Uesaka, M., Kotaki, H., Nakajima, K., Harano, H., Kinoshita, K., Watanabe, T., Ueda, T., Yoshii, K., Kando, M., Dewa, H., Kondo, S., & Sakai, F. (2000). Generation and application of femtosecond X-ray pulse. Nuclear Instruments & Methods in Physics Research Section a-Accelerators Spectrometers Detectors and Associated Equipment 455, 90–98.Google Scholar
Wang, X.J. (1991). RF Gun Studies. CAP-ATF-TECH #11.
Welnak, C., Anderson, P., Khan, M., Singh, S. & Cerrina, F. (1992). Recent developments in SHADOW. Review of Scientific Instruments 63, 865–868.Google Scholar
Yang, J., Washio, M., Endo, A. & Hori, T. (1999). Evaluation of femtosecond X-rays produced by Thomson scattering under linear and nonlinear interactions between a low-emittance electron beam and an intense polarized laser light. Nuclear Instruments & Methods in Physics Research Section a-Accelerators Spectrometers Detectors and Associated Equipment 428, 556–569.Google Scholar
Yorozu, M., Yang, J.F., Okada, Y., Yanagida, T., Sakai, F. & Endo, A. (2001). Short-pulse X-ray generation via Thomson scattering in 0 degrees and 90 degrees interactions. Japanese Journal of Applied Physics Part 1-Regular Papers Short Notes & Review Papers 40, 4228–4232.Google Scholar