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Spectral diagnosis of a laser-produced XUV source using a digital camera system with pinhole transmission grating

Published online by Cambridge University Press:  09 March 2009

N. Böwering ,
T. Döhring ,
U. Gärner  and
U. Heinzmann
N. Böwering
Affiliation:
Universität Bielefeld, Fakultät für Physik, 4800 Bielefeld 1, Germany
T. Döhring
Affiliation:
Universität Bielefeld, Fakultät für Physik, 4800 Bielefeld 1, Germany
U. Gärner
Affiliation:
Universität Bielefeld, Fakultät für Physik, 4800 Bielefeld 1, Germany
U. Heinzmann
Affiliation:
Universität Bielefeld, Fakultät für Physik, 4800 Bielefeld 1, Germany
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Abstract

For spectral diagnosis, a repetitive laser-produced soft-X-ray source was examined in the range 2–40 nm using a spectrometer containing a pinhole transmission grating, an image converter, and a CCD camera. Via digital recording the detection system provides fast on-line data accumulation with spectral and spatial resolution. With this detector the performance of the light source was studied with respect to spectral emission characteristics, long-term stability, and reproducibility by recording spectra for different solid targets and liquid lead.

Type
Research Article
Information
Laser and Particle Beams , Volume 9 , Issue 2 , June 1991 , pp. 593 - 601
Copyright
Copyright © Cambridge University Press 1991

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References

REFERENCES

Carroll, P. K. & Kennedy, E. T. 1981 Contemp. Phys. 22, 61.CrossRefGoogle Scholar
Cavailler, C. et al. 1984 Presented at 16th International Congress on High-Speed Photography and Photonics,Strasbourg.Google Scholar
Cuderman, J. F. & Glibert, K. M. 1975 Rev. Sci. Instrum. 46, 53.CrossRefGoogle Scholar
Day, R. H. et al. 1981 J. Appl. Phys. 52, 6965.CrossRefGoogle Scholar
Donaldson, T. P., Hutcheon, R. J. & Key, M. H. 1973 J. Phys. B 6, 1525.CrossRefGoogle Scholar
Eidmann, K. & Kishimoto, T. 1986 Appl. Phys. Lett. 49, 377.CrossRefGoogle Scholar
Eidmann, K. et al. 1986 Laser Part. Beams 4, 521.CrossRefGoogle Scholar
Fonck, J., Ramsey, A. T. & Yelle, R. V. 1982 Appl. Opt. 21, 2115.CrossRefGoogle Scholar
Gerritsen, H. C. et al. 1986a J. Appl. Phys. 59, 2337.CrossRefGoogle Scholar
Gerritsen, H. C. et al. 1986b J. Phys. E 19, 1040.CrossRefGoogle Scholar
Heckenkamp, Ch. et al. 1981 J. Phys. D 14, L203.CrossRefGoogle Scholar
Ireland, C. L. M. 1974 J. Phys. D 7, L179.CrossRefGoogle Scholar
Jopson, R. M. et al. 1983 Opt. Lett. 8, 265.CrossRefGoogle Scholar
Kishimoto, T. 1985 MPQ Report. No. MPQ 108.Google Scholar
Nicolosi, P., Jannitti, E. & Tondello, G. 1981 Appl. Phys. B 26, 117.CrossRefGoogle Scholar
Popil, R. et al. 1987 Phys. Rev. A 35, 3874.CrossRefGoogle Scholar
Zeldovich, Ya. B. & Raizer, Yu. P. 1966 Physics of Shock Waves and High Temperature Hydrodynamic Phenomena (Academic Press, London).Google Scholar