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From ensemble average to single (nano-) objects properties byX-ray microdiffraction: a short review on structure determination (local strain,composition, ...) and objects manipulation (AFM-coupled)*

Published online by Cambridge University Press:  06 July 2011

C. Mocuta
Affiliation:
Synchrotron SOLEIL, Gif-sur-Yvette, France. e-mail: cristian.mocuta@synchrotron-soleil.fr European Synchrotron Radiation Facility (ESRF), Grenoble, France
K. Mundboth
Affiliation:
European Synchrotron Radiation Facility (ESRF), Grenoble, France Institute für Hableiterphysik, Johannes Kepler Universität, Linz, Austria
J. Stangl
Affiliation:
Institute für Hableiterphysik, Johannes Kepler Universität, Linz, Austria
B. Krause
Affiliation:
Institut für Synchrotronstrahlung, Forschungszentrum Karlsruhe, Germany
A. Malachias
Affiliation:
European Synchrotron Radiation Facility (ESRF), Grenoble, France
Th. Scheller
Affiliation:
European Synchrotron Radiation Facility (ESRF), Grenoble, France
T. Cornelius
Affiliation:
European Synchrotron Radiation Facility (ESRF), Grenoble, France
R. Paniago
Affiliation:
European Synchrotron Radiation Facility (ESRF), Grenoble, France
A. Diaz
Affiliation:
European Synchrotron Radiation Facility (ESRF), Grenoble, France
M. Rodrigues
Affiliation:
European Synchrotron Radiation Facility (ESRF), Grenoble, France
J. Chevrier
Affiliation:
European Synchrotron Radiation Facility (ESRF), Grenoble, France
O. Dhez
Affiliation:
European Synchrotron Radiation Facility (ESRF), Grenoble, France
T.H. Metzger
Affiliation:
European Synchrotron Radiation Facility (ESRF), Grenoble, France
G. Bauer
Affiliation:
Institute für Hableiterphysik, Johannes Kepler Universität, Linz, Austria
A. Barbier
Affiliation:
Centre CEA de Saclay, Gif-sur-Yvette, France
A.V. Ramos
Affiliation:
Centre CEA de Saclay, Gif-sur-Yvette, France
M.-J. Guittet
Affiliation:
Centre CEA de Saclay, Gif-sur-Yvette, France
J.-B. Moussy
Affiliation:
Centre CEA de Saclay, Gif-sur-Yvette, France
S. Stanescu
Affiliation:
Synchrotron SOLEIL, Gif-sur-Yvette, France. e-mail: cristian.mocuta@synchrotron-soleil.fr
R. Mattana
Affiliation:
CNRS/Thales-Palaiseau and Université Paris-Sud 11 Orsay, France
C. Deranlot
Affiliation:
CNRS/Thales-Palaiseau and Université Paris-Sud 11 Orsay, France
F. Petroff
Affiliation:
CNRS/Thales-Palaiseau and Université Paris-Sud 11 Orsay, France
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Abstract

In standard diffraction experiments, ensembles of objects are characterized yieldingaveraged, statistical properties (meaningful only if the ensemble is monodisperse).Focused x-ray beams are used here to localize single nanostructures, identifying andprobing individual objects one by one. In a scanning mode, a 2-dimensional image of thesample is recorded, which allows the reproducible alignment of a specific nanostructurefor analysis. The x-ray scattered signal is analyzed and modelled, to give access to theshape, strain and composition inside the single object with sub-micron resolution.Combination of x-ray microdiffraction technique with other micro-probe experiments on thevery same individual object (simultaneous coupling of x-ray diffraction measurements withatomic force microscopy (AFM)) is also shown; we prove the possibility to interact withthe objects and to address elastic properties for individual nano-structures out of anensemble.

Type
Research Article
Copyright
© EDP Sciences

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References

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